Patents by Inventor Matthias Scheller Lichtenauer

Matthias Scheller Lichtenauer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10724901
    Abstract: A colour measurement device includes a measurement array (MA) which includes: a plurality of illumination arrays (20, 30, 40) for exposing a measurement spot (MS) on a measurement object (MO) to illumination light in an actual illumination direction (2, 3, 4) in each case, and a pick-up array (50) for detecting the measurement light reflected by the measurement spot (MS) in an actual observation direction (5) and for converting it into preferably spectral reflection factors; and a controller for the illumination arrays and the pick-up array and for processing the electrical signals produced by the pick-up array. The controller is embodied to process the measured reflection factors on the basis of a correction model, such that distortions in the measurement values as compared to nominal illumination and/or observation directions, caused by angular errors in the illumination arrays and/or the pick-up array, are corrected.
    Type: Grant
    Filed: March 4, 2019
    Date of Patent: July 28, 2020
    Assignee: X-Rite Europe GmbH
    Inventors: Peter Ehbets, Matthias Scheller Lichtenauer
  • Publication number: 20190265102
    Abstract: A colour measurement device includes a measurement array (MA) which includes: a plurality of illumination arrays (20, 30, 40) for exposing a measurement spot (MS) on a measurement object (MO) to illumination light in an actual illumination direction (2, 3, 4) in each case, and a pick-up array (50) for detecting the measurement light reflected by the measurement spot (MS) in an actual observation direction (5) and for converting it into preferably spectral reflection factors; and a controller for the illumination arrays and the pick-up array and for processing the electrical signals produced by the pick-up array. The controller is embodied to process the measured reflection factors on the basis of a correction model, such that distortions in the measurement values as compared to nominal illumination and/or observation directions, caused by angular errors in the illumination arrays and/or the pick-up array, are corrected.
    Type: Application
    Filed: March 4, 2019
    Publication date: August 29, 2019
    Inventors: Peter Ehbets, Matthias Scheller Lichtenauer
  • Patent number: 10260943
    Abstract: A color measurement device includes a measurement array (MA) which includes: a plurality of illumination arrays (20, 30, 40) for exposing a measurement spot (MS) on a measurement object (MO) to illumination light in an actual illumination direction (2, 3, 4) in each case, and a pick-up array (50) for detecting the measurement light reflected by the measurement spot (MS) in an actual observation direction (5) and for converting it into preferably spectral reflection factors; and a controller for the illumination arrays and the pick-up array and for processing the electrical signals produced by the pick-up array. The controller is embodied to process the measured reflection factors on the basis of a correction model, such that distortions in the measurement values as compared to nominal illumination and/or observation directions, caused by angular errors in the illumination arrays and/or the pick-up array, are corrected.
    Type: Grant
    Filed: April 8, 2016
    Date of Patent: April 16, 2019
    Assignee: X-Rite Switzerland GmbH
    Inventors: Peter Ehbets, Matthias Scheller Lichtenauer
  • Publication number: 20160327431
    Abstract: A colour measurement device includes a measurement array (MA) which includes: a plurality of illumination arrays (20, 30, 40) for exposing a measurement spot (MS) on a measurement object (MO) to illumination light in an actual illumination direction (2, 3, 4) in each case, and a pick-up array (50) for detecting the measurement light reflected by the measurement spot (MS) in an actual observation direction (5) and for converting it into preferably spectral reflection factors; and a controller for the illumination arrays and the pick-up array and for processing the electrical signals produced by the pick-up array. The controller is embodied to process the measured reflection factors on the basis of a correction model, such that distortions in the measurement values as compared to nominal illumination and/or observation directions, caused by angular errors in the illumination arrays and/or the pick-up array, are corrected.
    Type: Application
    Filed: April 8, 2016
    Publication date: November 10, 2016
    Applicant: X-Rite Switzerland GmbH
    Inventors: Peter Ehbets, Matthias Scheller Lichtenauer