Abstract: The present invention relates to a method for determining the extension of a trajectory in a space-time volume of measure images. The space-time volume of measure images is generated by a measuring method utilizing a measuring system comprising a first light source and a sensor. The measuring method comprises a step of, in a predetermined operating condition of the measuring system, moving a measure object along a first direction of movement in relation to the measuring system while the first light source illuminates the measure object whereby the sensor generates a measure image of the measure object at each time instant in a set of at least two subsequent time instants, thus generating said space-time volume of measure images wherein a feature point of the measure object maps to a trajectory in the space-time volume.

Abstract: The present invention relates to a method and an apparatus for determining the amount of light scattered in an object in a machine vision system comprising: a light source illuminating said object with incident light having a limited extension in at least one direction; and, an imaging sensor detecting light emanating from said object, wherein said emanated light is reflected light (R) on the surface of said object and light scattered (S) in said object, said detected light is resulting in at least one intensity distribution curve on said imaging sensor having a peak where said reflected light (R) is detected on said imaging sensor. A width (w) of said at least one intensity distribution curve around said peak is measured, whereby said measured width (w) indicates the amount of light scattered (S) in said object.

Abstract: The present invention relates to a method for determining the extension of a trajectory in a space-time volume of measure images. The space-time volume of measure images is generated by a measuring method utilizing a measuring system comprising a first light source and a sensor. The measuring method comprises a step of, in a predetermined operating condition of the measuring system, moving a measure object along a first direction of movement in relation to the measuring system while the first light source illuminates the measure object whereby the sensor generates a measure image of the measure object at each time instant in a set of at least two subsequent time instants, thus generating said space-time volume of measure images wherein a feature point of the measure object maps to a trajectory in the space-time volume.

Abstract: The present invention relates to a method and an apparatus for determining the amount of light scattered in an object in a machine vision system comprising: a light source illuminating said object with incident light having a limited extension in at least one direction; and, an imaging sensor detecting light emanating from said object, wherein said emanated light is reflected light (R) on the surface of said object and light scattered (S) in said object, said detected light is resulting in at least one intensity distribution curve on said imaging sensor having a peak where said reflected light (R) is detected on said imaging sensor. A width (w) of said at least one intensity distribution curve around said peak is measured, whereby said measured width (w) indicates the amount of light scattered (S) in said object.

Abstract: A system and method for imaging the characteristics of an object (2) having at least a first (2a) and a second (2b) layer. The object (2) is illuminated by means of incident light (4), and light (5b) reflected from the object (2) is detected by means of an imaging sensor (6) in which the detected light is converted into electrical charges, according to which a representation of the object (2) is created. Information on light scattered (5a) in the first layer (2a) and the second layer (2b) of the object (2) is obtained from the representation and this information is compared to stored information in order to detect defects on the object (2).

Abstract: A system and method for imaging the characteristics of an object (2) having at least a first (2a) and a second (2b) layer. The object (2) is illuminated by means of incident light (4), and light (5b) reflected from the object (2) is detected by means of an imaging sensor (6) in which the detected light is converted into electrical charges, according to which a representation of the object (2) is created. Information on light scattered (5a) in the first layer (2a) and the second layer (2b) of the object (2) is obtained from the representation and this information is compared to stored information in order to detect defects on the object (2).

Abstract: The present invention relates to the field of measuring apparatuses in distribution systems allowing for measuring presence, position and/or shape of an object placed on a carrier and a method for such measuring.

Abstract: The present invention relates to the field of measuring apparatuses in distribution systems allowing for measuring presence, position and/or shape of an object placed on a carrier and a method for such measuring.

Abstract: System and sensor (10) for imaging characteristics of an object (2). The sensor comprises at least a first area (11) and a second area (12) of pixel elements arranged to absorb electromagnetic radiation from the object (2) and to convert the radiation absorbed into electrical charges. The first area (11) has a first degree of resolution and the second area (12) has a second degree of resolution different from the first degree of resolution and the first area (11) is arranged to image one type of characteristics and the second area (12) is arranged to image another type of characteristics.

Abstract: A method and a device for contactless inspection of objects on a substrate, by means of an inspection device during relative motion between the substrate and the inspection device, wherein the following steps are performed by the method; generating a first image comprising object height information by illuminating at least a portion of the substrate comprising one or more objects by means of first radiator and imaging at least one of said one or more objects illuminated by said first radiator onto a two-dimensional matrix sensor having a portionwise addressable matrix of pixel elements; generating a second image comprising object area information by illuminating at least a portion of the substrate comprising one Or more objects by means of second radiator and imaging at least one of said one or more objects illuminated by said second radiator onto said sensor; extracting the object height information, by means of said sensor, from said first image; and extracting the object area information, by means of s

Abstract: A method and a device for contactless inspection of objects on a substrate, by means of an inspection device during relative motion between the substrate and the inspection device, wherein the following steps are performed by the method;