Patents by Inventor Maxime DEPREZ

Maxime DEPREZ has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10175115
    Abstract: A wavefront analyzer is modified to simply determine the differences in amplitude and tilt which can exist between the different regions of an initial wavefront (S0). To achieve this, interference between two waves only is produced from beams (F1, F2) which come from neighboring regions on the initial wavefront. Such an analyzer can be used to coherently combine laser radiation produced by different sources arranged in parallel. Another use is for the determination of the differences in height and inclination which exist between the neighboring mirror segments of a Keck telescope.
    Type: Grant
    Filed: September 18, 2015
    Date of Patent: January 8, 2019
    Assignee: ONERA (OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES)
    Inventors: Cindy Bellanger, Maxime Deprez, Laurent Lombard, Jerome Primot
  • Publication number: 20170276552
    Abstract: A wavefront analyser is modified to simply determine the differences in amplitude and tilt which can exist between the different regions of an initial wavefront (S0). To achieve this, interference between two waves only is produced from beams (F1, F2) which come from neighbouring regions on the initial wavefront. Such an analyser can be used to coherently combine laser radiation produced by different sources arranged in parallel. Another use is for the determination of the differences in height and inclination which exist between the neighbouring mirror segments of a Keck telescope.
    Type: Application
    Filed: September 18, 2015
    Publication date: September 28, 2017
    Inventors: Cindy BELLANGER, Maxime DEPREZ, Laurent LOMBARD, Jerome PRIMOT