Patents by Inventor Maya GOTO

Maya GOTO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Support system for specified inspection, support method for specified inspection, and non-transitory computer readable medium
    Patent number: 11561184
    Abstract: The purpose of the present invention is to increase accuracy of a specific test using an electronic microscope and improve work efficiency. Provided is a system that identifies test recipe information corresponding to an object to be tested on the basis of attribute information about a testing sample, and analyzes and evaluates the object to be tested contained in the testing sample by checking image data and element analysis data that are acquired by a measuring device in accordance with a control program for the test recipe information, against reference image data and reference element analysis data that are used as evaluation references for the object to be tested.
    Type: Grant
    Filed: September 25, 2018
    Date of Patent: January 24, 2023
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Nobuyoshi Tada, Shigeya Tanaka, Minori Noguchi, Yuusuke Oominami, Maya Goto
  • SUPPORT SYSTEM FOR SPECIFIED INSPECTION, SUPPORT METHOD FOR SPECIFIED INSPECTION, AND NON-TRANSITORY COMPUTER READABLE MEDIUM
    Publication number: 20200278303
    Abstract: The purpose of the present invention is to increase accuracy of a specific test using an electronic microscope and improve work efficiency. Provided is a system that identifies test recipe information corresponding to an object to be tested on the basis of attribute information about a testing sample, and analyzes and evaluates the object to be tested contained in the testing sample by checking image data and element analysis data that are acquired by a measuring device in accordance with a control program for the test recipe information, against reference image data and reference element analysis data that are used as evaluation references for the object to be tested.
    Type: Application
    Filed: September 25, 2018
    Publication date: September 3, 2020
    Inventors: Nobuyoshi TADA, Shigeya TANAKA, Minori NOGUCHI, Yuusuke OOMINAMI, Maya GOTO