Patents by Inventor Matthias Henrich
Matthias Henrich has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11947097Abstract: A bandpass filter for light has variable lower and upper cut-off wavelengths. The bandpass filter comprises an areal long-pass filter defining the variable lower cut-off wavelength and an areal short-pass filter defining the variable upper cut-off wavelength. The long-pass filter has different lower cut-off wavelengths in different first area regions which follow to one another in a first direction, and the short-pass filter has different upper cut-off wavelengths in different second area regions which follow to one another in a second direction. The long-pass filter and the short-pass filter are connected in series and spatially fixed relative to one another. The first direction and the second direction are oriented crosswise to one another.Type: GrantFiled: April 6, 2021Date of Patent: April 2, 2024Assignee: ABBERIOR INSTRUMENTS GMBHInventors: Joachim Fischer, Matthias Henrich, Andreas Schoenle, Lars Kastrup
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Patent number: 11774740Abstract: An apparatus is provided for monitoring a focal state of a microscope having an object plane and a main imaging area. The apparatus has an auxiliary light source providing an auxiliary light beam and coupling the auxiliary light beam into the microscope in such a way that the coupled auxiliary light beam runs within a plane which is spanned outside of the main imaging area by a straight line running in the object plane and a normal to the object plane, and that the coupled auxiliary light beam is inclined at an angle to a normal to the object plane. A part of the coupled auxiliary light beam reflected by a reference boundary surface in the microscope impinges on a registration device in an area of incidence. The registration device registers position changes of the area of incidence on the registration device.Type: GrantFiled: May 22, 2020Date of Patent: October 3, 2023Assignee: ABBERIOR INSTRUMENTS GMBHInventors: Joachim Fischer, Matthias Henrich, Winfried Willemer
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Publication number: 20230194383Abstract: An auxiliary apparatus for testing the confocality of a scanning and descanning microscope component group has a connector configured for connecting the auxiliary apparatus in a defined relative position to the scanning and descanning microscope component group, and an optical axis running at a fixed orientation with respect to the connector. Further, the auxiliary apparatus has an auxiliary detector with a plurality of auxiliary detection apertures in a plurality of auxiliary detection aperture positions that are arranged at distances in direction of the optical axis and laterally with respect to the optical axis; and an auxiliary light source providing auxiliary light through a plurality of auxiliary emission apertures in a plurality of auxiliary emission aperture positions arranged at distances in direction of the optical axis and laterally with respect to the optical axis.Type: ApplicationFiled: December 21, 2022Publication date: June 22, 2023Inventors: Joachim Fischer, Matthias Henrich
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Publication number: 20230176353Abstract: The invention relates to a detection device (2) for a laser scanning microscope, the detection device (2) having a light inlet (4), at least one filter module (14) and at least one spatially resolving detector (22) and being configured to guide light from the light inlet (4) to the filter module (14) and from there to the spatially resolving detector (22), at least one filter module (14) being designed as a continuous filter module with two continuously tunable filter elements (16), and at least one compensator element (26) being arranged optically downstream of the continuous filter module (14), by means of which a focal position of light on the spatially resolving detector (22) can be adjusted.Type: ApplicationFiled: January 27, 2023Publication date: June 8, 2023Inventors: Haugen MITTELSTÄDT, Jörn HEINE, Matthias REUSS, Matthias HENRICH, Joachim FISCHER
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Publication number: 20230101017Abstract: The present disclosure relates to method, computer programs with instructions, and apparatus for determining positions of two or more spaced-apart molecules in one or more spatial directions in a sample by means of a localization microscope. The present disclosure also relates to localization microscopes using such an apparatus. Light distributions arising due to interference of coherent light are used for determining the positions of the molecules. In the method, a plurality of light distributions are generated (S1) using a first light modulator having a plurality of switchable pixels. The first light modulator is arranged in an image plane of the localization microscope. Each light distribution has a local intensity minimum and regions with an intensity increase adjacent thereto. Each of the two or more molecules is illuminated (S2) with one light distribution. For each of the light distributions, photons emitted by the molecules are detected (S4) for different positionings of the light distribution.Type: ApplicationFiled: November 21, 2022Publication date: March 30, 2023Inventors: Joachim FISCHER, Matthias HENRICH, Winfried WILLEMER
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Patent number: 11493744Abstract: For checking the confocality of a scanning and descanning microscope assembly comprising a light source providing illumination light focused into a focal area in a focal plane, a detector detecting light coming out of the focal area and having a detection aperture to be arranged in a confocal fashion with respect to the focal area, and a scanner, an auxiliary detection aperture of an auxiliary detector arranged in the focal plane is scanned with the focal area of the illumination light to record a first comparison intensity distribution of the illumination light registered by the auxiliary detector, and the detection aperture of the detector is scanned with auxiliary light that exits out of an auxiliary emission aperture of an auxiliary light source concentrically arranged with respect to the auxiliary detection aperture in the focal plane to record a second comparison intensity distribution of the auxiliary light registered by the detector.Type: GrantFiled: December 15, 2021Date of Patent: November 8, 2022Assignee: ABBERIOR INSTRUMENTS GMBHInventors: Joachim Fischer, Matthias Henrich
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Publication number: 20220113524Abstract: For checking the confocality of a scanning and descanning microscope assembly comprising a light source providing illumination light focused into a focal area in a focal plane, a detector detecting light coming out of the focal area and having a detection aperture to be arranged in a confocal fashion with respect to the focal area, and a scanner, an auxiliary detection aperture of an auxiliary detector arranged in the focal plane is scanned with the focal area of the illumination light to record a first comparison intensity distribution of the illumination light registered by the auxiliary detector, and the detection aperture of the detector is scanned with auxiliary light that exits out of an auxiliary emission aperture of an auxiliary light source concentrically arranged with respect to the auxiliary detection aperture in the focal plane to record a second comparison intensity distribution of the auxiliary light registered by the detector.Type: ApplicationFiled: December 15, 2021Publication date: April 14, 2022Inventors: Joachim Fischer, Matthias Henrich
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Publication number: 20210223528Abstract: A bandpass filter for light has variable lower and upper cut-off wavelengths. The bandpass filter comprises an areal long-pass filter defining the variable lower cut-off wavelength and an areal short-pass filter defining the variable upper cut-off wavelength. The long-pass filter has different lower cut-off wavelengths in different first area regions which follow to one another in a first direction, and the short-pass filter has different upper cut-off wavelengths in different second area regions which follow to one another in a second direction. The long-pass filter and the short-pass filter are connected in series and spatially fixed relative to one another. The first direction and the second direction are oriented crosswise to one another.Type: ApplicationFiled: April 6, 2021Publication date: July 22, 2021Inventors: Joachim Fischer, Matthias Henrich, Andreas Schoenle, Lars Kastrup
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Publication number: 20200371339Abstract: An apparatus is provided for monitoring a focal state of a microscope having an object plane and a main imaging area The apparatus has an auxiliary light source providing an auxiliary light beam and coupling the auxiliary light beam into the microscope in such a way that the coupled auxiliary light beam runs within a plane which is spanned outside of the main imaging area by a straight line running in the object plane and a normal to the object plane, and that the coupled auxiliary light beam is inclined at an angle to a normal to the object plane. A part of the coupled auxiliary light beam reflected by a reference boundary surface in the microscope impinges on a registration device in an area of incidence. The registration device registers position changes of the area of incidence on the registration device.Type: ApplicationFiled: May 22, 2020Publication date: November 26, 2020Inventors: Joachim Fischer, Matthias Henrich, Winfried Willemer
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Patent number: 9645376Abstract: A scanner head for high-resolution scanning fluorescence microscopy comprises a first connector to connect the scanner head to a light microscope, second connectors to connect the scanner head to a light source and a fluorescence light detector, a beam shaper to shape a first part of the light from the light source into a first light intensity distribution in the focus of the light microscope comprising an intensity minimum surrounded by intensity maxima and a second part of the light into a second light intensity distribution in the focus of the light microscope comprising an intensity maximum at the location of the intensity minimum of the first light intensity distribution four tilting mirrors configured scan a sample with the light beam, and a deflector to deflect the fluorescence light to the second optical waveguide port.Type: GrantFiled: October 13, 2016Date of Patent: May 9, 2017Assignee: ABBERIOR INSTRUMENTS GMBHInventors: Joachim Fischer, Matthias Henrich, Gerald Donnert, Matthias Reuss
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Publication number: 20170108684Abstract: A scanner head for high-resolution scanning fluorescence microscopy comprises a first connector to connect the scanner head to a light microscope, second connectors to connect the scanner head to a light source and a fluorescence light detector, a beam shaper to shape a first part of the light from the light source into a first light intensity distribution in the focus of the light microscope comprising an intensity minimum surrounded by intensity maxima and a second part of the light into a second light intensity distribution in the focus of the light microscope comprising an intensity maximum at the location of the intensity minimum of the first light intensity distribution four tilting mirrors configured scan a sample with the light beam, and a deflector to deflect the fluorescence light to the second optical waveguide port.Type: ApplicationFiled: October 13, 2016Publication date: April 20, 2017Inventors: Joachim Fischer, Matthias Henrich, Gerald Donnert, Matthias Reuss
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Patent number: 9216231Abstract: The invention relates to a sterilization apparatus (10) and to a method for the sterilization of an object (7) by a gaseous or liquid fluid comprising: a sterilization chamber (8) in which the object (7) is positioned, at least an acceleration device (2) for accelerating the fluid to a predetermined flow-speed, at least a filter device (3) for separating particles from the fluid, characterized in that the sterilization apparatus further comprises at least an orifice device (4) providing a plurality of openings, and a control apparatus for determining the flow-speed of the fluid on the basis of a pressure difference (?p).Type: GrantFiled: October 8, 2010Date of Patent: December 22, 2015Assignee: Sanofi-Aventis Deutschland GmbHInventors: Gerhard Huefner, Matthias Henrich, Michael Willems
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Publication number: 20130071288Abstract: The invention relates to a sterilization apparatus (10) and to a method for the sterilization of an object (7) by a gaseous or liquid fluid comprising: a sterilization chamber (8) in which the object (7) is positioned, at least an acceleration device (2) for accelerating the fluid to a predetermined flow-speed, at least a filter device (3) for separating particles from the fluid, characterized in that the sterilization apparatus further comprises at least an orifice device (4) providing a plurality of openings, and a control apparatus for determining the flow-speed of the fluid on the basis of a pressure difference (?p).Type: ApplicationFiled: October 8, 2010Publication date: March 21, 2013Applicant: SANOFI-AVENTIS DEUTSCHLAND GMBHInventors: Gerhard Huefner, Matthias Henrich, Michael Willems