Patents by Inventor Matthias Schussler

Matthias Schussler has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220187120
    Abstract: A method for interferometric vibration measurement at a plurality of measurement points using a measuring laser beam, including A. generating the measuring laser beam having a wavelength in the infrared wavelength range and a pilot laser beam having a wavelength in the visible wavelength range; B. deflecting the measuring laser beam and the pilot, laser beam by a common optical deflection unit, and controlling the deflection unit such that the pilot laser beam is incident on the measurement point; and C. carrying out a vibration measurement using the measuring laser beam. An angular deviation between the pilot laser beam and the measuring laser beam is determined and, in a correction step B 1, between method step B and C, the deflection unit is actuated in order to compensate for the angular deviation between the pilot laser beam and the measuring laser beam.
    Type: Application
    Filed: March 9, 2020
    Publication date: June 16, 2022
    Applicant: Polytec GmbH
    Inventor: Matthias SCHÜSSLER
  • Patent number: 11333485
    Abstract: An alignment method for a beam-directing unit of an interferometric measuring device for directing a laser beam of a laser beam source towards a plurality of measurement points of an object under measurement, wherein a three-dimensional model of a measurement surface of an object under measurement is created by a plurality of spatially resolved images. A measuring device for carrying out an interferometric measurement by laser radiation is also provided, having a controller which is designed to align a beam-directing unit of the measurement device.
    Type: Grant
    Filed: June 5, 2019
    Date of Patent: May 17, 2022
    Assignee: Polytec GmbH
    Inventors: Bernd Armbruster, Matthias Schussler, Bernd Heinen
  • Publication number: 20210278271
    Abstract: A method for determining the path of a measurement beam of an interferometric measuring device including the method steps: A. recording a plurality of spatially resolved images of the object under measurement; B. creating a three-dimensional model of the object under measurement; C. providing a measurement-head model; D. creating an association between coordinates in the three-dimensional model of the object under measurement and coordinates in the measurement-head model; E. determining the measurement beam path. A measuring device for interferometric measurement of an object under measurement is also provided.
    Type: Application
    Filed: June 5, 2019
    Publication date: September 9, 2021
    Applicant: Polytec GmbH
    Inventors: Bernd ARMBRUSTER, Matthias SCHUSSLER, Bernd HEINEN
  • Publication number: 20210278197
    Abstract: The invention relates to an alignment method for a beam-directing unit of an interferometric measuring device for directing a laser beam of a laser beam source towards a plurality of measurement points of an object under measurement, wherein a three-dimensional model of a measurement surface of an object under measurement is created by a plurality of spatially resolved images. The invention also relates to a measuring device for carrying out an interferometric measurement by laser radiation, having a controller which is designed to align a beam-directing unit of the measurement device.
    Type: Application
    Filed: June 5, 2019
    Publication date: September 9, 2021
    Applicant: Polytec GmbH
    Inventors: Bernd ARMBRUSTER, Matthias SCHUSSLER, Bernd HEINEN
  • Publication number: 20210255030
    Abstract: A method for determining the path of a measurement beam of an interferometric measuring device, includes A. recording a plurality of spatially resolved images of the object under measurement; B. creating a three-dimensional model of the object under measurement; C. providing a beam-position image-recording unit and recording at least one spatially resolved beam-position-determining image; D. determining the spatial position and orientation of the beam-position image-recording unit relative to the object under measurement; E. providing a spatial relation between the spatial path of the measurement beam of the interferometric measuring device and the position and orientation of the beam-position image-recording unit; F. determining the spatial path of the measurement beam of the interferometric measuring device relative to the object under measurement. A measuring device for interferometric measurement of an object under measurement is also provided.
    Type: Application
    Filed: June 5, 2019
    Publication date: August 19, 2021
    Applicant: Polytec GmbH
    Inventors: Bernd ARMBRUSTER, Matthias SCHUSSLER, Bernd HEINEN
  • Patent number: 10018460
    Abstract: A device for the interferometric measuring of an object, including a light source to generate an emitted beam, a beam splitting device for splitting the emitted beam into a measuring beam and at least first and second reference beams, an optic interference device, and first and second detectors, with the interference device and the first detector being embodied cooperating such that the measuring beam, at least partially reflected by the object, and the first reference beam are interfered on at least one detector area of the first detector. The interference device and the second detector are embodied cooperating such that the measuring beam, at least partially scattered by the object, and the second reference beam are interfered on at least one detector area of the second detector. A method is also provided for the interferometric measuring of an object.
    Type: Grant
    Filed: November 2, 2012
    Date of Patent: July 10, 2018
    Assignee: Polytec GmbH
    Inventors: Matthias Schussler, Christian Rembe, Alexander Drabenstedt, Robert Kowarsch, Wanja Ochs
  • Patent number: 9910056
    Abstract: A device for the interferometric measuring of an object, including a source to generate a source beam, a beam splitting device to split the source beam into a measuring beam and a reference beam, an optic interference device and a first detector, which cooperate such that the measuring beam reflected by the object at least partially is at least partially interfered as the receiver beam and the reference beam on a detector area of the first detector. The beam splitting device splits the source beam into a measuring beam, a first partial reference beam, and at least one second partial reference beam. There is at least one second detector embodied such that the first receiver beam is interfered with the first partial reference beam on a detection area of the first detector and the second partial receiver beam with a second partial reference beam on a detection area of the second detector, each with the formation of an optic interference.
    Type: Grant
    Filed: January 23, 2017
    Date of Patent: March 6, 2018
    Assignee: Polytec GmbH
    Inventors: Matthias Schussler, Christian Rembe, Alexander Drabenstedt, Sebastian Boedecker, Thian-Hua Xu
  • Patent number: 9851243
    Abstract: A device for the optical non-contact vibration measurement of an vibrating object, including a laser Doppler vibrometer that has a laser as the light source for a laser beam, a first beam splitter assembly for splitting the laser beam into a measuring beam and a reference beam, a means for shifting the frequency of the reference beam or of the measuring beam in a defined manner, a second beam splitter assembly by which the measuring beam back-scattered by the oscillating object is merged with the reference beam and superimposed on the same, and a detector for receiving the superimposed measuring and reference beam and for generating a measurement signal. The laser is provided with a polarization filter arranged inside the optical resonator of the laser and the laser is frequency stabilized by regulating to a beat signal of the laser.
    Type: Grant
    Filed: March 16, 2012
    Date of Patent: December 26, 2017
    Assignee: POLYTEC GMBH
    Inventors: Christian Rembe, Alexander Drabenstedt, Matthias Schussler, Christian Ehrmann, Volkmar Roth
  • Publication number: 20170199214
    Abstract: A device for the interferometric measuring of an object, including a source to generate a source beam, a beam splitting device to split the source beam into a measuring beam and a reference beam, an optic interference device and a first detector, which cooperate such that the measuring beam reflected by the object at least partially is at least partially interfered as the receiver beam and the reference beam on a detector area of the first detector. The beam splitting device splits the source beam into a measuring beam, a first partial reference beam, and at least one second partial reference beam. There is at least one second detector embodied such that the first receiver beam is interfered with the first partial reference beam on a detection area of the first detector and the second partial receiver beam with a second partial reference beam on a detection area of the second detector, each with the formation of an optic interference.
    Type: Application
    Filed: January 23, 2017
    Publication date: July 13, 2017
    Applicant: Polytec GmbH
    Inventors: Matthias Schussler, Christian Rembe, Alexander Drabenstedt, Sebastian Boedecker, Thian-Hua Xu
  • Patent number: 9551726
    Abstract: A device for the interferometric measuring of an object, including a source to generate a source beam, a beam splitting device to split the source beam into a measuring beam and a reference beam, an optic interference device and a first detector, which cooperate such that the measuring beam reflected by the object at least partially is at least partially interfered as the receiver beam and the reference beam on a detector area of the first detector. The beam splitting device splits the source beam into a measuring beam, a first partial reference beam, and at least one second partial reference beam. There is at least one second detector embodied such that the first receiver beam is interfered with the first partial reference beam on a detection area of the first detector and the second partial receiver beam with a second partial reference beam on a detection area of the second detector, each with the formation of an optic interference.
    Type: Grant
    Filed: July 1, 2013
    Date of Patent: January 24, 2017
    Assignee: Polytec GmbH
    Inventors: Matthias Schussler, Christian Rembe, Alexander Drabenstedt, Sebastian Boedecker, Thian-Hua Xu
  • Publication number: 20140041456
    Abstract: A device for the optical non-contact vibration measurement of an vibrating object, including a laser Doppler vibrometer that has a laser (1) as the light source for a laser beam, a first beam splitter assembly (S1) for splitting the laser beam into a measuring beam (2) and a reference beam (3), a means (4) for shifting the frequency of the reference beam (3) or of the measuring beam (2) in a defined manner, a second beam splitter assembly (S2, S3) by which the measuring beam (2) back-scattered by the oscillating object (6) is merged with the reference beam (3) and superimposed on the same, and a detector (5) for receiving the superimposed measuring and reference beam (7) and for generating a measurement signal. The laser (1) is provided with a polarization filter arranged inside the optical resonator of the laser and the laser (1) is frequency stabilized by regulating to a beat signal of the laser.
    Type: Application
    Filed: March 16, 2012
    Publication date: February 13, 2014
    Applicant: POLYTEC GMBH
    Inventors: Christian Rembe, Alexander Dräbenstedt, Matthias Schüssler, Christian Ehrmann, Volkmar Roth
  • Publication number: 20040166471
    Abstract: For non-contact and non-destructive measurement of surfaces of cast models of a tooth in restorative dentistry, a coherent-radar device, whose measurement direction is brought generally into alignment with the insertion or placement direction for the dental restoration is used, with the help of a real-time video image, which is recorded either in the insertion or placement direction. The sample holder is a commercially available magnetic tilting table. A light source can be used, which has a narrow bandwidth of about 3-40 nanometers.
    Type: Application
    Filed: February 20, 2004
    Publication date: August 26, 2004
    Applicant: Polytec GmbH
    Inventors: Matthias Schussler, Paul Weigl
  • Patent number: 6386042
    Abstract: A method and an apparatus are provided for contact-free optical displacement and/or vibration measurement of an object, in which the actual positions of the plurality of measurement points are selected and recorded. The display positions of the plurality of measurement points are displayed in the output unit based on a stored or video image of the object. Errors in congruency between the actual positions of the plurality of measurement points and the display positions of the plurality of measurement points are corrected.
    Type: Grant
    Filed: March 9, 2001
    Date of Patent: May 14, 2002
    Assignee: Polytec GmbH
    Inventors: Michael Wörtge, Matthias Schüssler
  • Publication number: 20010009111
    Abstract: A method and an apparatus are provided for contact-free optical displacement and/or vibration measurement of an object, in which the object to be measured is scanned in the form of a grid. The position of the measurement points and the contour of the grid are freely selectable. Individual measurement point subquantities, to be analyzed respectively in correlation with one another, can be classified in different categories and analyzed as a function of the category to which they are assigned.
    Type: Application
    Filed: March 9, 2001
    Publication date: July 26, 2001
    Applicant: Polytec GmbH
    Inventors: Michael Wortge, Matthias Schussler
  • Patent number: 6209396
    Abstract: A method and an apparatus are provided for contact-free optical displacement and/or vibration measurement of an object, in which the object to be measured is scanned in the form of a grid. The position of the measurement points and the contour of the grid are freely selectable. Individual measurement point subquantities, to be analyzed respectively in correlation with one another, can be classified in different categories and analyzed as a function of the category to which they are assigned.
    Type: Grant
    Filed: February 16, 1999
    Date of Patent: April 3, 2001
    Assignee: Polytec GmbH
    Inventors: Michael Wörtge, Matthias Schüssler