Patents by Inventor Matthias GEIL

Matthias GEIL has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10042054
    Abstract: A distance measuring method for a point on an object is performed by emitting measurement radiation. When an optical measurement axis of the measurement radiation is aligned with the point to be measured, an optical measurement point region is defined by the beam cross section of the radiation on the object. The beam cross section may be, for example, a maximum of eight times the standard deviation of a Gaussian steel profile of the measurement radiation. The the distance to the point on the object is determined by receiving measurement radiation reflected from the object. The method includes altering, at least once, a measurement direction as emission direction of the measurement radiation with respective emission and reception of the measurement radiation. Altering the measurement direction is carried out such that respective area centroids defined by the beam cross section on the object lie within the measurement point region.
    Type: Grant
    Filed: January 29, 2014
    Date of Patent: August 7, 2018
    Assignees: HEXAGON TECHNOLOGY CENTER GMBH, HEXAGON METROLOGY GMBH
    Inventors: Thomas Jensen, Knut Siercks, Peter Champ, Matthias Geil
  • Publication number: 20140211191
    Abstract: A distance measuring method for a point on an object is performed by emitting measurement radiation. When an optical measurement axis of the measurement radiation is aligned with the point to be measured, an optical measurement point region is defined by the beam cross section of the radiation on the object. The beam cross section may be, for example, a maximum of eight times the standard deviation of a Gaussian steel profile of the measurement radiation. The distance to the point on the object is determined by receiving measurement radiation reflected from the object. The method includes altering, at least once, a measurement direction as emission direction of the measurement radiation with respective emission and reception of the measurement radiation. Altering the measurement direction is carried out such that respective area centroids defined by the beam cross section on the object lie within the measurement point region.
    Type: Application
    Filed: January 29, 2014
    Publication date: July 31, 2014
    Inventors: Thomas JENSEN, Knut SIERCKS, Peter CHAMP, Matthias GEIL