Patents by Inventor Matthew Klonowski
Matthew Klonowski has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10337890Abstract: A single housing with a non-ferromagnetic piezo-driven flexure has primary and secondary coil forms of different diameters, one coaxially inside the other, integrated in the flexure. The cylinders defining the planes of the primary and secondaries do not spatially overlap. The secondary coil forms may be wound in opposite directions and wired to provide a transformer device. Movement of the primary relative to the secondaries in the direction of the central axis of the coils can be differentially detected with high precision.Type: GrantFiled: December 13, 2016Date of Patent: July 2, 2019Assignee: Oxford Instruments AFM IncInventors: Roger Carlos Proksch, Dan Bocek, Jason Cleveland, Matthew Longmire, Matthew Klonowski
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Publication number: 20170254834Abstract: A modular AFM/SPM which provides faster measurements, in part through the use of smaller probes, of smaller forces and movements, free of noise artifacts, that the old generations of these devices have increasingly been unable to provide. The modular AFM/SPM includes a chassis, the foundation on which the modules of the instrument are supported; a view module providing the optics for viewing the sample and the probe; a head module providing the components for the optical lever arrangement and for steering and focusing those components; a scanner module providing the XYZ translation stage that actuates the sample in those dimensions and the engage mechanism; a isolation module that encloses the chassis and provides acoustic and/or thermal isolation for the instrument and an electronics module which, together with the separate controller, provide the electronics for acquiring and processing images and controlling the other functions of the instrument.Type: ApplicationFiled: March 22, 2017Publication date: September 7, 2017Inventors: Roger Proksch, Mario Viani, Jason Cleveland, Maarten Rutgers, Matthew Klonowski, Deron Walters, James Hodgson, Jonathan Hensel, Paul Costales, Anil Gannepalli
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Publication number: 20170089733Abstract: A single housing with a non-ferromagnetic piezo-driven flexure has primary and secondary coil forms of different diameters, one coaxially inside the other, integrated in the flexure. The cylinders defining the planes of the primary and secondaries do not spatially overlap. The secondary coil forms may be wound in opposite directions and wired to provide a transformer device. Movement of the primary relative to the secondaries in the direction of the central axis of the coils can be differentially detected with high precision.Type: ApplicationFiled: December 13, 2016Publication date: March 30, 2017Inventors: Roger Carlos Proksch, Dan Bocek, Jason Cleveland, Matthew Longmire, Matthew Klonowski
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Patent number: 9518814Abstract: A single housing with a non-ferromagnetic piezo-driven flexure has primary and secondary coil forms of different diameters, one coaxially inside the other, integrated in the flexure. The cylinders defining the planes of the primary and secondaries do not spatially overlap. The secondary coil forms may be wound in opposite directions and wired to provide a transformer device. Movement of the primary relative to the secondaries in the direction of the central axis of the coils can be differentially detected with high precision.Type: GrantFiled: August 6, 2013Date of Patent: December 13, 2016Assignee: Oxford Instruments Asylum Research IncInventors: Roger Proksch, Dan Bocek, Jason Cleveland, Matthew Longmire, Matthew Klonowski
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Publication number: 20140223612Abstract: A modular AFM/SPM which provides faster measurements, in part through the use of smaller probes, of smaller forces and movements, free of noise artifacts, that the old generations of these devices have increasingly been unable to provide. The modular AFM/SPM includes a chassis, the foundation on which the modules of the instrument are supported; a view module providing the optics for viewing the sample and the probe; a head module providing the components for the optical lever arrangement and for steering and focusing those components; a scanner module providing the XYZ translation stage that actuates the sample in those dimensions and the engage mechanism; a isolation module that encloses the chassis and provides acoustic and/or thermal isolation for the instrument and an electronics module which, together with the separate controller, provide the electronics for acquiring and processing images and controlling the other functions of the instrument.Type: ApplicationFiled: February 5, 2013Publication date: August 7, 2014Applicant: ASYLUM CORPORATIONInventors: Roger Proksch, Mario Viani, Jason Cleveland, Maarten Rutgers, Matthew Klonowski, Deron Walters, James Hodgson, Jonathan Hensel, Paul Costales
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Publication number: 20130314078Abstract: A single housing with a non-ferromagnetic piezo-driven flexure has primary and secondary coil forms of different diameters, one coaxially inside the other, integrated in the flexure. The cylinders defining the planes of the primary and secondaries do not spatially overlap. The secondary coil forms may be wound in opposite directions and wired to provide a transformer device. Movement of the primary relative to the secondaries in the direction of the central axis of the coils can be differentially detected with high precision.Type: ApplicationFiled: August 6, 2013Publication date: November 28, 2013Applicants: OXFORD INSTRUMENTS AFM INC, OXFORD INSTRUMENTS PLCInventors: Roger Proksch, Dan Bocek, Jason Cleveland, Matthew Longmire, Matthew Klonowski
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Patent number: 8502525Abstract: A single housing with a non-ferromagnetic piezo-driven flexure has primary and secondary coil forms of different diameters, one coaxially inside the other, integrated in the flexure. The cylinders defining the planes of the primary and secondaries do not spatially overlap. The secondary coil forms may be wound in opposite directions and wired to provide a transformer device. Movement of the primary relative to the secondaries in the direction of the central axis of the coils can be differentially detected with high precision.Type: GrantFiled: October 14, 2009Date of Patent: August 6, 2013Assignees: Oxford Instruments PLC, Oxford Instruments AFM, IncInventors: Roger Proksch, Dan Bocek, Jason Cleveland, Matthew Longmire, Matthew Klonowski
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Patent number: 8370960Abstract: A modular AFM/SPM which provides faster measurements, in part through the use of smaller probes, of smaller forces and movements, free of noise artifacts, that the old generations of these devices have increasingly been unable to provide. The modular AFM/SPM includes a chassis, the foundation on which the modules of the instrument are supported; a view module providing the optics for viewing the sample and the probe; a head module providing the components for the optical lever arrangement and for steering and focusing those components; a scanner module providing the XYZ translation stage that actuates the sample in those dimensions and the engage mechanism; a isolation module that encloses the chassis and provides acoustic and/or thermal isolation for the instrument and an electronics module which, together with the separate controller, provide the electronics for acquiring and processing images and controlling the other functions of the instrument.Type: GrantFiled: October 14, 2009Date of Patent: February 5, 2013Assignee: Asylum Research CorporationInventors: Roger Proksch, Mario Viani, Jason Cleveland, Maarten Rutgers, Matthew Klonowski, Daren Walters, James Hodgson, Jonathan Hensel, Paul Costales, Anil Gannepalli
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Publication number: 20100275334Abstract: A modular AFM/SPM which provides faster measurements, in part through the use of smaller probes, of smaller forces and movements, free of noise artifacts, that the old generations of these devices have increasingly been unable to provide. The modular AFM/SPM includes a chassis, the foundation on which the modules of the instrument are supported; a view module providing the optics for viewing the sample and the probe; a head module providing the components for the optical lever arrangement and for steering and focusing those components; a scanner module providing the XYZ translation stage that actuates the sample in those dimensions and the engage mechanism; a isolation module that encloses the chassis and provides acoustic and/or thermal isolation for the instrument and an electronics module which, together with the separate controller, provide the electronics for acquiring and processing images and controlling the other functions of the instrument.Type: ApplicationFiled: October 14, 2009Publication date: October 28, 2010Inventors: Roger Proksch, Mario Viani, Jason Cleveland, Maarten Rutgers, Matthew Klonowski, Daron Walters, James Hodgson, Jonathan Hensel, Paul Costales
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Publication number: 20100213930Abstract: A single housing with a non-ferromagnetic piezo-driven flexure has primary and secondary coil forms of different diameters, one coaxially inside the other, integrated in the flexure. The cylinders defining the planes of the primary and secondaries do not spatially overlap. The secondary coil forms may be wound in opposite directions and wired to provide a transformer device. Movement of the primary relative to the secondaries in the direction of the central axis of the coils can be differentially detected with high precision.Type: ApplicationFiled: October 14, 2009Publication date: August 26, 2010Inventors: Roger Proksch, Dan Bocek, Jason Cleveland, Matthew Longmire, Matthew Klonowski
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Publication number: 20070075243Abstract: The preferred embodiments are directed to a method and apparatus of operating a scanning probe microscope (SPM) to perform sample measurements using a survey scan that is less than five lines, and more preferably two lines, to accurately locate a field of features of a sample. This is accomplished by selecting a step distance between adjacent lines of the survey scan that does not equal the pitch of the features in a direction orthogonal to the direction the survey scan traverses, i.e., does not equal the pitch of the features in the scan direction, XPO. The aspect ratio of the scans can also be modified to further improve sample throughput.Type: ApplicationFiled: September 30, 2005Publication date: April 5, 2007Inventors: David Kneeburg, Rohit Jain, Jason Osborne, Wei Yao, Matthew Klonowski, Ingo Schmitz