Abstract: In accordance with the invention, an X-ray amplitude analyzer grating adapted for use in an interferometric imaging system, the interferometric imaging system comprising an X-ray source and an X-ray detector with an X-ray fringe plane between the X-ray source and the X-ray detector, wherein an X-ray fringe pattern is formed at the X-ray fringe plane, wherein the X-ray amplitude analyzer grating is provided. The X-ray amplitude analyzer grating comprises a plurality of grating pixels across two dimensions of the X-ray amplitude analyzer grating, wherein each grating pixels of the plurality of grating pixels has a different pattern with respect to all adjacent grating pixels to the grating pixel so that all adjacent grating pixels do not have a same pattern as the grating pixel.

Abstract: Single X-ray grating differential phase contrast (DPC) X-ray imaging is provided by replacing the conventional X-ray source with a photo-emitter X-ray source array (PeXSA), and by replacing the conventional X-ray detector with a photonic-channeled X-ray detector array (PcXDA). These substitutions allow for the elimination of the G0 and G2 amplitude X-ray gratings used in conventional DPC X-ray imaging. Equivalent spatial patterns are formed optically in the PeXSA and the PcXDA. The result is DPC imaging that only has a single X-ray grating (i.e., the G1 X-ray phase grating).

Abstract: Single X-ray grating differential phase contrast (DPC) X-ray imaging is provided by replacing the conventional X-ray source with a photo-emitter X-ray source array (PeXSA), and by replacing the conventional X-ray detector with a photonic-channeled X-ray detector array (PcXDA). These substitutions allow for the elimination of the G0 and G2 amplitude X-ray gratings used in conventional DPC X-ray imaging. Equivalent spatial patterns are formed optically in the PeXSA and the PcXDA. The result is DPC imaging that only has a single X-ray grating (i.e., the G1 X-ray phase grating).

Abstract: An X-ray detector array includes a scintillator that converts input X-ray radiation to secondary optical radiation output from the scintillator, a first telecentric micro lens array that array receives the secondary optical radiation, a phase coded aperture, where the first telecentric micro lens array directs the secondary optical radiation on the phase coded aperture, a second telecentric micro lens array, where the secondary optical radiation output from the phase coded array is directed to the second telecentric micro lens array, a patterned grating mask, where the second telecentric micro lens array directs the optical beam on the patterned mask, and a photodetector array, where the patterned mask outputs the optical beam in a pattern according to the patterned mask to the photodetector array, where the photodetector array outputs a signal, where a photon fringe pattern is imaged and sampled in the wavelength domain of the radiation from the scintillator.

Abstract: An X-ray detector array includes a scintillator that converts input X-ray radiation to secondary optical radiation output from the scintillator, a first telecentric micro lens array that array receives the secondary optical radiation, a phase coded aperture, where the first telecentric micro lens array directs the secondary optical radiation on the phase coded aperture, a second telecentric micro lens array, where the secondary optical radiation output from the phase coded array is directed to the second telecentric micro lens array, a patterned grating mask, where the second telecentric micro lens array directs the optical beam on the patterned mask, and a photodetector array, where the patterned mask outputs the optical beam in a pattern according to the patterned mask to the photodetector array, where the photodetector array outputs a signal, where a photon fringe pattern is imaged and sampled in the wavelength domain of the radiation from the scintillator.