Patents by Inventor Matthew T. Emerick

Matthew T. Emerick has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Grain measurement apparatus
    Patent number: 9671273
    Abstract: A measurement apparatus may include a holding hopper configured to receive a sample of granular material. The measurement apparatus may include a top barrier assembly coupled between the holding hopper and a sub-sample measurement chamber. The top barrier assembly may include a movable top barrier configured to be moved from a closed position to an open position to direct a sub-sample of granular material to flow from the holding hopper to the sub-sample measurement chamber. The measurement apparatus may include the sub-sample measurement chamber configured to couple to the holding hopper at a docked position to receive the sub-sample of granular material from the holding hopper. The measurement apparatus may include a separator actuator configured to separate the sub-sample measurement chamber from the holding hopper. The measurement apparatus may include one or more measurement sensors configured to measure one or more attributes of the sub-sample of granular material.
    Type: Grant
    Filed: February 2, 2015
    Date of Patent: June 6, 2017
    Assignee: JUNIPER SYSTEMS, INC.
    Inventors: Matthew T. Emerick, Steven L. Harris
  • GRAIN MEASUREMENT APPARATUS
    Publication number: 20150219488
    Abstract: A measurement apparatus may include a holding hopper configured to receive a sample of granular material. The measurement apparatus may include a top barrier assembly coupled between the holding hopper and a sub-sample measurement chamber. The top barrier assembly may include a movable top barrier configured to be moved from a closed position to an open position to direct a sub-sample of granular material to flow from the holding hopper to the sub-sample measurement chamber. The measurement apparatus may include the sub-sample measurement chamber configured to couple to the holding hopper at a docked position to receive the sub-sample of granular material from the holding hopper. The measurement apparatus may include a separator actuator configured to separate the sub-sample measurement chamber from the holding hopper. The measurement apparatus may include one or more measurement sensors configured to measure one or more attributes of the sub-sample of granular material.
    Type: Application
    Filed: February 2, 2015
    Publication date: August 6, 2015
    Inventors: Matthew T. Emerick, Steven L. Harris