Patents by Inventor Matthias Ruther

Matthias Ruther has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Estimation of defocused reflectance maps for the robust determination of “shape from focus” in microscopic images
    Patent number: 9161014
    Abstract: Method for compensating illumination deficiencies in microscopic “shape from focus (SFF)”, wherein firstly the reflectance of the scene is estimated by way of a projector-camera system and then microscopic “shape from focus (SFF)” is applied to a stack of reflectance maps rather than to the original image data.
    Type: Grant
    Filed: July 26, 2011
    Date of Patent: October 13, 2015
    Assignees: Alicona Imaging GmbH, Technische Universität Graz
    Inventors: Manfred Prantl, Stefan Scherer, Martin Lenz, Matthias Ruther, Horst Bischof
  • ESTIMATION OF DEFOCUSED REFLECTANCE MAPS FOR THE ROBUST DETERMINATION OF "SHAPE FROM FOCUS" IN MICROSCOPIC IMAGES
    Publication number: 20130113896
    Abstract: Method for compensating illumination deficiencies in microscopic “shape from focus (SFF)”, wherein firstly the reflectance of the scene is estimated by way of a projector-camera system and then microscopic “shape from focus (SFF)” is applied to a stack of reflectance maps rather than to the original image data.
    Type: Application
    Filed: July 26, 2011
    Publication date: May 9, 2013
    Applicants: TECHNISCHE UNIVERSITAT GRAZ, ALICONA IMAGING GMBH
    Inventors: Manfred Prantl, Stefan Scherer, Martin Lenz, Matthias Ruther, Horst Bischof