Patents by Inventor Matthew Ronald Millecchia

Matthew Ronald Millecchia has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11555791
    Abstract: Measurement cavities described herein include a cylindrical chamber having a first open end and a second open end; a first cap covering the first open end of the cylindrical chamber and a second cap covering the second open end of the cylindrical chamber, wherein the first and second caps hermetically seal the cylindrical chamber and wherein the first cap is rigidly coupled to the second cap; and a wafer holder positioned within and coupled to the cylindrical chamber. The measurement cavity has a mass m, a stiffness k, and a damping constant c configured such that the transmissibility ? x F ? of an input force at 60 Hz in the measurement cavity is reduced by a factor of at least 10 and the measurement cavity has a natural frequency of greater than 300 Hz.
    Type: Grant
    Filed: November 20, 2020
    Date of Patent: January 17, 2023
    Assignee: Corning Incorporated
    Inventors: John Weston Frankovich, Christopher Alan Lee, Matthew Ronald Millecchia
  • Publication number: 20210164915
    Abstract: Measurement cavities described herein include a cylindrical chamber having a first open end and a second open end; a first cap covering the first open end of the cylindrical chamber and a second cap covering the second open end of the cylindrical chamber, wherein the first and second caps hermetically seal the cylindrical chamber and wherein the first cap is rigidly coupled to the second cap; and a wafer holder positioned within and coupled to the cylindrical chamber. The measurement cavity has a mass m, a stiffness k, and a damping constant c configured such that the transmissibility ? x F ? of an input force at 60 Hz in the measurement cavity is reduced by a factor of at least 10 and the measurement cavity has a natural frequency of greater than 300 Hz.
    Type: Application
    Filed: November 20, 2020
    Publication date: June 3, 2021
    Inventors: John Weston Frankovich, Christopher Alan Lee, Matthew Ronald Millecchia
  • Publication number: 20210165236
    Abstract: Systems and methods for reducing laser coherence effect within an optical system are disclosed. A system includes an acoustic device, a signal generator electrically coupled to the acoustic device, where the signal generator generates an electrical signal comprising a predefined frequency and a predefined amplitude for output by the acoustic device, and an optical system comprising a laser light source configured to produce a beam where one or more optical elements are disposed along the beam path that impinges or propagates through the one or more optical elements. The acoustic device is positioned at a distance from the one or more optical elements such that an acoustic signal emitted by the acoustic device causes one or more optical elements to vibrate such that laser coherence effects of the beam are reduced.
    Type: Application
    Filed: November 20, 2020
    Publication date: June 3, 2021
    Inventors: Stephen Karl Mack, Matthew Ronald Millecchia
  • Publication number: 20210157085
    Abstract: An optical mount includes a support substrate defining an aperture configured to receive an optical element. A support assembly is positioned proximate a perimeter of the aperture. The support assembly includes a resilient member configured reflects in response to relative motion between the optical element and the support substrate. A support plate is positioned on the resilient member and is in contact with the optical element.
    Type: Application
    Filed: February 3, 2021
    Publication date: May 27, 2021
    Inventors: Robert Dennis Grejda, Keith Ernest Hanford, Brian Monroe McMaster, Todd Robert McMichael, Matthew Ronald Millecchia, James Edward Platten
  • Patent number: 10871369
    Abstract: The methods disclosed herein include recording at near-vertical first and second measurement positions respective first and second interferograms of the photomask surface and defining a difference map as the difference between the first and second interferograms. Respective first and second normal forces on the photomask are also measured at the first and second measurement positions. The change in the normal force is used define a scaling factor, which is applied to the difference map to define a scaled difference map. A compensated flatness measurement with a reduced shape contribution due to gravity is obtained by subtracting the scaled difference map from the first interferogram. An interferometer-based flatness measurement system is also disclosed.
    Type: Grant
    Filed: July 31, 2019
    Date of Patent: December 22, 2020
    Assignee: Corning Incorporated
    Inventors: Thomas James Dunn, John Weston Frankovich, Robert Dennis Grejda, Christopher Alan Lee, Matthew Ronald Millecchia, Yoshihiro Nakamura
  • Publication number: 20200041248
    Abstract: The methods disclosed herein include recording at near-vertical first and second measurement positions respective first and second interferograms of the photomask surface and defining a difference map as the difference between the first and second interferograms. Respective first and second normal forces on the photomask are also measured at the first and second measurement positions. The change in the normal force is used define a scaling factor, which is applied to the difference map to define a scaled difference map. A compensated flatness measurement with a reduced shape contribution due to gravity is obtained by subtracting the scaled difference map from the first interferogram. An interferometer-based flatness measurement system is also disclosed.
    Type: Application
    Filed: July 31, 2019
    Publication date: February 6, 2020
    Inventors: Thomas James Dunn, John Weston Frankovich, Robert Dennis Grejda, Christopher Alan Lee, Matthew Ronald Millecchia, Yoshihiro Nakamura