Patents by Inventor Max B. Reid

Max B. Reid has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5483168
    Abstract: The present invention relates to an optical system for creating a potential field map of a bounded two dimensional region containing a goal location and an arbitrary number of obstacles. The potential field mapping system has an imaging device and a processor. Two image writing modes are used by the imaging device, electron deposition and electron depletion. Patterns written in electron deposition mode appear black and expand. Patterns written in electron depletion mode are sharp and appear white. The generated image represents a robot's workspace. The imaging device under processor control then writes a goal location in the workspace using the electron deposition mode. The black image of the goal expands in the workspace. The processor stores the generated images, and uses them to generate a feedback pattern. The feedback pattern is written in the workspace by the imaging device in the electron deposition mode to enhance the expansion of the original goal pattern.
    Type: Grant
    Filed: March 1, 1993
    Date of Patent: January 9, 1996
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventor: Max B. Reid
  • Patent number: 5333210
    Abstract: A method and system for performing pattern analysis with a neural network coarse-code a pattern to be analyzed so as to form a plurality of sub-patterns collectively defined by data. Each of the sub-patterns comprises sets of sub-pattern data. The neural network includes a plurality of fields, each field being associated with one of the sub-patterns so as to receive the sub-pattern data therefrom. Training and testing by the neural network then proceeds in the usual way, with one modification: the transfer function thresholds the value obtained from summing the weighted products of each field over all sub-patterns associated with each pattern being analyzed by the system.
    Type: Grant
    Filed: July 2, 1992
    Date of Patent: July 26, 1994
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: Liljana Spirkovska, Max B. Reid