Abstract: A control and management method for lathes and loaders for lathes, comprising the steps of: detecting geometric parameters and mechanical characteristics of a bar to be turned; determining development of the critical frequencies of the bar upon a rotation thereof about the longitudinal axis as the rotation rate and length of the bar vary; starting turning of the bar, avoiding the combinations of mandrel rotation rate and bar length at which the rotation rate of the bar intersects the curves that represent the development of the critical frequencies.

Abstract: An embodiment of the present invention relates to a alignment measurement system for measuring alignment between a plurality of chips of a device, the chips being assembled in a three-dimensional stacking configuration and equipped with at least an integrated capacitive sensor, including a multiple-capacitor structure integrated in the capacitive sensor, at least a sensing circuit connected to the multiple-capacitor structure which issues an output voltage, proportional to a variation of a capacitive value of the multiple-capacitor structure of the integrated capacitive sensor of the device and corresponding to a measured misalignment between the chips of the device.

Abstract: An embodiment of the present invention relates to a alignment measurement system for measuring alignment between a plurality of chips of a device, the chips being assembled in a three-dimensional stacking configuration and equipped with at least an integrated capacitive sensor, comprising a multiple-capacitor structure integrated in said capacitive sensor, at least a sensing circuit connected to said multiple-capacitor structure which issues an output voltage, proportional to a variation of a capacitive value of the multiple-capacitor structure of the integrated capacitive sensor of the device and corresponding to a measured misalignment between the chips of the device.