Abstract: A set of tools is provided herein that produces useful, proven, and correct integrated semiconductor chips. Having as input either a customer's requirements for a chip, or a design specification for a partially manufactured semiconductor chip, the tools generate the RTL for control plane interconnect; memory composition, test, and manufacture; embedded logic analysis, trace interconnection, and utilization of spare resources on the chip; I/O qualification, JTAG, boundary scan, and SSO analysis; testable clock generation, control, and distribution; interconnection of all of the shared logic in a testable manner from a transistor fabric and/or configurable blocks in the slice. The input customer requirements are first conditioned by RTL analysis tools to quickly implement its logic. The slice definition and the RTL shell provides the correct logic for a set of logic interfaces for the design specification to connect. The tools share a common database so that logical interactions do not require multiple entries.

Abstract: A set of tools is provided herein that produces useful, proven, and correct integrated semiconductor chips. Having as input either a customer's requirements for a chip, or a design specification for a partially manufactured semiconductor chip, the tools generate the RTL for control plane interconnect; memory composition, test, and manufacture; embedded logic analysis, trace interconnection, and utilization of spare resources on the chip; I/O qualification, JTAG, boundary scan, and SSO analysis; testable clock generation, control, and distribution; interconnection of all of the shared logic in a testable manner from a transistor fabric and/or configurable blocks in the slice. The input customer requirements are first conditioned by RTL analysis tools to quickly implement its logic. The slice definition and the RTL shell provides the correct logic for a set of logic interfaces for the design specification to connect. The tools share a common database so that logical interactions do not require multiple entries.

Abstract: A standardized silicon platform chip has a substrate surface with an array of unconnected transistors that surround islands. The islands have circuit elements that are interconnectable within each island to form a plurality of varied circuit functions for each of the islands. The varied circuit functions include both application functions and clock functions. Interconnect layers are deposited over the substrate surface to interconnect the circuit elements within each island to complete the varied circuit functions. The varied circuit functions include varied levels of integration including at least gates, flip-flops, clock trees, and oscillators. The varied circuit functions are custom connectable to the array of unconnected transistors to form standard clock resources for the standardized silicon platform chip.

Abstract: A tool for designing an integrated circuit and semiconductor product that generates correct RTL for I/O buffer structures in consideration of the requirements of diffused configurable I/O blocks and/or I/O hardmacs of the product. Given either a slice description of a partially manufactured semiconductor product, a designer can generate the I/O resources of an application set. Then given an application set having a transistor fabric, and the diffused configurable I/O blocks and/or the I/O hardmacs, and a plurality of accompanying shells, the I/O generation tool herein automatically reads a database having the slice description and generates the I/O buffer structures from the transistor fabric. The I/O generation tool further conditions and integrates input from either or both customer having her/his own logic and requesting a specific semiconductor product or from IP cores with their preestablished logic.

Abstract: A set of tools is provided herein that produces useful, proven, and correct integrated semiconductor chips. Having as input either a customer's requirements for a chip, or a design specification for a partially manufactured semiconductor chip, the tools generate the RTL for control plane interconnect; memory composition, test, and manufacture; embedded logic analysis, trace interconnection, and utilization of spare resources on the chip; I/O qualification, JTAG, boundary scan, and SSO analysis; testable clock generation, control, and distribution; interconnection of all of the shared logic in a testable manner from a transistor fabric and/or configurable blocks in the slice. The input customer requirements are first conditioned by RTL analysis tools to quickly implement its logic. The slice definition and the RTL shell provides the correct logic for a set of logic interfaces for the design specification to connect. The tools share a common database so that logical interactions do not require multiple entries.

Abstract: A tool for designing an integrated circuit and semiconductor product that generates correct RTL for I/O buffer structures in consideration of the requirements of diffused configurable I/O blocks and/or I/O hardmacs of the product. Given either a slice description of a partially manufactured semiconductor product, a designer can generate the I/O resources of an application set. Then given an application set having a transistor fabric, and the diffused configurable I/O blocks and/or the I/O hardmacs, and a plurality of accompanying shells, the I/O generation tool herein automatically reads a database having the slice description and generates the I/O buffer structures from the transistor fabric. The I/O generation tool further conditions and integrates input from either or both customer having her/his own logic and requesting a specific semiconductor product or from IP cores with their preestablished logic.