Patents by Inventor Max Van Der Star

Max Van Der Star has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for testing an integrated circuit means having a hierarchical organization of at least three levels, and integrated circuit means and integrated circuit suitable for being so tested
    Patent number: 5477548
    Abstract: A method for testing a hierarchically organized integrated circuit means first attacks each assembly in sequence thereof, and in each assembly executing an assembly test cycle. Each assembly test cycle within the assembly in question attacks each macro thereof in sequence and conditionally executes therein a test run under selective control of a macro test mode (MTM) signal. The number of hierarchy levels may be other than three. The method may be applicable to separate integrated circuits or to a wired board with a plurality of circuits.
    Type: Grant
    Filed: February 16, 1993
    Date of Patent: December 19, 1995
    Assignee: U.S. Philips Corporation
    Inventors: Franciscus P. M. Beenker, Robertus W. C. Dekker, Rudi J. J. Stans, Max van der Star
  • Scan test apparatus for asynchronous circuitry
    Patent number: 5008618
    Abstract: A scan test cycle is implemented for circuits having sets of elements controlled by mutually asynchronous clock signals by forming a separate scan chain for stimulus and response patterns for the element sets controlled by each clock signal and by performing a separate test sub-cycle for each scan chain.
    Type: Grant
    Filed: January 23, 1990
    Date of Patent: April 16, 1991
    Assignee: U.S. Philips Corporation
    Inventor: Max Van Der Star