Patents by Inventor Max Wiki
Max Wiki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20160077089Abstract: The present invention relates to methods for the detection of human platelet alloantigens (HPAs) on human platelets, methods for the detection of human antibodies against HPAs, and diagnostic test devices for carrying our said methods.Type: ApplicationFiled: April 25, 2014Publication date: March 17, 2016Inventors: Manfred Schawaller, Claudio Rhyner, Cezmi Akdis, Max Wiki, Reto Crameri
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Publication number: 20150010903Abstract: The present invention relates to a method for the detection of a substance in an aqueous, physiological or chemical liquid using the evanescence field method, and to a diagnostic device for carrying out said method.Type: ApplicationFiled: March 12, 2012Publication date: January 8, 2015Applicant: DAVOS DIAGNOSTICS AGInventors: Manfred Schawaller, Claudio Rhyner, Cezmi Akdis, Max Wiki, Reto Crameri
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Patent number: 8213017Abstract: The invention relates to an analytical system and method for generating and metering optical signals. The invention includes an optical system having an illuminating system and a sensor platform. The illuminating system includes an arrangement identified as “SLM” for the temporally rapidly variable spatial light modulation, by which in an operating state, illuminating patterns of a freely selectable and rapidly variable geometry, which can be determined by the settings of the SLM, can be generated on the sensor platform from an illuminating light, which enters into this SLM and which includes a substantially homogenous intensity distribution in the in the cross section of the illuminating light at right angles to its direction of expansion.Type: GrantFiled: July 16, 2007Date of Patent: July 3, 2012Inventor: Max Wiki
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Publication number: 20100014088Abstract: The invention relates to an analytical system and to a method performed therewith for generating and metering optical signals and/or the variations thereof from metering ranges, which are arranged in a one-dimensional or two-dimensional array on a substantially optically transparent sensor platform (2), at least comprising an optical system comprising an illuminating system (1) for illuminating metering ranges on the sensor platform (2) and a detection system (3) comprising at least one detection unit (11) for detecting signals from the metering ranges on the sensor platform (11) the direction of the transmission or reflection of the illuminating light in a spectral range, which comprises the spectral range of the illuminating light, and a sensor platform (2), which can be inserted into the optical system, comprising metering ranges, which are arranged thereon in a one-dimensional or a two-dimensional array, characterized in that the illuminating system (1) comprises an arrangement (8.Type: ApplicationFiled: July 16, 2007Publication date: January 21, 2010Inventor: Max Wiki
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Patent number: 7625675Abstract: A mask for photolithography methods comprises opaque and transparent areas as well as a surface structure. For the contact with a substrate (10) to be exposed at least a few opaque areas are incorporated and at least a few transparent areas are arranged in a spaced fashion and are deep-etched down to a structural depth. In a further embodiment at least one transparent area is designed as a positively resting area (12). The structural depth in the deep-etched areas is greater than the thickness of the surface structure, at least greater than or equal to 1 ?m.Type: GrantFiled: February 22, 2005Date of Patent: December 1, 2009Assignee: Oerlikon Trading AG, TrubbachInventors: Max Wiki, Michael Lanker
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Patent number: 7405819Abstract: A sample substrate adapted for use with fluorescence excitation light with a first wavelength. A reflector is disposed on a base. The reflector includes a reflecting multilayer interference coating with at least two layers. Not all of the layers L fulfill a quarterwave condition: dL·nL=(2N+1)·¼ wherein dL is a physical thickness of layer L, nL is an index of refraction of layer L at the first wavelength, N is an integer equal to or greater than zero and 1 is the first wavelength. Thicknesses of the layers ensure that any fluorescent sample material disposed on top of said multilayer interference coating would be located near an antinode of a standing wave formed by the excitation light with the first wavelength incident on said substrate.Type: GrantFiled: April 25, 2007Date of Patent: July 29, 2008Assignee: OC Oerlikon Balzers AGInventors: Jorg Kraus, Johannes Edlinger, Max Wiki, Heidi Thome-Forster, Claus Heine-Kempkens, Bernd Maisenhoelder, Martin Kaspar
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Patent number: 7285789Abstract: A sample substrate adapted for use with electromagnetic excitation light includes a base and a layer system. The layer system includes a multilayer interference coating with at least two layers wherein the thicknesses of the layers ensure that light emitted by a fluorescent sample material disposed on top of said multilayer interference coating is reflected. Light directed to a fluorescent sample material disposed on the substrate causes light to be emitted from the sample. The layer system includes a multilayer interference coating with at least two layers wherein thicknesses of the layers cause separation of the excitation light from the emitted light.Type: GrantFiled: June 3, 2004Date of Patent: October 23, 2007Assignee: OC Oerlikon Balzers AGInventors: Max Wiki, Johannes Edlinger
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Publication number: 20070216901Abstract: The invention relates to a useful improvement of an ellipsometer-type device. For this purpose, an existing ellipsometer is supplemented by a so-called resonance platform on which surface modes are excitable. Contrary to state of the art of known surface plasmons, the inventive modes are laterally localized. In addition, the resonance platform is not necessarily embodied in the form of a metal sheet. The inventive device also can be embodied in the form of an image-forming device. The inventive method consists in placing measurable samples on the platform surface and, afterwards, are exposed to light, thereby being excited in modes. The resonance position of modes is determined by the absorption behavior of a measurable substance.Type: ApplicationFiled: July 18, 2005Publication date: September 20, 2007Applicant: OC OERLIKON BALZERS AGInventors: Max Wiki, Johannes Edlinger, Matthias Vaupel, Andreas Eing
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Publication number: 20070188746Abstract: A sample substrate adapted for use with fluorescence excitation light with a first wavelength. A reflector is disposed on a base. The reflector includes a reflecting multilayer interference coating with at least two layers. Not all of the layers L fulfill a quarterwave condition: dL·nL=(2N+1)·¼ wherein dL is a physical thickness of layer L, nL is an index of refraction of layer L at the first wavelength, N is an integer equal to or greater than zero and 1 is the first wavelength. Thicknesses of the layers ensure that any fluorescent sample material disposed on top of said multilayer interference coating would be located near an antinode of a standing wave formed by the excitation light with the first wavelength incident on said substrate.Type: ApplicationFiled: April 25, 2007Publication date: August 16, 2007Applicant: OC OERLIKON BALZERS AGInventors: Jorg Kraus, Johannes Edlinger, Max Wiki, Heidi Thome-Forster, Claus Heine-Kempkens, Bernd Maisenhoelder, Martin Kaspar
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Publication number: 20070159629Abstract: A method for analyzing organic adsorbent layers (7) on a substrate (4) comprises the steps of providing a substrate (4) whose surface has an index of refraction equal or close to the index of refraction of the organic adsorbent to be analyzed. On the surface of the substrate (4) there is applied a layer system (5,6) with at least one layer (5) with index of refraction of the biological material and an organic adsorbent layer (7) on top of the layer system. When acting polarized light upon the substrate a change of polarization characteristics in reflection and/or transmission is detected.Type: ApplicationFiled: March 7, 2005Publication date: July 12, 2007Applicant: OC OERLIKON BALZERS AGInventors: Andreas Eing, Max Wiki, Johannes Edlinger, Dirk Hoenig
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Patent number: 7227633Abstract: A sample substrate adapted for use with fluorescence excitation light with a first wavelength. A reflector is disposed on a base. The reflector includes a reflecting multilayer interference coating with at least two layers. Not all of the layers L fulfill a quarterwave condition: dL·nL=(2N+1)·1/4 wherein dL is a physical thickness of layer L, nL is an index of refraction of layer L at the first wavelength, N is an integer equal to or greater than zero and 1 is the first wavelength. Thicknesses of the layers ensure that any fluorescent sample material disposed on top of said multilayer interference coating would be located near an antinode of a standing wave formed by the excitation light with the first wavelength incident on said substrate.Type: GrantFiled: June 2, 2004Date of Patent: June 5, 2007Assignee: OC Oerlikon Balzers AGInventors: Jörg Kraus, Johannes Edlinger, Max Wiki, Heidi Thome-Forster, Claus Heine-Kempkens, Bernd Maisenhoelder, Martin Kaspar
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Publication number: 20050202324Abstract: A mask for photolithography methods comprises opaque and transparent areas as well as a surface structure. For the contact with a substrate (10) to be exposed at least a few opaque areas are incorporated and at least a few transparent areas are arranged in a spaced fashion and are deep-etched down to a structural depth. In a further embodiment at least one transparent area is designed as a positively resting area (12). The structural depth in the deep-etched areas is greater than the thickness of the surface structure, at least greater than or equal to 1 ?m.Type: ApplicationFiled: February 22, 2005Publication date: September 15, 2005Inventors: Max Wiki, Michael Lanker
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Patent number: 6922287Abstract: A light coupling element is proposed with a surface (3) of a material which is transparent to light of a given wavelength (?). In order for the light coupling element to act independently of the direction of the vectorial parameters of the light, such as in particular of the polarization, on the surface of the light coupling element line-form indentations or elevations (51, 52) are provided which are equidistantly parallel and which intersect at given angles (?).Type: GrantFiled: October 23, 2001Date of Patent: July 26, 2005Assignee: Unaxis Balzers AktiengesellschaftInventors: Max Wiki, Bernd Maisenholder
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Publication number: 20050051733Abstract: A sample substrate adapted for use with electromagnetic excitation light includes a base and a layer system. The layer system includes a multilayer interference coating with at least two layers wherein the thicknesses of the layers ensure that light emitted by a fluorescent sample material disposed on top of said multilayer interference coating is reflected. Light directed to a fluorescent sample material disposed on the substrate causes light to be emitted from the sample. The layer system includes a multilayer interference coating with at least two layers wherein thicknesses of the layers cause separation of the excitation light from the emitted light.Type: ApplicationFiled: June 3, 2004Publication date: March 10, 2005Applicant: Unaxis Balzers Ltd.Inventors: Max Wiki, Johannes Edlinger
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Publication number: 20040247485Abstract: A sample substrate adapted for use with fluorescence excitation light with a first wavelength. A reflector is disposed on a base. The reflector includes a reflecting multilayer interference coating with at least two layers. Not all of the layers L fulfill a quarterwave condition: dL·nL=(2N+1)·1/4 wherein dL is a physical thickness of layer L, nL is an index of refraction of layer L at the first wavelength, N is an integer equal to or greater than zero and 1 is the first wavelength. Thicknesses of the layers ensure that any fluorescent sample material disposed on top of said multilayer interference coating would be located near an antinode of a standing wave formed by the excitation light with the first wavelength incident on said substrate.Type: ApplicationFiled: June 2, 2004Publication date: December 9, 2004Inventors: Jorg Kraus, Johannes Edlinger, Max Wiki, Heidi Thome-Forster, Claus Heine-Kempkens, Bernd Maisenhoelder, Martin Kaspar
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Publication number: 20030072529Abstract: A light coupling element is proposed with a surface (3) of a material which is transparent to light of a given wavelength (&lgr;). In order for the light coupling element to act independently of the direction of the vectorial parameters of the light, such as in particular of the polarization, on the surface of the light coupling element line-form indentations or elevations (51, 52) are provided which are equidistantly parallel and which intersect at given angles (&phgr;).Type: ApplicationFiled: October 23, 2001Publication date: April 17, 2003Inventors: Max Wiki, Bernd Maisenholder
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Patent number: 6429022Abstract: The integrated-optical chemical and/or biochemical sensor comprises a resonant waveguide grating structure (1.1, 1.2, . . . ), e.g., a chirped grating. By illumination with incident light (21), a resonant electromagnetic field is excited in the grating structure (1.1, 1.2, . . . ). At least one parameter of the incident light, e.g., the angle of incidence (&thgr;1) or the wavelength (&lgr;1), is varied. Light (23) excident from the grating structure (1.1, 1.2, . . . ) is detected by detectors (4.1, 4.2, . . . ). Optionally, means for providing a feedback from the detectors (4.1, 4.2, . . . ) to the light sources may be provided, thus establishing a controlled closed-loop system. Hence independent simultaneous measurements in a multiple arrangement of such sensors (S1, S2, . . . ) is made possible. Moreover, a much higher density of sensors (S1, S2, . . . ) results.Type: GrantFiled: February 22, 2000Date of Patent: August 6, 2002Assignee: CSEM Centre Suisse d'electronique et de Microtechnique SAInventors: Rino Kunz, Max Wiki, Philipp Zeller