Patents by Inventor Maureen Ardans

Maureen Ardans has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7223616
    Abstract: The present invention is test structures in unused areas of semiconductor integrated circuits and methods for designing the same. In an exemplary aspect of the present invention, a method for placing test structures in a semiconductor integrated circuit includes: (a) detecting a dummy area in a semiconductor integrated circuit, the semiconductor integrated circuit including probe pads on a top metal layer; (b) filling the dummy area with active test cells, the active test cells being connected to one another; and (c) connecting each of the active test cells to the probe pads with a metal line.
    Type: Grant
    Filed: June 4, 2004
    Date of Patent: May 29, 2007
    Assignee: LSI Corporation
    Inventors: Franklin Duan, Maureen Ardans, Jun Song
  • Publication number: 20050272174
    Abstract: The present invention is test structures in unused areas of semiconductor integrated circuits and methods for designing the same. In an exemplary aspect of the present invention, a method for placing test structures in a semiconductor integrated circuit includes: (a) detecting a dummy area in a semiconductor integrated circuit, the semiconductor integrated circuit including probe pads on a top metal layer; (b) filling the dummy area with active test cells, the active test cells being connected to one another; and (c) connecting each of the active test cells to the probe pads with a metal line.
    Type: Application
    Filed: June 4, 2004
    Publication date: December 8, 2005
    Inventors: Franklin Duan, Maureen Ardans, Jun Song