Patents by Inventor Matthias von Davier

Matthias von Davier has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10706188
    Abstract: Systems and methods are provided for implementing a parallel Expectation Minimization algorithm for generalized latent variable models. Item response data that is based on responses to items from multiple respondents is accessed. The item response data includes data for multiple response variables. The item response data is analyzed using a generalized latent variable model, and the analysis includes an application of a Parallel-E Parallel-M (PEPM) algorithm. In a parallel Expectation step of the PEPM algorithm, the respondents are subdivided into N groups of respondents, and computations for the N groups are performed in parallel using the N processor cores. In a parallel Maximization step of the PEPM algorithm, the response variables are subdivided into N groups of response variables, and computations for the N groups of response variables are performed in parallel using the N processor cores.
    Type: Grant
    Filed: November 10, 2016
    Date of Patent: July 7, 2020
    Assignee: Educational Testing Service
    Inventor: Matthias von Davier
  • Patent number: 9471667
    Abstract: Systems and methods are provided for scoring a response to a character-by-character highlighting task. A similarity value for the response is calculated by comparing the response to one or more correct responses to the task to determine the similarity or dissimilarity of the response to the one or more correct responses to the task. A threshold similarity value is calculated for the task, where the threshold similarity value is indicative of an amount of similarity or dissimilarity to the one or more correct responses required for the response to be scored at a certain level. The similarity value for the response is compared to the threshold similarity value. A score is assigned at, above, or below the certain level based on the comparison.
    Type: Grant
    Filed: March 22, 2013
    Date of Patent: October 18, 2016
    Assignee: Educational Testing Service
    Inventors: Kentaro Yamamoto, Jana Sukkarieh, Matthias Von Davier
  • Patent number: 8639176
    Abstract: Disclosed herein is a method of analyzing examinee item response data comprising constructing a diagnosis model for reporting skill profiles of examinees, wherein the diagnosis model comprises at least a variable representing unobserved subpopulations, creating an item design matrix, distributing examinees across the unobserved subpopulations, iteratively estimating values for a plurality of variables within the diagnosis model, and reporting the estimated values to a user.
    Type: Grant
    Filed: September 7, 2007
    Date of Patent: January 28, 2014
    Assignee: Educational Testing System
    Inventors: Matthias Von Davier, Kentaro Yamamoto, Xueli Xu
  • Publication number: 20130254216
    Abstract: Systems and methods are provided for scoring a response to a character-by-character highlighting task. A similarity value for the response is calculated by comparing the response to one or more correct responses to the task to determine the similarity or dissimilarity of the response to the one or more correct responses to the task. A threshold similarity value is calculated for the task, where the threshold similarity value is indicative of an amount of similarity or dissimilarity to the one or more correct responses required for the response to be scored at a certain level. The similarity value for the response is compared to the threshold similarity value. A score is assigned at, above, or below the certain level based on the comparison.
    Type: Application
    Filed: March 22, 2013
    Publication date: September 26, 2013
    Applicant: Educational Testing Service
    Inventors: Kentaro Yamamoto, Jana Sukkarieh, Matthias Von Davier
  • Patent number: 8005712
    Abstract: Disclosed herein is a method of analyzing large scale survey results comprising obtaining a sparse data set representing a subset of an original data set comprising a plurality of individuals' responses to a plurality of questions, wherein the sparse data set comprises less than ninety percent of the responses in the original data set; analyzing the sparse data set using a general diagnostic model; and obtaining estimated person parameters using the general diagnostic model.
    Type: Grant
    Filed: April 6, 2007
    Date of Patent: August 23, 2011
    Assignee: Educational Testing Service
    Inventors: Matthias von Davier, Xueli Xu, Kentaro Yamamoto
  • Publication number: 20080076108
    Abstract: Disclosed herein is a method of analyzing examinee item response data comprising constructing a diagnosis model for reporting skill profiles of examinees, wherein the diagnosis model comprises at least a variable representing unobserved subpopulations, creating an item design matrix, distributing examinees across the unobserved subpopulations, iteratively estimating values for a plurality of variables within the diagnosis model, and reporting the estimated values to a user.
    Type: Application
    Filed: September 7, 2007
    Publication date: March 27, 2008
    Applicant: Educational Testing Service
    Inventors: Matthias Von Davier, Kentaro Yamamoto, Xueli Xu