Abstract: A radar-based fill-level measuring device, comprises the following parts: a semiconductor component for producing electrical high-frequency signals or for determining the fill-level value from the received high-frequency signals; a dielectric waveguide placed in contact with the semiconductor component to couple the high-frequency signals as radar signals into an antenna and/or to couple received radar signals from the antenna as electrical signals into the semiconductor component; a potting encapsulation, which encapsulates at least the waveguide radially such that a defined cavity is formed between the waveguide and the potting encapsulation.

Abstract: A radar-based fill-level measuring device, comprises the following parts: a semiconductor component for producing electrical high-frequency signals or for determining the fill-level value from the received high-frequency signals; a dielectric waveguide placed in contact with the semiconductor component to couple the high-frequency signals as radar signals into an antenna and/or to couple received radar signals from the antenna as electrical signals into the semiconductor component; a potting encapsulation, which encapsulates at least the waveguide radially such that a defined cavity is formed between the waveguide and the potting encapsulation.