Patents by Inventor Matthias Patzwald

Matthias Patzwald has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and arrangement for contactless determination of geometric and optical characteristics
    Patent number: 7012698
    Abstract: A method is disclosed for contactless determination of product characteristics, particularly in continuous or discontinuous fabrication of layer systems formed of a plurality of layers with different optical characteristics. The measuring apparatus and measurement methods for determining the characteristics of one of the respective layers are predetermined depending on the optical characteristics of this layer and depending on the optical characteristics of layers situated above it in the measuring direction. In a measuring device for this purpose, a plurality of detectors are provided for wavelength regions directly adjoining one another. The detectors and the signal processing device are constructed such that the light coming from the measurement surface with wavelengths of 200 nm to more than 2400 nm is evaluated in its entirety.
    Type: Grant
    Filed: May 14, 2002
    Date of Patent: March 14, 2006
    Assignee: Carl Zeiss Jena GmbH
    Inventors: Matthias Patzwald, Rudolf Kessler, Waltraud Kessler, Angela Schindler
  • Method and arrangement for contactless determination of product characteristics
    Publication number: 20020191192
    Abstract: The invention is directed to a method for contactless determination of product characteristics, particularly in continuous or discontinuous fabrication of layer systems formed of a plurality of layers with different optical characteristics.
    Type: Application
    Filed: May 14, 2002
    Publication date: December 19, 2002
    Inventors: Matthias Patzwald, Rudolf Kessler, Waltraud Kessler, Angela Schindler