Patents by Inventor Maurício Pamplona Pires

Maurício Pamplona Pires has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for dopant calibration of delta doped multilayered structure
    Patent number: 7723758
    Abstract: In a calibration method, the relation between dopant concentrations of ?-doping layers in a multilayered semiconductor structure and process parameters is determined S1 based on multiple bulk specimens of the material in which the ?-doping layers are located. A desired dopant concentration is selected S2, and the semiconductor structure with predetermined doping levels can be generated S3 based on the relation between the process parameters and the predetermined doping concentrations.
    Type: Grant
    Filed: November 11, 2004
    Date of Patent: May 25, 2010
    Assignee: Ericsson Telecomunicacoes S.A.
    Inventors: Patricia Lustoza De Souza, Christiana Villas-Bôas Tribuzy, Maurício Pamplona Pires, Sandra Marcela Landi
  • Method For Dopant Calibration of Delta Doped Multilayered Structure
    Publication number: 20080296556
    Abstract: In a calibration method, the relation between dopant concentrations of ?-doping layers in a multilayered semiconductor structure and process parameters is determined S1 based on multiple bulk specimens of the material in which the ?-doping layers are located. A desired dopant concentration is selected S2, and the semiconductor structure with predetermined doping levels can be generated S3 based on the relation between the process parameters and the predetermined doping concentrations.
    Type: Application
    Filed: November 11, 2004
    Publication date: December 4, 2008
    Inventors: Patricia Lustoza De Souza, Christiana Villas-Boas Tribuzy, Mauricio Pamplona Pires, Sandra Marcela Landi