Patents by Inventor Matthias Langhorst
Matthias Langhorst has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 11735404Abstract: The invention relates to a method, a device and a system for the treatment of biological frozen samples using plasma focused ion beams (FIB). The samples can then be used for mass spectrometry (MS), genomics, such as gene sequencing analysis or next generation sequencing (NGS) analysis, and proteomics. The present invention particularly relates to a method of treatment of at least one biological sample. This method is particularly used for high performance microscopy, proteomics analytics, sequencing, such as NGS etc. According to the present invention the method comprises the steps of providing at least one biological sample in frozen form. The milling treats at least one part of the sample by a plasma ion beam comprising at least one of an O+ and/or a Xe+ plasma.Type: GrantFiled: September 10, 2020Date of Patent: August 22, 2023Assignee: FEI CompanyInventors: Alex De Marco, Sergey Gorelick, Chad Rue, Joseph Christian, Kenny Mani, Steven Randolph, Matthias Langhorst
-
Patent number: 10976534Abstract: The invention relates to a method for recording images with a light microscope, wherein a specimen container with a specimen is arranged on a specimen holder of the light microscope, and wherein illuminating light is guided onto the specimen. The illuminating light can hereby be cut in a cross-section transversely to an optical axis of the light microscope through a wall of the specimen container to a limited cross-sectional region. First and second diaphragm settings are determined and set, for the limited cross-sectional region of the illuminating light defined by the wall of the specimen container, in which the diaphragm covers equal sized portions of the limited cross-sectional region. In addition the invention relates to a light microscope which is adapted in particular to carry out the method.Type: GrantFiled: October 20, 2017Date of Patent: April 13, 2021Assignee: CARL ZEISS MICROSCOPY GMBHInventors: Ralf Steinmeyer, Peter Schoen, Matthias Langhorst, Cornelia Bendlin
-
Publication number: 20210066056Abstract: The invention relates to a method, a device and a system for the treatment of biological frozen samples using plasma focused ion beams (FIB). The samples can then be used for mass spectrometry (MS), genomics, such as gene sequencing analysis or next generation sequencing (NGS) analysis, and proteomics. The present invention particularly relates to a method of treatment of at least one biological sample. This method is particularly used for high performance microscopy, proteomics analytics, sequencing, such as NGS etc. According to the present invention the method comprises the steps of providing at least one biological sample in frozen form. The milling treats at least one part of the sample by a plasma ion beam comprising at least one of an O+ and/or a Xe+ plasma.Type: ApplicationFiled: September 10, 2020Publication date: March 4, 2021Inventors: Alex DE MARCO, Sergey GORELICK, Chad RUE, Joseph CHRISTIAN, Kenny MANI, Steven RANDOLPH, Matthias LANGHORST
-
Publication number: 20190206664Abstract: The invention relates to a method, a device and a system for the treatment of biological frozen samples using plasma focused ion beams (FIB). The samples can then be used for mass spectrometry (MS), genomics, such as gene sequencing analysis or next generation sequencing (NGS) analysis, and proteomics. The present invention particularly relates to a method of treatment of at least one biological sample. This method is particularly used for high performance microscopy, proteomics analytics, sequencing, such as NGS etc. According to the present invention the method comprises the steps of providing at least one biological sample in frozen form. The milling treats at least one part of the sample by a plasma ion beam comprising at least one of an O+ and/or a Xe+ plasma.Type: ApplicationFiled: December 19, 2018Publication date: July 4, 2019Inventors: Alex DE MARCO, Sergey GORELICK, Chad RUE, Joseph CHRISTIAN, Kenny MANI, Steven RANDOLPH, Matthias LANGHORST
-
Patent number: 10261300Abstract: The invention relates to a light microscope comprising a polychromatic light source for emitting illumination light in the direction of a sample, focussing means for focussing illumination light onto the sample, wherein the focussing means, for generating a depth resolution, have a longitudinal chromatic aberration, and a detection device, which comprises a two-dimensional array of detector elements, for detecting sample light coming from the sample. According to the invention, the light microscope is characterized in that, for detecting both confocal portions and non-confocal portions of the sample light, a beam path from the sample to the detection device is free of elements for completely masking out non-confocal portions. In addition, the invention relates to a method for image recording using a light microscope.Type: GrantFiled: May 16, 2013Date of Patent: April 16, 2019Assignee: Carl Zeiss Microscopy GmbHInventors: Helmut Lippert, Ralf Netz, Tiemo Anhut, Nils Langholz, Matthias Langhorst
-
Patent number: 10078037Abstract: Described is a system and method for detecting whether a biological event has occurred in a cellular sample, and then activating a fluidics system to fix the cell at the point in time with the event occurred. In one example, a sample preparation system includes a camera linked to a confocal microscope that is interrogating a cellular sample. Once a detectable event, such as a binding event, has occurred, the sample preparation system releases a fixative to fix the cell at the point in time when the event was detected.Type: GrantFiled: November 20, 2013Date of Patent: September 18, 2018Assignee: FEI CompanyInventors: Frank Lison, Jens Greiser, Matthias Langhorst
-
Publication number: 20180039058Abstract: The invention relates to a method for recording images with a light microscope, wherein a specimen container with a specimen is arranged on a specimen holder of the light microscope, and wherein illuminating light is guided onto the specimen. The illuminating light can hereby be cut in a cross-section transversely to an optical axis of the light microscope through a wall of the specimen container to a limited cross-sectional region. First and second diaphragm settings are determined and set, for the limited cross-sectional region of the illuminating light defined by the wall of the specimen container, in which the diaphragm covers equal sized portions of the limited cross-sectional region. In addition the invention relates to a light microscope which is adapted in particular to carry out the method.Type: ApplicationFiled: October 20, 2017Publication date: February 8, 2018Inventors: Ralf Steinmeyer, Peter Schoen, Matthias Langhorst, Cornelia Bendlin
-
Patent number: 9478393Abstract: A method of imaging a specimen comprises directing a beam to irradiate a specimen; detecting radiation emanating from the specimen; scanning the beam along a path; for each sample point in said path, recording a measurement set M={(Dn, Pn)}, where Dn is the detector output as a function of value Pn of measurement parameter P; deconvolving M and spatially resolving it into a set representing depth-resolved imagery of the specimen, whereby, at point pi within the specimen, in a first probing session, irradiating, in a first beam configuration, pi with Point Spread Function F1, whereby said beam configuration is different to P; in at least a second probing session, irradiating, in a second beam configuration, pi with Point Spread Function F2 which overlaps partially with F1 in a zone Oi in which pi is located; sing an Independent Component Analysis algorithm to perform spatial resolution in Oi.Type: GrantFiled: June 26, 2015Date of Patent: October 25, 2016Assignee: FEI COMPANYInventors: Pavel Potocek, Faysal Boughorbel, Berend Helmerus Lich, Matthias Langhorst
-
Patent number: 9304307Abstract: A light scanning microscope with an illumination module generates several illumination beams and moves them, in each case as a spot, in a predefined region of a sample to excite sample radiation. A detector module for confocal detection of the sample radiation excited by each spot includes a first detector, an imaging lens system, having an optical axis, for imaging the predefined region along an imaging beam path running from the sample as far as the first detector, and a rotatable diaphragm with several pinholes located in a pinhole plane. The diaphragm, upon rotation, may be located at least partially in the imaging beam path for confocal detection. A second detector may be arranged outside of the imaging beam path. A first beam splitter may be arranged in the imaging beam path between the sample and the diaphragm. The beam splitter deflects sample radiation onto the second detector.Type: GrantFiled: May 24, 2013Date of Patent: April 5, 2016Assignee: Carl Zeiss Microscopy GmbHInventors: Wibke Hellmich, Gerhard Krampert, Matthias Langhorst, Ralf Netz
-
Publication number: 20160013015Abstract: A method of accumulating an image of a specimen using a scanning-type microscope, comprising the following steps: Directing a beam of radiation from a source through an illuminator so as to irradiate a surface S of the specimen; Using a detector to detect a flux of radiation emanating from the specimen in response to said irradiation; Causing said beam to follow a scan path relative to said surface; For each of a set of sample points in said scan path, recording an output Dn of the detector as a function of a value Pn of a selected measurement parameter P, thus compiling a measurement set M={(Dn, Pn)}, where n is a member of an integer sequence; Using computer processing apparatus to automatically deconvolve the measurement set M and spatially resolve it so as to produce reconstructed imagery of the specimen, wherein, considered at a given point pi within the specimen, the method comprises the following steps: In a first probing session, employing a first beam configuration B1 to irradiate the point pi wType: ApplicationFiled: June 26, 2015Publication date: January 14, 2016Applicant: FEI CompanyInventors: Pavel Potocek, Faysal Boughorbel, Berend Helmerus Lich, Matthias Langhorst
-
Publication number: 20150054937Abstract: The invention relates to a light microscope comprising a polychromatic light source for emitting illumination light in the direction of a sample, focussing means for focussing illumination light onto the sample, wherein the focussing means, for generating a depth resolution, have a longitudinal chromatic aberration, and a detection device, which comprises a two-dimensional array of detector elements, for detecting sample light coming from the sample. According to the invention, the light microscope is characterized in that, for detecting both confocal portions and non-confocal portions of the sample light, a beam path from the sample to the detection device is free of elements for completely masking out non-confocal portions. In addition, the invention relates to a method for image recording using a light microscope.Type: ApplicationFiled: May 16, 2013Publication date: February 26, 2015Applicant: Carl Zeiss Microscopy GmbHInventors: Helmut Lippert, Ralf Netz, Tiemo Anhut, Nils Langholz, Matthias Langhorst
-
Publication number: 20140147832Abstract: Described is a system and method for detecting whether a biological event has occurred in a cellular sample, and then activating a fluidics system to fix the cell at the point in time with the event occurred. In one example, a sample preparation system includes a camera linked to a confocal microscope that is interrogating a cellular sample. Once a detectable event, such as a binding event, has occurred, the sample preparation system releases a fixative to fix the cell at the point in time when the event was detected.Type: ApplicationFiled: November 20, 2013Publication date: May 29, 2014Applicant: FEI COMPANYInventors: Frank Lison, Jens Greiser, Matthias Langhorst
-
Publication number: 20130314758Abstract: A light scanning microscope with an illumination module generates several illumination beams and moves them, in each case as a spot, in a predefined region of a sample to excite sample radiation. A detector module for confocal detection of the sample radiation excited by each spot includes a first detector, an imaging lens system, having an optical axis, for imaging the predefined region along an imaging beam path running from the sample as far as the first detector, and a rotatable diaphragm with several pinholes located in a pinhole plane. The diaphragm, upon rotation, may be located at least partially in the imaging beam path for confocal detection. A second detector may be arranged outside of the imaging beam path. A first beam splitter may be arranged in the imaging beam path between the sample and the diaphragm. The beam splitter deflects sample radiation onto the second detector.Type: ApplicationFiled: May 24, 2013Publication date: November 28, 2013Inventors: Wibke Hellmich, Gerhard Krampert, Matthias Langhorst, Ralf Netz
-
Publication number: 20130258090Abstract: The invention relates to a method for recording images with a light microscope, wherein a specimen container with a specimen is arranged on a specimen holder of the light microscope, and wherein illuminating light is guided onto the specimen. The illuminating light can hereby be cut in a cross-section transversely to an optical axis of the light microscope through a wall of the specimen container to a limited cross-sectional region. First and second diaphragm settings are determined and set, for the limited cross-sectional region of the illuminating light defined by the wall of the specimen container, in which the diaphragm covers equal sized portions of the limited cross-sectional region. In addition the invention relates to a light microscope which is adapted in particular to carry out the method.Type: ApplicationFiled: March 26, 2013Publication date: October 3, 2013Applicant: Carl Zeiss Microscopy GmbHInventors: Ralf Steinmeyer, Peter Schoen, Matthias Langhorst, Cornelia Bendlin