Abstract: Method of delignification of plant material, said method comprising: providing said plant material comprising cellulose fibres and lignin; exposing said plant material requiring to a composition comprising: an acid; a modifying agent selected from the group consisting of: sulfamic acid; imidazole; N-alkylimidazole derivative; taurine; a taurine derivative; a taurine-related compound; alkylsulfonic acid; arylsulfonic acid; triethanolamine; and combinations thereof; a metal oxide; and a peroxide; adding an organic solvent to the resulting mixture; allowing a delignification reaction to occur for a period of time sufficient to remove at least 80% of the lignin present on said plant material.

Abstract: Embodiments of the invention include an orthopedic milling machine for preparing a glenoid bone. The milling machine uses a hub and a sleeve. The hub includes reliefs arranged to cut or mill the bone and the sleeve couples to the hub to transfer rotational motion to the hub. The hub has an axial bore sized to receive an orthopedic guide pin. The hub also has a lateral passage slot that allows the hub to move laterally towards the guide pin in order to place the guide pin within the axial bore.

Abstract: A method, apparatus and a system, for provided for performing a dynamic weighting technique for performing fault detection. The method comprises processing a workpiece and performing a fault detection analysis relating to the processing of the workpiece. The method further comprises determining a relationship of a parameter relating to the fault detection analysis to a detected fault and adjusting a weighting associated with the parameter based upon the relationship of the parameter to the detected fault.

Abstract: Embodiments of the invention include an orthopedic milling machine for preparing a glenoid bone. The milling machine uses a hub and a sleeve. The hub includes reliefs arranged to cut or mill the bone and the sleeve couples to the hub to transfer rotational motion to the hub. The hub has an axial bore sized to receive an orthopedic guide pin. The hub also has a lateral passage slot that allows the hub to move laterally towards the guide pin in order to place the guide pin within the axial bore.

Abstract: A method includes receiving fault classification data associated with a fault condition and estimating at least one yield parameter based on the fault classification data. A system includes a fault classification unit and a yield estimation unit. The fault classification unit is adapted to generate fault classification data associated with a fault condition, and the yield estimation unit is adapted to estimate at least one yield parameter based on the fault classification data.

Abstract: The present invention provides a method and apparatus for scheduling a plurality of processing tools. The method comprises providing a first processing tool and a plurality of second processing tools, selecting one of the plurality of second processing tools, and determining a target output parameter of a combination of processing tools comprising said first processing tool and said selected one of the plurality of second processing tools. The method also includes determining at least one input parameter of a process model for controlling the first processing tool based upon the target output parameter of the combination of processing tools.

Abstract: The present invention provides a method and apparatus for modifying process selectivities based on process state information. The method includes accessing process state information associated with at least one material removal process, determining at least one selectivity based on the process state information, and modifying at least one process parameter of said material removal process based on said at least one determined selectivity.

Abstract: In a complex manufacturing environment for producing semiconductor devices, a predicted quality distribution in the form of a graded die forecast may be monitored with respect to changes in order to more efficiently identify factory disturbances. To this end, a predicted distribution obtained on the basis of electrical measurement data may be compared with a predicted yield distribution based on other production data. That is, an efficient automatic monitoring of the manufacturing environment may be accomplished with reduced probability of missing respective disturbance situations, since the large number of electrical parameters may be condensed into the predicted quality distribution.

Abstract: A method includes defining a plurality of objectives for a film formation process and employing a control equation incorporating the plurality of objectives to generate at least one operating recipe parameter for the film formation process. A system includes a film formation unit and a process control unit. The film formation unit is adapted to perform a film formation process in accordance with an operating recipe. The process control unit is adapted to define a plurality of objectives for the film formation process and employ a control equation incorporating the plurality of objectives to generate at least one operating recipe parameter for the film formation process.

Abstract: The present invention provides a method and apparatus for selecting wafers for sampling. The method includes determining a plurality of sampling rules associated with at least one of a plurality of wafers and selecting at least one wafer for sampling based on the plurality of sampling rules.

Abstract: The present invention provides a method that includes determining a jeopardy count associated with at least one processing tool and selecting at least one wafer based upon the jeopardy count, the at least one wafer having been processed by the at least one processing tool.

Abstract: The present invention is generally directed to various methods and systems for dynamically controlling metrology work in progress. In one illustrative embodiment, the method comprises providing a metrology control unit that is adapted to control metrology work flow to at least one metrology tool, identifying a plurality of wafer lots that are in a metrology queue wherein the wafer lots are intended to be processed in at least one metrology tool, and wherein the metrology control unit selects at least one of the wafer lots for metrology processing in the at least one metrology tool and selects at least one other of the plurality of wafer lots to be removed from the metrology queue based upon the metrology processing of the selected at least one wafer lot in the at least one metrology tool.

Abstract: The present invention is generally directed to various methods and systems for calibrating degradable components using process state data. In one illustrative embodiment, the method includes providing a tool comprised of at least one process chamber, providing at least one process state sensor that is adapted to obtain process state data regarding at least one characteristic of a process environment established in the chamber in performance of a process operation, operatively coupling at least one of a new or repaired degradable component to the tool, and calibrating the new or repaired degradable component based upon the process state data. In further embodiments, the method comprises processing a plurality of additional workpieces in the tool after the new or repaired degradable components have been calibrated using process state data in accordance with one aspect of the present invention.

Abstract: The present invention relates generally to exercising equipment, and more particularly, to an improved multi-use weight lifting apparatus. The present weight lifting apparatus comprises a frame (12), a vertical guide member (52), at least one horizontal guide member (46), a weight bearing bar (60), and a safety catch mechanism (70). This weight lifting apparatus allows a weight lifter to perform exercise with vertical and horizontal ranges of motion that simulate the natural motions of using free weights while providing safety mechanisms that are not available with free weights.

Abstract: A method includes receiving a current residual vector. The current residual vector is compared to a plurality of historical residual vectors. Each historical residual vector has an associated fault classification code. At least one of the historical residual vectors is selected responsive to determining that the current residual vector matches at least one of the historical residual vectors. A fault condition is classified based on the fault classification code associated with the selected historical residual vector.

Abstract: The present invention is generally directed to various methods and systems for dynamically adjusting metrology sampling based upon available metrology capacity. In one illustrative embodiment, the method comprises providing a metrology control unit that is adapted to determine a baseline metrology sampling rate for at least one metrology operation, determining available metrology capacity, and providing the determined available metrology capacity to the metrology control unit wherein the metrology control unit determines a new metrology sampling rate based upon the determined available metrology capacity.

Abstract: A method and apparatus provided for controlling cumulative wafer effects. The method comprises processing a workpiece, determining a cumulative effect of the processing on the workpiece and comparing the determined cumulative effect to a reference target value. The method further comprises adjusting a downstream process of the workpiece based on comparing the determined cumulative effect to the reference target value.

Abstract: A method for controlling a process includes determining incoming state information associated with the process. A plurality of control models associated with the process is provided. A confidence metric is determined for each of the control models based on the incoming state information. The one of the plurality of control models having the highest associated confidence metric is selected. A control action for determining at least one parameter in an operating recipe used to implement the process is generated using the selected control model. A system includes a process tool and a process controller. The process tool is configured to process a workpiece in accordance with an operating recipe.

Abstract: The present invention is generally directed to various methods and systems for prioritizing material to clear exception conditions. In one illustrative embodiment, the method includes providing a plurality of workpieces, each of the workpieces having an associated quantity of material that cannot be processed until the workpiece has been processed, and determining a priority for processing each of the plurality of workpieces based upon at least the associated quantity of material that cannot be processed.

Abstract: A method, apparatus and a system, for provided for performing a dynamic weighting technique for performing fault detection. The method comprises processing a workpiece and performing a fault detection analysis relating to the processing of the workpiece. The method further comprises determining a relationship of a parameter relating to the fault detection analysis to a detected fault and adjusting a weighting associated with the parameter based upon the relationship of the parameter to the detected fault.