Abstract: A topographical inspection device that employs one or both of a photometric stereo system for determining surface normal for individual pixel locations in an image space and/or dot pattern projection. A device body supports light elements at spaced apart locations to illuminate an inspection region and a dot pattern projector for projecting a dot pattern onto the inspection region. A camera captures images of the surface when illuminated by the light elements and/or dot pattern projector. Controlling the light elements and camera, a first topographical measurement of the inspection region is made based on light intensity in images taken by the camera. A second topographical measurement may be made based on dot pattern projection.

Abstract: A system and a method for locating and visualizing camera images in relation to a large-scale manufacturing product with repetitive structures are disclosed. The system includes a trackable camera device, a tracking subsystem, and an image overlay module. The trackable camera device can capture images of surface features of the large-scale product. The tracking subsystem is configured to generate a tracking record that contains the position and location of the trackable camera device over time. The image overlay module is configured to precisely overlay the captured images on a three-dimensional model of the large-scale product based on where the trackable camera device was tracked when each image was captured. A method is disclosed for using the components of the system to overlay the captured images, and a method of auditing the large-scale product by comparing a region of interest to previously captured images overlaid on a respective three-dimensional model.