Patents by Inventor Maw-Ching Lin

Maw-Ching Lin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of testing radiation for a SDRAM
    Patent number: 6642725
    Abstract: A method for testing for radiation on a synchronized dynamic random access memory (SDRAM), wherein an irradiation controller irradiates the SDRAM. The status of the SDRAM after a radiation test are calculated. The radiation tests comprise SEU, micro latch-up, SEL and get rapture tests. From the radiation test, we can understand the condition of the SDRAM before and after the radiation test.
    Type: Grant
    Filed: June 28, 2001
    Date of Patent: November 4, 2003
    Assignee: Chung-Shan Institute of Science and Technology
    Inventors: Li-Shen Juhn, Kuang-Shyr Wu, Maw-Ching Lin
  • Method of testing radiation for a SDRAM
    Publication number: 20030001597
    Abstract: A method for testing for radiation on a synchronized dynamic random access memory (SDRAM), wherein an irradiation controller irradiates the SDRAM. The status of the SDRAM after a radiation test are calculated. The radiation tests comprise SEU, micro latch-up, SEL and get rapture tests. From the radiation test, we can understand the condition of the SDRAM before and after the radiation test.
    Type: Application
    Filed: June 28, 2001
    Publication date: January 2, 2003
    Inventors: Li-Shen Juhn, Kuang-Shyr Wu, Maw-Ching Lin
  • RADIATION TEST SYSTEM
    Publication number: 20020140431
    Abstract: A radiation test system that couples with a radiation test field and a radiation controller. The radiation controller records the flow of radiation particles and the test results obtained from a test component. The radiation controller also controls a radiation particle accelerator so that the test component is irradiated with a cyclically varying radiation beam. The radiation test system further includes a daughter board, a motherboard, a power source, a near-end monitor and a far-end monitor. The near-end monitor is responsible for initiating a test program to test the test program, monitoring the test status and recording the test data. The far-end monitor remotely controls the near-end monitor to initiate an irradiation testing of the test component. The far-end monitor also receives test data submitted by the near-end monitor so that test results may be further analyzed.
    Type: Application
    Filed: March 28, 2001
    Publication date: October 3, 2002
    Inventors: Kuang-Shyr Wu, Maw-Ching Lin, Li-Shen Juhn
  • Radiation test system
    Patent number: 6456084
    Abstract: A radiation test system that couples with a radiation test field and a radiation controller. The radiation controller records the flow of radiation particles and the test results obtained from a test component. The radiation controller also controls a radiation particle accelerator so that the test component is irradiated with a cyclically varying radiation beam. The radiation test system further includes a daughter board, a motherboard, a power source, a near-end monitor and a far-end monitor. The near-end monitor is responsible for initiating a test program to test the test program, monitoring the test status and recording the test data. The far-end monitor remotely controls the near-end monitor to initiate an irradiation testing of the test component. The far-end monitor also receives test data submitted by the near-end monitor so that test results may be further analyzed.
    Type: Grant
    Filed: March 28, 2001
    Date of Patent: September 24, 2002
    Assignee: Chung-Shan Institute of Science and Technology
    Inventors: Kuang-Shyr Wu, Maw-Ching Lin, Li-Shen Juhn