Abstract: The present invention relates to a label-free biosensor system, a method for manufacturing said label-free biosensor system, its use for detecting biochemical reactions and/or bindings, enzymatic reactions, nucleic acid hybridizations, protein-protein interactions and protein-ligand interactions, as well as an assay method for detecting and/or quantifying an analyte of interest in a biological sample which comprises detecting the Recognition Induced Birefringence (RIB) generated in the presence as opposed to the absence of said analyte by bringing said sample into contact with said label-free biosensor system.

Abstract: The present invention relates to a label-free biosensor system, a method for manufacturing said label-free biosensor system, its use for detecting biochemical reactions and/or bindings, enzymatic reactions, nucleic acid hybridizations, protein-protein interactions and protein-ligand interactions, as well as an assay method for detecting and/or quantifying an analyte of interest in a biological sample which comprises detecting the Recognition Induced Birefringence (RIB) generated in the presence as opposed to the absence of said analyte by bringing said sample into contact with said label-free biosensor system.

Abstract: This invention relates to a high-resolution ellipsometry method for quantitative and/or qualitative analysis of sample variations. The sample is located on a sample carrier, equipped with at least one metal film. The parameters &psgr; and &Dgr; are determined by ellipsometric measurement, wherein the angle of incidence and/or frequency of the electromagnetic radiation used in ellipsometric measurements is set in such a way as to produce a damped surface plasmon resonance. The detection sensitivity (sample variation unit) is adjusted by means of the thickness of the metal layer. The electromagnetic radiation is planely radiated onto the side of the sample carrier opposite the sample. Using at least one angle of incidence and one frequency at least two staggered, simultaneous, high-resolution ellipsometric measurements are taken of the sample or samples. At least the corresponding &Dgr; or cos &Dgr; value are evaluated to determine sample variation.

Abstract: A micropolarimeter and ellipsometer for obtaining complete optical information of superficially illuminated specimens. A compact construction is designed to facilitate their use. To obtain the simultaneous surface measurement of all optical information from a specimen, the retarder of the micropolarimeter consists of a one-piece retarder array with at least one pixel group, in which the major axis orientations of the individual pixels are distributed over an angular range of 360°. This micropolarimeter can be integrated into the reflected light microscope of an ellipsometer. The result is a compact measurement unit.

Abstract: The invention concerns a micropolarimeter comprising an analyzer (1) and a detector (10) located past the analyzer in the direction of radiation and presenting a number of segments ND which is higher than or equal to 3 (11). The invention seeks to provide a micropolarimeter with no moving parts, with a high polarization index, for use for polychromatic light, so small that it can detect the ray of common lasers in one single measurement step without it being necessary to enlarge it, and capable of being converted in a simple manner into a complete Stokesmeter.

Abstract: Normally, repeated calibration measurements are necessary for the adjustment of the sample and ellipsometer. To achieve an automatic relative adjustment, a sample position detection system that can be adjusted in relation to the ellipsometer and locked in is assigned to the ellipsometer, and where the detection system is connected to an adjusting system that affects the sample table and/or the entire system detection system/ellipsometer. The method for automatic relative adjustment is provided for, that by initially using one sample, the system sample/ellipsometer is adjusted via the symmetry of the detector signal of the ellipsometer, and that the sample position detection system is adjusted and subsequently locked in with the ellipsometer. With all subsequent samples, a relative adjustment of sample and ellipsometer detection system is performed using the signals of the detection system.