Abstract: The use of compounds of the milbemycin class as inhibitors of efflux pumps in microbes or other cells is described, along with pharmaceutical compositions incorporating a milbemycin. Also described is a method of screening for compounds which inhibit a CDR1, CDR2, BEN, or FLU1 efflux pump or a pump with components having a high level of protein level sequence similarity with the components of those efflux pumps.

Abstract: Compounds are described which have efflux pump inhibitor activity. Also described are methods of using such efflux pump inhibitor compounds and pharmaceutical compositions which include such compounds.

Abstract: The invention provides novel antibiotics of the pacidamycin group of uridyl peptide antibiotics and methods of preparing and using those compounds.

Abstract: Compounds are described which have efflux pump inhibitor activity. Also described are methods of using such efflux pump inhibitor compounds and pharmaceutical compositions which include such compounds.

Abstract: The present invention is a charge pump circuit to reduce and distribute power supply current surges. The charge pump circuit includes a first clock line to provide a first clock thereon, a plurality of delay circuits connected in series, each delay circuit generating a delayed and inverted clock from its input clock on a respective output clock line, and a plurality of charge pump stages connected in series each to store charge thereon. The first clock line is coupled to the first charge pump stage and the plurality of output clock lines are coupled to a respective plurality of remaining charge pump stages. The operation of each charge pump stage is staggered to reduce and distribute the power supply current surges.

Abstract: An adaptive amplitude ramp controller that regulates how fast and how high a series of voltages is applied to a targeted non-volatile memory cell. The series of voltages include a coarse ramp pulse and at least one fine ramp pulse. The coarse ramp pulse undergoes a first ramp rate until a particular voltage is reached. Thereafter, it undergoes a second ramp rate until the cycle associated with the coarse ramp pulse is completed or a target voltage is reached. Programming of the non-volatile memory cell occurs during this portion of the course ramp pulse. Thereafter, the adaptive amplitude ramp controller produces at least one fine ramp pulse. The fine ramp pulse is quickly ramped up at a third ramp rate and then undergoes a fourth ramp rate until the final desired voltage of the non-voltage memory cell is generally reached.

Abstract: The present invention discloses a circuit for controlling operation of a functional circuit in a device based on a test result during testing. The circuit comprises a first storage element configured to be in one of a first state and a second state according to the test result, and a first sensing element coupled to the first storage element for generating a first signal used to control the operation of the functional circuit.