Abstract: Methods, computer program products, and corresponding devices are provided for measuring the bi-directional reflectance distribution function (BRDF) of an object. An object is positioned relative to a BRDF measurement device. The BRDF measurement device comprises a turntable coupled to a background and a light source, the turntable configured to have the object positioned thereon; and a plurality of spectrographs configured such that each of the plurality of the spectrographs captures a reflectance spectra associated with the object from a different elevation angle relative to the object. A set of spectra data is captured by illuminating the object with the light source; and with each spectrograph, capturing a reflectance spectra associated with the object. The turntable is rotated such that an azimuthal angle between the object and the light source is changed. The capturing and rotating steps are repeated for a predetermined set of azimuthal angles.

Abstract: Methods, computer program products, and corresponding devices are provided for measuring the bi-directional reflectance distribution function (BRDF) of an object. An object is positioned relative to a BRDF measurement device. The BRDF measurement device comprises a turntable coupled to a background and a light source, the turntable configured to have the object positioned thereon; and a plurality of spectrographs configured such that each of the plurality of the spectrographs captures a reflectance spectra associated with the object from a different elevation angle relative to the object. A set of spectra data is captured by illuminating the object with the light source; and with each spectrograph, capturing a reflectance spectra associated with the object. The turntable is rotated such that an azimuthal angle between the object and the light source is changed. The capturing and rotating steps are repeated for a predetermined set of azimuthal angles.