Patents by Inventor Mattias VAN DAEL

Mattias VAN DAEL has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10520452
    Abstract: A non-destructive inspection method for inline inspection of an object comprises moving an object in between a radiation source and an image detector and through a three-dimensional scanner field of view, imaging the object using the image detector to obtain a projection radiograph of an internal structure of the object, scanning an exterior surface of the object using the 3D scanner, fitting a shape model of the object to a point cloud provided by the 3D scanner to obtain a surface model of the exterior surface, creating a solid model of the surface model by taking a grey value distribution of a reference object into account, simulating a reference radiograph from the solid model and comparing the reference and projection radiographs to detect internal deviations of the object.
    Type: Grant
    Filed: March 16, 2016
    Date of Patent: December 31, 2019
    Assignees: KATHOLIEKE UNIVERSITEIT LEUVEN, UNIVERSITEIT GENT, UNIVERSITEIT ANTWERPEN
    Inventors: Mattias Van Dael, Pieter Verboven, Bart Nicolaï, Jelle Dhaene, Luc Van Hoorebeke, Jan Sijbers
  • Publication number: 20180113083
    Abstract: A non-destructive inspection method for inline inspection of an object comprises moving an object in between a radiation source and an image detector and through a three-dimensional scanner field of view, imaging the object using the image detector to obtain a projection radiograph of an internal structure of the object, scanning an exterior surface of the object using the 3D scanner, fitting a shape model of the object to a point cloud provided by the 3D scanner to obtain a surface model of the exterior surface, creating a solid model of the surface model by taking a grey value distribution of a reference object into account, simulating a reference radiograph from the solid model and comparing the reference and projection radiographs to detect internal deviations of the object.
    Type: Application
    Filed: March 16, 2016
    Publication date: April 26, 2018
    Inventors: Mattias VAN DAEL, Pieter VERBOVEN, Bart NICOLAÏ, Jelle DHAENE, Luc VAN HOOREBEKE, Jan SIJBERS