Patents by Inventor Matthias Eibl

Matthias Eibl has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12087041
    Abstract: A method generates an image processing model to calculate a virtually stained image from a microscope image. The image processing model is trained using training data comprising microscope images as input data into the image processing model and target images that are formed via chemically stained images registered locally in relation to the microscope images. The image processing model is trained to calculate virtually stained images from the input microscope images by optimizing an objective function that captures a difference between the virtually stained images and the target images. After a number of training steps, at least one weighting mask is defined using one of the chemically stained images and an associated virtually stained image calculated after the number of training steps. In the weighting mask, one or more image regions are weighted based on differences between locally corresponding image regions in the virtually stained image and in the chemically stained image.
    Type: Grant
    Filed: May 30, 2022
    Date of Patent: September 10, 2024
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Alexander Freytag, Matthias Eibl, Christian Kungel, Anselm Brachmann, Daniel Haase, Manuel Amthor
  • Publication number: 20240282087
    Abstract: A computer-implemented method for generating an image processing model (M) that calculates a virtually stained image (30) from a microscope image (20) comprises a training (15) of the image processing model (M) using training data (T) comprising at least: microscope images (20) as input data into the image processing model (M); target images (50) formed using captured chemically stained images (60); and predefined segmentation masks (70) that discriminate between image regions (71, 72) to be stained and image regions (72) that are not to be stained. The image processing model (M) is trained to calculate virtually stained images (30) from the input microscope images (20) by optimizing a staining reward/loss function (LSTAIN) that captures a difference between the virtually stained images (30) and the target images (50). The predefined segmentation masks (70) are taken into account in the training (15) of the image processing model (M) to compensate errors in the chemically stained images (60).
    Type: Application
    Filed: May 30, 2022
    Publication date: August 22, 2024
    Inventors: Alexander Freytag, Matthias Eibl, Christian Kungel, Anselm Brachmann, Daniel Haase, Manuel Amthor
  • Publication number: 20240265682
    Abstract: A method generates an image processing model to calculate a virtually stained image from a microscope image. The image processing model is trained using training data comprising microscope images as input data into the image processing model and target images that are formed via chemically stained images registered locally in relation to the microscope images. The image processing model is trained to calculate virtually stained images from the input microscope images by optimizing an objective function that captures a difference between the virtually stained images and the target images. After a number of training steps, at least one weighting mask is defined using one of the chemically stained images and an associated virtually stained image calculated after the number of training steps. In the weighting mask, one or more image regions are weighted based on differences between locally corresponding image regions in the virtually stained image and in the chemically stained image.
    Type: Application
    Filed: May 30, 2022
    Publication date: August 8, 2024
    Inventors: Alexander Freytag, Matthias Eibl, Christian Kungel, Anselm Brachmann, Daniel Haase, Manuel Amthor
  • Patent number: 9851303
    Abstract: Described is a system for inducing and detecting multi-photon processes, in particular multi-photon fluorescence or higher harmonic generation in a sample. The system comprises a dynamically-controllable light source, said dynamically-controllable light source comprising a first sub-light source, said first sub-light source being electrically controllable such as to generate controllable time-dependent intensity patterns of light having a first wavelength, and at least one optical amplifier, thereby allowing for active time-control of creation of multi-photon-excitation. The system further comprises a beam delivery unit for delivering light generated by said dynamically-controllable light source to a sample site, and a detector unit or detector assembly for detecting signals indicative of said multi-photon process, in particular multi-photon fluorescence signals or higher harmonics signals.
    Type: Grant
    Filed: June 3, 2015
    Date of Patent: December 26, 2017
    Assignee: Ludwig-Maximilians-Universität München
    Inventors: Robert Alexander Huber, Sebastian Karpf, Matthias Eibl
  • Publication number: 20170146458
    Abstract: Described is a system for inducing and detecting multi-photon processes, in particular multi-photon fluorescence or higher harmonic generation in a sample. The system comprises a dynamically-controllable light source, said dynamically-controllable light source comprising a first sub-light source, said first sub-light source being electrically controllable such as to generate controllable time-dependent intensity patterns of light having a first wavelength, and at least one optical amplifier, thereby allowing for active time-control of creation of multi-photon-excitation. The system further comprises a beam delivery unit for delivering light generated by said dynamically-controllable light source to a sample site, and a detector unit or detector assembly for detecting signals indicative of said multi-photon process, in particular multi-photon fluorescence signals or higher harmonics signals.
    Type: Application
    Filed: June 3, 2015
    Publication date: May 25, 2017
    Inventors: Robert Alexander Huber, Sebastian Karpf, Matthias Eibl
  • Patent number: 9638638
    Abstract: Disclosed herein is a system (10) for measuring light induced transmission or reflection changes, in particular due to stimulated Raman emission. The system comprises a first light source (12) for generating a first light signal having a first wavelength, a second light source (14) for generating a second light signal having a second wavelength, an optical assembly (16) for superposing said first and second light signals at a sample location (18), and a detection means (24) for detecting a transmitted or reflected light signal, in particular a stimulated Raman signal caused by a Raman-active medium when located at said sample location. Here in at least one of the first and second light sources (12, 14) is one or both of actively controllable to emit a time controlled light pattern or operated substantially in CW mode and provided with an extra cavity modulation means (64) for generating a time controlled light pattern.
    Type: Grant
    Filed: May 9, 2014
    Date of Patent: May 2, 2017
    Assignee: Ludwig-Maximilians-Universität München
    Inventors: Robert Alexander Huber, Thomas Klein, Wolfgang Wieser, Sebastian Karpf, Matthias Eibl
  • Patent number: 9515452
    Abstract: Disclosed herein is a coherent dynamically controllable narrow band light source (10), comprising a first sub-light source (12), said first sub-light source being electrically controllable such as to generate controllable time-dependent intensity patterns of light having a first wavelength, a Raman active medium (30) suitable to cause Raman scattering of light having said first wavelength, a second sub-light source (20) capable of emitting light with a second wavelength, said second wavelength being longer than said first wavelength, and an optical fiber or wave guide, wherein said light emitted by said first and second sub-light sources traverses a length of said optical fiber (30) or wave guide in a feed-forward configuration to facilitate a non-linear wavelength conversion step involving said Raman-active medium. At least one of said first and second sub-light sources (12, 20) has a coherence length longer than 0.05 mm, preferably longer than 0.5 mm and most preferably longer than 2 mm.
    Type: Grant
    Filed: May 9, 2014
    Date of Patent: December 6, 2016
    Assignee: Ludwig-Maximilians-Universität München
    Inventors: Robert Alexander Huber, Sebastian Karpf, Matthias Eibl
  • Publication number: 20160118765
    Abstract: Disclosed herein is a coherent dynamically controllable narrow band light source (10), comprising a first sub-light source (12), said first sub-light source being electrically controllable such as to generate controllable time-dependent intensity patterns of light having a first wavelength, a Raman active medium (30) suitable to cause Raman scattering of light having said first wavelength, a second sub-light source (20) capable of emitting light with a second wavelength, said second wavelength being longer than said first wavelength, and an optical fiber or wave guide, wherein said light emitted by said first and second sub-light sources traverses a length of said optical fiber (30) or wave guide in a feed-forward configuration to facilitate a non-linear wavelength conversion step involving said Raman-active medium. At least one of said first and second sub-light sources (12, 20) has a coherence length longer than 0.05 mm, preferably longer than 0.5 mm and most preferably longer than 2 mm.
    Type: Application
    Filed: May 9, 2014
    Publication date: April 28, 2016
    Inventors: Robert Alexander Huber, Sebastian Karpf, Matthias Eibl
  • Publication number: 20160091429
    Abstract: Disclosed herein is a system (10) for measuring light induced transmission or reflection changes, in particular due to stimulated Raman emission. The system comprises a first light source (12) for generating a first light signal having a first wavelength, a second light source (14) for generating a second light signal having a second wavelength, an optical assembly (16) for superposing said first and second light signals at a sample location (18), and a detection means (24) for detecting a transmitted or reflected light signal, in particular a stimulated Raman signal caused by a Raman-active medium when located at said sample location. Here in at least one of the first and second light sources (12, 14) is one or both of actively controllable to emit a time controlled light pattern or operated substantially in CW mode and provided with an extra cavity modulation means (64) for generating a time controlled light pattern.
    Type: Application
    Filed: May 9, 2014
    Publication date: March 31, 2016
    Inventors: Robert Alexander Huber, Thomas Klein, Wolfgang Wieser, Sebastian Karpf, Matthias Eibl