Abstract: The present invention is a method for improving the estimation of physical properties of a material based on the infrared spectrum of the material and the correlation between directly-measured properties of interest and the infrared spectra of a representative set of calibration specimens of the material. By intentionally introducing spectral distortion such as transmittance shifts, wavelength shifts, absorbance-baseline shifts and absorbance-baseline tilts into the infrared spectra of the representative specimens and then determining the correlation between the distorted spectra and the directly-measured properties before applying the correlation to the infrared spectrum of the sample being analyzed, the correlation is self-compensating for the types of distortion introduced.

Abstract: The present invention is a method for improving the estimation of physical properties of a material, based on the infrared spectrum of the material, by concatenating additional data obtained from other measurement techniques to the infrared spectrum to fill the voids in the spectral data resulting from a lack of sensitivity by infrared spectrometers to trace compounds in the material. The augmented spectral data then is used to produce a calibration model for estimating the physical properties of the material.