Patents by Inventor Matthew Kempin

Matthew Kempin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Waveguide probe for nondestructive material characterization
    Patent number: 9482626
    Abstract: An open-ended waveguide probe including a finite flange extending outwardly and functioning as an infinite flange. A signal source provides a microwave signal to the waveguide, which in turn transmits microwave electromagnetic energy incident upon an object to be tested. The finite flange at the waveguide's aperture is shaped to reduce scattering of the electromagnetic field reflected from the object and received by the aperture. The probe is adapted for coupling to a receiver for sampling the reflected electromagnetic field received by the aperture and the receiver is adapted for coupling to a processor for determining at least one material characteristic of the object based on sampled electromagnetic field reflected from the object.
    Type: Grant
    Filed: September 13, 2013
    Date of Patent: November 1, 2016
    Assignee: The Curators of the University of Missouri
    Inventors: Mohammad Tayeb Ghasr, Matthew Kempin, Reza Zoughi
  • WAVEGUIDE PROBE FOR NONDESTRUCTIVE MATERIAL CHARACTERIZATION
    Publication number: 20150077138
    Abstract: An open-ended waveguide probe including a finite flange extending outwardly and functioning as an infinite flange. A signal source provides a microwave signal to the waveguide, which in turn transmits microwave electromagnetic energy incident upon an object to be tested. The finite flange at the waveguide's aperture is shaped to reduce scattering of the electromagnetic field reflected from the object and received by the aperture. The probe is adapted for coupling to a receiver for sampling the reflected electromagnetic field received by the aperture and the receiver is adapted for coupling to a processor for determining at least one material characteristic of the object based on sampled electromagnetic field reflected from the object.
    Type: Application
    Filed: September 13, 2013
    Publication date: March 19, 2015
    Applicant: The Curators of the University of Missouri
    Inventors: Mohammad Tayeb Ghasr, Matthew Kempin, Reza Zoughi