Abstract: A method for parameterizing a scene having a surface, on which at least two objects are disposed, using a camera disposed at a distance from the objects. The method includes: a) using the camera, producing an image of the scene, the image containing image data regarding the objects; b) recognizing at least two objects in the image by evaluation of the image data and assigning each recognized object to a specific object class; c) estimating an object size of each of the at least two recognized objects in accordance with at least one surface parameter characterizing the surface; d) for each of the at least two objects: calculating an individual probability that the object has the object size estimated in measure c); e) calculating a scene probability from the at least two calculated individual probabilities.

Abstract: A device for real-time analysis of airborne chemical, biological and explosive substances has at least a gas analysis sensor, a fluorescence/luminescence sensor and a sensor for determining the particle size and number of particles. Each of the sensors is connected to a multireflection cell (multipass laser cell) as an open measurement path. In addition, the device also includes an evaluation unit for the real-time analysis of chemical, biological and explosive substances.

Abstract: An integrated circuit product includes first and second transistors positioned in and above first and second active regions. The first transistor has a first gate length and a first gate material stack that includes a first gate dielectric layer having a first thickness and at least one layer of metal positioned above the first gate dielectric layer, the first gate dielectric layer including a layer of a first high-k insulating material and a layer of a second high-k insulating material positioned on the layer of the first high-k insulating material. The second transistor has a second gate length and a second gate material stack that includes a second gate dielectric layer having a second thickness positioned above the second active region and at least one layer of metal positioned above the second gate dielectric layer, the second gate dielectric layer including a layer of the second high-k insulating material.

Abstract: In sophisticated semiconductor devices, electronic fuses may be provided in the metallization system, wherein a superior two-dimensional configuration of the metal line, for instance as a helix-like configuration, may provide superior thermal conditions in a central line portion, which in turn may result in a more pronounced electromigration effect for a given programming current. Consequently, the size of the electronic fuse, at least in one lateral direction, and also the width of corresponding transistors connected to the electronic fuse, may be reduced.

Abstract: When forming semiconductor devices including transistors with different threshold voltages, the different threshold voltages of transistors of the same conductivity type are substantially defined by performing different halo implantations. As the other implantations performed typically in the same manufacturing step, such as pre-amorphization, source and drain extension implantation and extra diffusion engineering implantations, may be identical for different threshold voltages, these implantations, in addition to a common halo base implantation, may be performed for all transistors of the same conductivity type in a common implantation sequence. Higher threshold voltages of specific transistors may be subsequently achieved by an additional low-dose halo implantation while the other transistors are covered by a resist mask. Thus, the amount of atoms of the implant species in the required resist masks is reduced so that removal of the resist masks is facilitated.

Abstract: A method and system for processing ore-containing material is provided. The material is comminuted in at least one first mill. The comminuted material is classified in a first classification into coarse and fine material. At least part of the coarse material of the first classification is returned back to the first mill. The fine material of the first classification is classified in a second classification again into coarse and fine material. The coarse material of the first classification is subjected to a first sorting into a first valuable and a first less valuable fraction. The first valuable fraction is returned to the first mill and the less valuable fraction is discarded.

Abstract: A structure comprises a semiconductor substrate, a semiconductor-on-insulator region and a bulk region. The semiconductor-on-insulator region comprises a first semiconductor region, a dielectric layer provided between the semiconductor substrate and the first semiconductor region, and a first transistor comprising an active region provided in the first semiconductor region. The dielectric layer provides electrical isolation between the first semiconductor region and the semiconductor substrate. The bulk region comprises a second semiconductor region provided directly on the semiconductor substrate.

Abstract: An integrated circuit product includes first and second transistors positioned in and above first and second active regions. The first transistor has a first gate length and a first gate material stack that includes a first gate dielectric layer having a first thickness and at least one layer of metal positioned above the first gate dielectric layer, the first gate dielectric layer including a layer of a first high-k insulating material and a layer of a second high-k insulating material positioned on the layer of the first high-k insulating material. The second transistor has a second gate length and a second gate material stack that includes a second gate dielectric layer having a second thickness positioned above the second active region and at least one layer of metal positioned above the second gate dielectric layer, the second gate dielectric layer including a layer of the second high-k insulating material.

Abstract: A structure comprises a semiconductor substrate, a semiconductor-on-insulator region and a bulk region. The semiconductor-on-insulator region comprises a first semiconductor region, a dielectric layer provided between the semiconductor substrate and the first semiconductor region, and a first transistor comprising an active region provided in the first semiconductor region. The dielectric layer provides electrical isolation between the first semiconductor region and the semiconductor substrate. The bulk region comprises a second semiconductor region provided directly on the semiconductor substrate.

Abstract: Method of forming transistor devices is disclosed that includes forming a first layer of high-k insulating material and a sacrificial protection layer above first and second active regions, removing the first layer of insulating material and the protection layer from above the second active region, removing the protection layer from above the first layer of insulating material positioned above the first active region, forming a second layer of high-k insulating material above the first layer of insulating material and the second active region, forming a layer of metal above the second layer of insulating material, and removing portions of the first and second layers of insulating material and the metal layer to form a first gate stack (comprised of the first and second layers of high-k material and the layer of metal) and a second gate stack (comprised of the second layer of high-k material and the layer of metal).

Abstract: A control system includes a gateway controller and a remote controller. The gateway controller is configured to embed an HTTP request in a CAN bus-compatible message and transmit the CAN bus-compatible message onto a CAN bus. The remote controller is configured to receive the CAN bus-compatible message from the CAN bus, extract the HTTP request from the CAN bus-compatible message, and create an HTTP response to the HTTP request.

Abstract: A structure comprises a semiconductor substrate, a semiconductor-on-insulator region and a bulk region. The semiconductor-on-insulator region comprises a first semiconductor region, a dielectric layer provided between the semiconductor substrate and the first semiconductor region, and a first transistor comprising an active region provided in the first semiconductor region. The dielectric layer provides electrical isolation between the first semiconductor region and the semiconductor substrate. The bulk region comprises a second semiconductor region provided directly on the semiconductor substrate.

Abstract: A method for ionizing, using pulses of ionization radiation, an analyte to be examined by way of ion mobility spectrometry using a pulse sequence is modulated with a known time-variable impression pattern is provided. An ionization device for carrying out the method and an ion mobility spectrometry method and an ion mobility spectrometry device that use the ionization method and/or the ionization device are also provided.

Abstract: A structure comprises a semiconductor substrate, a semiconductor-on-insulator region and a bulk region. The semiconductor-on-insulator region comprises a first semiconductor region, a dielectric layer provided between the semiconductor substrate and the first semiconductor region, and a first transistor comprising an active region provided in the first semiconductor region. The dielectric layer provides electrical isolation between the first semiconductor region and the semiconductor substrate. The bulk region comprises a second semiconductor region provided directly on the semiconductor substrate.

Abstract: A method for performing silicidation of a gate electrode is provided that includes forming both a first transistor with a first gate electrode covered by a cap layer and a semiconductor device on the same semiconductor substrate, forming an organic planarization layer (OPL) on the first transistor and the semiconductor device, back etching the OPL such that an upper surface of the OPL is positioned at a level that is below a level of an upper surface of the cap layer, forming a mask layer covering the semiconductor device without covering the first transistor, removing the cap layer while the back-etched OPL and the mask layer are present, and performing silicidation of the first gate electrode.

Abstract: When forming semiconductor devices including transistors with different threshold voltages, the different threshold voltages of transistors of the same conductivity type are substantially defined by performing different halo implantations. As the other implantations performed typically in the same manufacturing step, such as pre-amorphization, source and drain extension implantation and extra diffusion engineering implantations, may be identical for different threshold voltages, these implantations, in addition to a common halo base implantation, may be performed for all transistors of the same conductivity type in a common implantation sequence. Higher threshold voltages of specific transistors may be subsequently achieved by an additional low-dose halo implantation while the other transistors are covered by a resist mask. Thus, the amount of atoms of the implant species in the required resist masks is reduced so that removal of the resist masks is facilitated.

Abstract: A structure comprises a semiconductor substrate, a semiconductor-on-insulator region and a bulk region. The semiconductor-on-insulator region comprises a first semiconductor region, a dielectric layer provided between the semiconductor substrate and the first semiconductor region, and a first transistor comprising an active region provided in the first semiconductor region. The dielectric layer provides electrical isolation between the first semiconductor region and the semiconductor substrate. The bulk region comprises a second semiconductor region provided directly on the semiconductor substrate.

Abstract: Integrated circuits and methods for fabricating integrated circuits are provided. One method includes recessing a PFET active region to form a recessed PFET surface region. A boron-doped SiGe channel is formed overlying the recessed PFET surface region.

Abstract: A method of fabricating a semiconductor device structure begins by forming a layer of oxide material overlying a first gate structure having a first silicon nitride cap and overlying a second gate structure having a second silicon nitride cap. The first gate structure corresponds to a p-type transistor to be fabricated, and the second gate structure corresponds to an n-type transistor to be fabricated. The method continues by performing a tilted ion implantation procedure to implant ions of an impurity species in a channel region of semiconductor material underlying the first gate structure, during which an ion implantation mask protects the second gate structure. Thereafter, the ion implantation mask and the layer of oxide material are removed, and regions of epitaxial semiconductor material are formed corresponding to source and drain regions for the first gate structure. Thereafter, the first silicon nitride cap and the second silicon nitride cap are removed.

Abstract: Method of forming transistor devices is disclosed that includes forming a first layer of high-k insulating material and a sacrificial protection layer above first and second active regions, removing the first layer of insulating material and the protection layer from above the second active region, removing the protection layer from above the first layer of insulating material positioned above the first active region, forming a second layer of high-k insulating material above the first layer of insulating material and the second active region, forming a layer of metal above the second layer of insulating material, and removing portions of the first and second layers of insulating material and the metal layer to form a first gate stack (comprised of the first and second layers of high-k material and the layer of metal) and a second gate stack (comprised of the second layer of high-k material and the layer of metal).