Abstract: Disclosed is a retroreflector-based sensor system for optical characterization of a sample, having a transmitter for irradiating the sample, a retroflector positioned behind the sample, the transmitter, the sample, and the retroreflector being positioned such that radiation reflected back from the retroreflector is again incident on the sample and is reflected back from the latter in the direction towards the transmitter, and a receiver which is positioned in the receiving beam path such that it detects radiation reflected back from the retroreflector, incident again on the sample and reflected back from the latter, in the direction towards the transmitter.

Abstract: The invention relates to an apparatus for controlling the quality of transparent objects, comprising at least one light source being adapted to illuminate the object, and at least one image capturing device, by means of which at least one image of the object can be detected, wherein the apparatus comprises further at least one reflector, wherein the reflector and the image capturing device define a beam path, wherein the reflector, the image capturing device, and the light source are arranged such that the object can be arranged between the reflector, on the one hand, and the image capturing device and the light source, on the other hand, such that a single sheet of material is located in the beam path. Furthermore, the invention relates to a corresponding method for controlling the quality of transparent objects.

Abstract: Disclosed is a retroreflector-based sensor system for optical characterization of a sample, having a transmitter for irradiating the sample, a retroflector positioned behind the sample, the transmitter, the sample, and the retroreflector being positioned such that radiation reflected back from the retroreflector is again incident on the sample and is reflected back from the latter in the direction towards the transmitter, and a receiver which is positioned in the receiving beam path such that it detects radiation reflected back from the retroreflector, incident again on the sample and reflected back from the latter, in the direction towards the transmitter.

Abstract: The present invention relates to a device for optical characterisation of a sample and/or of the material(s) of the same having an illumination unit that can be orientated to illuminate with incident light a sample spatial portion into which the sample can be introduced, a detection unit which is orientated or can be orientated to image the sample introduced into the sample spatial portion by receiving light reflected by the sample, and which is configured to detect at least two different, preferably orthogonal, polarization components in the reflected light, and an evaluation unit with which, in the imaging data recorded by the detection unit, those imaged surface elements (reflection elements) of the sample can be identified, and with which the detected different polarization components for these reflection elements can be evaluated for optical characterisation.

Abstract: The invention relates to an apparatus for controlling the quality of transparent objects, comprising at least one light source being adapted to illuminate the object, and at least one image capturing device, by means of which at least one image of the object can be detected, wherein the apparatus comprises further at least one reflector, wherein the reflector and the image capturing device define a beam path, wherein the reflector, the image capturing device, and the light source are arranged such that the object can be arranged between the reflector, on the one hand, and the image capturing device and the light source, on the other hand, such that a single sheet of material is located in the beam path. Furthermore, the invention relates to a corresponding method for controlling the quality of transparent objects.

Abstract: The present invention relates to a device for optical characterisation of a sample and/or of the material(s) of the same having an illumination unit that can be orientated to illuminate with incident light a sample spatial portion into which the sample can be introduced, a detection unit which is orientated or can be orientated to image the sample introduced into the sample spatial portion by receiving light reflected by the sample, and which is configured to detect at least two different, preferably orthogonal, polarization components in the reflected light, and an evaluation unit with which, in the imaging data recorded by the detection unit, those imaged surface elements (reflection elements) of the sample can be identified, and with which the detected different polarization components for these reflection elements can be evaluated for optical characterisation.

Abstract: The present invention relates to a device for optical characterization of a sample and/or of the material(s) of the same having an illumination unit that can be orientated to illuminate with incident light a sample spatial portion into which the sample can be introduced, a detection unit which is orientated or can be orientated to image the sample introduced into the sample spatial portion by receiving light reflected by the sample, and which is configured to detect at least two different, preferably orthogonal, polarization components in the reflected light, and an evaluation unit with which, in the imaging data recorded by the detection unit, those imaged surface elements (reflection elements) of the sample can be identified, and with which the detected different polarization components for these reflection elements can be evaluated for optical characterization.

Abstract: The present invention relates to a device for optical characterisation of a sample and/or of the material/materials of the same having an illumination unit which is orientated or can be orientated to illuminate with incident light a sample spatial portion into which the sample can be introduced, a detection unit which is orientated or can be orientated to image the sample introduced into the sample spatial portion by receiving light reflected by the sample, and which is configured to detect at least two different, preferably two orthogonal, polarisation components in the reflected light, and an evaluation unit with which, in the imaging data recorded by the detection unit, those imaged surface elements (reflection elements) of the sample can be identified, the reflected, received light of which is based on a reflection of the incident light on the sample, and with which the detected different polarisation components for these reflection elements can be evaluated for optical characterisation.

Abstract: A device is disclosed for the classification of a transparent component of a material flow using an optical detector unit, with allocatable optical axis which is directed toward the material flow, at least one illumination unit for illuminating the material flow from a space over the material flow, in which the optical detector unit is also contained, and a classifier, which classifies the component based on information which is recorded from the component using the optical detector unit, and a decision criterion. A retroreflector is provided at least longitudinally relative to the optical axis of the detector unit, downstream from the material flow in the viewing direction of the detector, the illumination unit provides at least two light sources, with first light source emitting light of a first type and a second light source emitting light of a second type.

Abstract: A device and a method are described for the optical selection of components of at least one fraction from a bulk material stream conveyed along a conveyance direction, having a camera unit, whose camera viewing direction is oriented toward the bulk material stream, a background, situated in the camera viewing direction behind the bulk material stream, whose color is adaptable to the color of a selected fraction of components of the bulk material stream, an analysis and control unit, connected to the camera unit, in which control commands for a separation unit, which is capable of separating the components to be selected out of the bulk material stream upon activation, may be generated according to a decision criterion.

Abstract: A device is disclosed for the classification of a transparent component of a material flow using an optical detector unit, with allocatable optical axis which is directed toward the material flow, at least one illumination unit for illuminating the material flow from a space over the material flow, in which the optical detector unit is also contained, and a classifier, which classifies the component based on information which is recorded from the component using the optical detector unit, and a decision criterion. A retroreflector is provided at least longitudinally relative to the optical axis of the detector unit, downstream from the material flow in the viewing direction of the detector, the illumination unit provides at least two light sources, with first light source emitting light of a first type and a second light source emitting light of a second type, The light of at least the first light source is incident on the material flow longitudinally relative to the optical axis.

Abstract: A device and a method are described for the optical selection of components of at least one fraction from a bulk material stream conveyed along a conveyance direction, having a camera unit, whose camera viewing direction is oriented toward the bulk material stream, a background, situated in the camera viewing direction behind the bulk material stream, whose color is adaptable to the color of a selected fraction of components of the bulk material stream, an analysis and control unit, connected to the camera unit, in which control commands for a separation unit, which is capable of separating the components to be selected out of the bulk material stream upon activation, may be generated according to a decision criterion.

Abstract: The invention relates to a laser scanner measurement system, comprising a transmission unit consisting of a laser, beam deflection unit and transmitting optical system, and a receiving part with a photodetector which is arranged in the focal plane of the optical system destined for the receiving beam path. The invention is characterized in that the scanner unit and receiving unit are arranged on the same side in relation to the object and the surface normal of the receiving optical system is parallel to the direction of radiation of the scanner unit, i.e. that the scanner and receiver beam path in the outer area at all times have the same optical axis or that the axes are displaced parallel to each other and perpendicular to the direction ofmovement of the laser beam.

Abstract: A method for retrieving predetermined locations in sewer and pipeline systems after application or deposition of a layer of material. A carrier vehicle having a microwave sensor emits microwave signals and receives backscattered microwave signals. A first run is conducted inside the sewer or pipeline system before application or deposition of the layer of material. A first temporal signal profile of the backscattered microwave signals is recorded and the sought locations are marked in the first signal profile. After the application or deposition of the layer of material, a second run is conducted. A second temporal signal profile of the backscattered signals is recorded. The current position of the vehicle in the sewer or pipeline system relative to the sought locations is determined by comparison with the first signal profile.

Abstract: The present invention relates to a method for retrieving predetermined locations in sewer and pipeline systems (7) after the application or the deposition of a layer of material, in which a carrier vehicle having a microwave sensor (1) is used which emits microwave signals and receives backscattered microwave signals, having the following steps. In the method a first run is conducted inside the sewer respectively the pipeline system (7) is conducted before the application or the deposition of the layer of material, with in at least one section of said sewer respectively pipeline system a first temporal signal profile of said backscattered microwave signals being recorded and the sought locations being marked in the first signal profile.

Abstract: A device is disclosed for measuring the co-ordinates of at least one retrflector applied on an object. The light emitted by a lighting unit reaches the at least one retroreflector through a beam splitter, the light reflected from the retroreflector towards the beam splitter is separated from the path of the lighting beam, and said light falls on a detector unit by means of which the position of incidence of the detected light spot can be determined. The light from the lighting unit forms a beam which lights on the surface of the object a larger surface area than the surface area of the at least one retroreflector applied thereon. The detector unit is located in a place where the position and/or shape of the detected light spot change with the position of the retroreflector.

Abstract: A system for three-dimensional measurement of inaccessible hollow spaces g. sewage canal pipes) by means of a light source and a camera, which are disposed on an inspection head or carrier. A structured light source is used, and the camera and the structured light source have a common entry and exit aperture and have before the aperture at least partially one common optical axis or parallel axes, the distance between which is substantially smaller than the distance between the source point of the pattern and the object-side principle plane of the camera lens.

Abstract: A process for detecting totally or partially hidden faults, such as cracks, and bubbles and the like in an opaque medium, by using microwave radiation. Microwaves from a transmitting antenna are directed against the surface of the medium which is to be inspected, and microwave radiation reflected or back scattered from the medium is detected and analyzed. In order to maximize the signal to noise ratio, minimizing the detection of radiation reflected by the surfaces of the medium itself, at least one of the transmitting antenna and the receiving antenna is oriented at an oblique angle relative to the surface of the medium.

Abstract: A device for measuring the position of a filament bundle as it is withdrawn ertically from a spinnerette, and blown against for cooling, comprising a source of light disposed adjacent the filament bundle in a plane approximately normal to the withdrawing direction, light detector means disposed at an angle .alpha. relative to the source of light, wherein the angle is sufficiently wide that light from the source of light will not impinge directly on the detector means, and analyzer means to calculate the position of the filament bundle on the basis of the signal issuing from the detector means.

Abstract: A device for measuring the positions and the diameters of the filaments in filament bundle comprising a laser scanner disposed adjacent the filament bundle wherein, in the optical path behind the filament bundle to be measured, are disposed an optical means such as a lens of mirror, as well as a filter preferably in the focal plane of said optical means for filtering out the light share not diffracted, as well as a detector and analysis means. The filter is permeable only for limited portions of the diffraction image, and the detector means measures the intensities at several locations of the diffraction image at the same time. In the analysis means the positions of the filaments are determined on the basis of the measured intensity curves while the diameters of the filaments are determined on the basis of the ratios of the measured intensities.