Patents by Inventor Mayuko Kishimoto

Mayuko Kishimoto has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Inspection apparatus and quality control system for surface mounting line
    Patent number: 10542651
    Abstract: An inspection apparatus includes an imaging unit that captures an image of a board having a land on which a solder piece has been printed, an image of the board having a component mounted on the solder piece, or an image of the board having the component soldered to the land, a land determination unit that determines a position of an element on the board other than the land from the image of the board captured by the imaging unit, and determines a position of the land in the image based on the determined position of the element, and an inspection unit that inspects the solder piece or component on the land using the position of the land determined by the land determination unit as a reference.
    Type: Grant
    Filed: July 19, 2017
    Date of Patent: January 21, 2020
    Assignee: OMRON Corporation
    Inventors: Hiroyuki Mori, Mayuko Kishimoto, Shimpei Fujii, Katsuki Nakajima
  • INSPECTION APPARATUS AND QUALITY CONTROL SYSTEM FOR SURFACE MOUNTING LINE
    Publication number: 20180049356
    Abstract: An inspection apparatus includes an imaging unit that captures an image of a board having a land on which a solder piece has been printed, an image of the board having a component mounted on the solder piece, or an image of the board having the component soldered to the land, a land determination unit that determines a position of an element on the board other than the land from the image of the board captured by the imaging unit, and determines a position of the land in the image based on the determined position of the element, and an inspection unit that inspects the solder piece or component on the land using the position of the land determined by the land determination unit as a reference.
    Type: Application
    Filed: July 19, 2017
    Publication date: February 15, 2018
    Applicant: OMRON Corporation
    Inventors: Hiroyuki MORI, Mayuko KISHIMOTO, Shimpei FUJII, Katsuki NAKAJIMA
  • Information processing apparatus, and information processing method
    Patent number: 7346409
    Abstract: There is provided an information processing apparatus that allows a user to understand what kinds of causes are accumulated stepwise in what kind of order to cause abnormality and due to what kinds of reasons respective causes occur from direct causes of the respective causes.
    Type: Grant
    Filed: May 26, 2006
    Date of Patent: March 18, 2008
    Assignee: Omron Corporation
    Inventors: Yasuaki Nakajima, Mayuko Kishimoto, Akira Matsushita
  • Information processing apparatus, and information processing method
    Publication number: 20070005853
    Abstract: There is provided an information processing apparatus that allows a user to understand what kinds of causes are accumulated stepwise in what kind of order to cause abnormality and due to what kinds of reasons respective causes occur from direct causes of the respective causes.
    Type: Application
    Filed: May 26, 2006
    Publication date: January 4, 2007
    Inventors: Yasuaki Nakajima, Mayuko Kishimoto, Akira Matsushita