Abstract: Existing approaches for switching between different hardware accelerators in a heterogeneous accelerator approach have the disadvantage that complete potential of the heterogeneous hardware accelerators do not get used as the switching relies on load on the accelerators or a random switching in which entire task gets reassigned to a different hardware accelerator. The disclosure herein generally relates to data model training, and, more particularly, to a method and system for data model training using heterogeneous hardware accelerators. In this approach, the system switches between hardware accelerators when a measured accuracy of the data model after any epoch is below a threshold of accuracy.

Abstract: Disclosed herein is a pseudo-random binary sequence (PRBS) generator (200) for performing on-chip testing. It comprises of a plurality of lanes (L1-L4), wherein each lane comprises a latch group (Lg1-Lg4) capable of receiving clock signals, wherein a number of latches in each latch group is based on an output sequence to be generated for performing the on-chip testing. Each latch group is having at least one of a flip-flop and a latch is further connected with a plurality of logic gates in such a manner that an output, generated by the at least one of the flip-flop and the latch of each latch group, is provided as an input to the plurality of logic gates.

Abstract: A device comprises a digital ramp generator, an oscillator, a power amplifier, a low-noise amplifier (LNA), a mixer, and an intermediate frequency amplifier (IFA). The oscillator generates a chirp signal based on an output from the digital ramp generator. The power amplifier receives the chirp signal and outputs an amplified chirp signal to a transmitter antenna. The LNA receives a reflected chirp signal from a receiver antenna. The mixer receives output of the LNA and combines it with the chirp signal from the oscillator. The IFA receives the mixer output signal and includes a configurable high-pass filter, which has a first cutoff frequency during a first portion of the chirp signal and a second cutoff frequency during a second portion of the chirp signal. In some implementations, the first cutoff frequency is chosen based on a frequency of a blocker signal introduced by couplings between the transmitter and receiver antennas.

Abstract: Disclosed herein is a pseudo-random binary sequence (PRBS) generator (200) for performing on-chip testing. It comprises of a plurality of lanes (L1-L4), wherein each lane comprises a latch group (Lg1-Lg4) capable of receiving clock signals, wherein a number of latches in each latch group is based on an output sequence to be generated for performing the on-chip testing. Each latch group is having at least one of a flip-flop and a latch is further connected with a plurality of logic gates in such a manner that an output, generated by the at least one of the flip-flop and the latch of each latch group, is provided as an input to the plurality of logic gates.

Abstract: [Problem] To provide an autism treatment support system, an autism treatment support device, and a program capable of improving visual concentration of an autistic patient. [Means for solving] This technology relates to an autism treatment support system, an autism treatment support apparatus, and a program. An autism treatment support system includes a tracking unit for tracking a user's eye movement of a display unit of an autism treatment support apparatus, and an analysis unit for analyzing a tendency of the user's eye to move with respect to a gaze of the user with respect to the display unit. A determination unit includes a determination unit that determines a training content based on a tendency of movement of the eye of the user and a skill to be learned by the user determined based on a tendency of movement of the eye of the user, and an execution unit that executes a training program reflecting the determined training content on the autism treatment support apparatus.

Abstract: An embodiment includes an impedance calibration circuit having a calibrator configured to compare voltage levels at an external node and an internal node of the impedance calibration circuit and to generate an output based on the comparison. The calibrator further includes respective filters coupled between the external node and a first input of the comparator, and between the internal node and a second input of the comparator. The filters are configured for symmetric noise injection into the comparator from a chip ground line to which a programmable resistor at the internal node is coupled.

Abstract: An embodiment includes an impedance calibration circuit having a calibrator configured to compare voltage levels at an external node and an internal node of the impedance calibration circuit and to generate an output based on the comparison. The calibrator further includes respective filters coupled between the external node and a first input of the comparator, and between the internal node and a second input of the comparator. The filters are configured for symmetric noise injection into the comparator from a chip ground line to which a programmable resistor at the internal node is coupled.

Abstract: An embodiment includes an impedance calibration circuit having a calibrator configured to compare voltage levels at an external node and an internal node of the impedance calibration circuit and to generate an output based on the comparison. The calibrator further includes respective filters coupled between the external node and a first input of the comparator, and between the internal node and a second input of the comparator. The filters are configured for symmetric noise injection into the comparator from a chip ground line to which a programmable resistor at the internal node is coupled.

Abstract: An embodiment of an impedance calibration circuit and method, a device including an impedance calibration circuit, and a transmission link system.