Patents by Inventor Maya Itoh

Maya Itoh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8017305
    Abstract: First, a first exposure process is performed using dipole illumination with only a grating-pattern forming region as a substantial object to be exposed. Next, a second exposure process is performed with only a standard-pattern forming region as a substantial object to be exposed. A development process is then performed to obtain a resist pattern. A mask for the first exposure process is such that a light blocking pattern is formed on the whole surface of a standard-pattern mask part corresponding to the standard-pattern forming region. A mask for the second exposure is such that a light blocking pattern is formed on the whole surface of a grating-pattern mask part corresponding to the grating-pattern forming region.
    Type: Grant
    Filed: January 5, 2010
    Date of Patent: September 13, 2011
    Assignee: Renesas Electronics Corporation
    Inventors: Takeo Ishibashi, Takayuki Saito, Maya Itoh, Shuji Nakao
  • Publication number: 20100104983
    Abstract: First, a first exposure process is performed using dipole illumination with only a grating-pattern forming region as a substantial object to be exposed. Next, a second exposure process is performed with only a standard-pattern forming region as a substantial object to be exposed. A development process is then performed to obtain a resist pattern. A mask for the first exposure process is such that a light blocking pattern is formed on the whole surface of a standard-pattern mask part corresponding to the standard-pattern forming region. A mask for the second exposure is such that a light blocking pattern is formed on the whole surface of a grating-pattern mask part corresponding to the grating-pattern forming region.
    Type: Application
    Filed: January 5, 2010
    Publication date: April 29, 2010
    Applicant: Renesas Technology Corp.
    Inventors: Takeo ISHIBASHI, Takayuki Saito, Maya Itoh, Shuji Nakao
  • Patent number: 7670756
    Abstract: First, a first exposure process is performed using dipole illumination with only a grating-pattern forming region as a substantial object to be exposed. Next, a second exposure process is performed with only a standard-pattern forming region as a substantial object to be exposed. A development process is then performed to obtain a resist pattern. A mask for the first exposure process is such that a light blocking pattern is formed on the whole surface of a standard-pattern mask part corresponding to the standard-pattern forming region. A mask for the second exposure is such that a light blocking pattern is formed on the whole surface of a grating-pattern mask part corresponding to the grating-pattern forming region.
    Type: Grant
    Filed: November 14, 2008
    Date of Patent: March 2, 2010
    Assignee: Renesas Technology Corp.
    Inventors: Takeo Ishibashi, Takayuki Saito, Maya Itoh, Shuji Nakao
  • Publication number: 20090075187
    Abstract: First, a first exposure process is performed using dipole illumination with only a grating-pattern forming region as a substantial object to be exposed. Next, a second exposure process is performed with only a standard-pattern forming region as a substantial object to be exposed. A development process is then performed to obtain a resist pattern. A mask for the first exposure process is such that a light blocking pattern is formed on the whole surface of a standard-pattern mask part corresponding to the standard-pattern forming region. A mask for the second exposure is such that a light blocking pattern is formed on the whole surface of a grating-pattern mask part corresponding to the grating-pattern forming region.
    Type: Application
    Filed: November 14, 2008
    Publication date: March 19, 2009
    Applicant: Renesas Technology Corp.
    Inventors: Takeo Ishibashi, Takayuki Saito, Maya Itoh, Shuji Nakao
  • Patent number: 7459265
    Abstract: First, a first exposure process is performed using dipole illumination with only a grating-pattern forming region as a substantial object to be exposed. Next, a second exposure process is performed with only a standard-pattern forming region as a substantial object to be exposed. A development process is then performed to obtain a resist pattern. A mask for the first exposure process is such that a light blocking pattern is formed on the whole surface of a standard-pattern mask part corresponding to the standard-pattern forming region. A mask for the second exposure is such that a light blocking pattern is formed on the whole surface of a grating-pattern mask part corresponding to the grating-pattern forming region.
    Type: Grant
    Filed: October 24, 2005
    Date of Patent: December 2, 2008
    Assignee: Renesas Technology Corp.
    Inventors: Takeo Ishibashi, Takayuki Saito, Maya Itoh, Shuji Nakao
  • Publication number: 20060088792
    Abstract: First, a first exposure process is performed using dipole illumination with only a grating-pattern forming region as a substantial object to be exposed. Next, a second exposure process is performed with only a standard-pattern forming region as a substantial object to be exposed. A development process is then performed to obtain a resist pattern. A mask for the first exposure process is such that a light blocking pattern is formed on the whole surface of a standard-pattern mask part corresponding to the standard-pattern forming region. A mask for the second exposure is such that a light blocking pattern is formed on the whole surface of a grating-pattern mask part corresponding to the grating-pattern forming region.
    Type: Application
    Filed: October 24, 2005
    Publication date: April 27, 2006
    Applicant: Renesas Technology Corp.
    Inventors: Takeo Ishibashi, Takayuki Saito, Maya Itoh, Shuji Nakao