Patents by Inventor Matthew L. Brantley, JR.

Matthew L. Brantley, JR. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for dual pulse-echo sub-surface detection
    Patent number: 11913911
    Abstract: A system for detecting a sub-surface defect comprising a transducer fluidly coupled to a part located in a tank containing a liquid configured to transmit ultrasonic energy, the transducer configured to scan the part to create scan data of the scanned part; a pulser/receiver coupled to the transducer configured to receive and transmit the scan data; a processor coupled to the pulser/receiver, the processor configured to communicate with the pulser/receiver and collect the scan data; and the processor configured to detect the sub-surface defect and the processor configured to have a sub-surface defect confidence assessment and a prioritization for further human evaluation.
    Type: Grant
    Filed: June 21, 2021
    Date of Patent: February 27, 2024
    Assignee: RTX Corporation
    Inventors: Mahmoud El Chamie, Amit Surana, Christoph Schulze, Ayman Elkfrawy, Matthew L. Brantley, Jr., Ozgur Erdinc
  • SYSTEM AND METHOD FOR DUAL PULSE-ECHO SUB-SURFACE DETECTION
    Publication number: 20220404319
    Abstract: A system for detecting a sub-surface defect comprising a transducer fluidly coupled to a part located in a tank containing a liquid configured to transmit ultrasonic energy, the transducer configured to scan the part to create scan data of the scanned part; a pulser/receiver coupled to the transducer configured to receive and transmit the scan data; a processor coupled to the pulser/receiver, the processor configured to communicate with the pulser/receiver and collect the scan data; and the processor configured to detect the sub-surface defect and the processor configured to have a sub-surface defect confidence assessment and a prioritization for further human evaluation.
    Type: Application
    Filed: June 21, 2021
    Publication date: December 22, 2022
    Applicant: Raytheon Technologies Corporation
    Inventors: Mahmoud El Chamie, Amit Surana, Christoph Schulze, Ayman Elkfrawy, Matthew L. Brantley, JR., Ozgur Erdinc