Abstract: Systems and methods are disclosed for generation and testing of integrated circuit designs with point-to-point connections between modules. These may allow for the rapid design and testing (e.g. silicon testing) of processors and SoCs. For example, type parameterization may be used to generate point-to-point connections in a flexible manner. For example, a point-to-point connection between the source module and the sink module that includes one or more named wires specified by bundle type may be automatically generated based on using the bundle type as a type parameterization input. For example, these system and methods may be used to rapidly connect a custom processor design, including one or more IP cores, to a standard input/output shell for a SoC design to facilitate rapid silicon testing of the custom processor design.

Abstract: Systems and methods are disclosed for generation and testing of integrated circuit designs with point-to-point connections between modules. These may allow for the rapid design and testing (e.g. silicon testing) of processors and SoCs. For example, type parameterization may be used to generate point-to-point connections in a flexible manner. For example, a point-to-point connection between the source module and the sink module that includes one or more named wires specified by bundle type may be automatically generated based on using the bundle type as a type parameterization input. For example, these system and methods may be used to rapidly connect a custom processor design, including one or more IP cores, to a standard input/output shell for a SoC design to facilitate rapid silicon testing of the custom processor design.

Abstract: Systems and methods are disclosed for generation and testing of integrated circuit designs with point-to-point connections between modules. These may allow for the rapid design and testing (e.g. silicon testing) of processors and SoCs. For example, type parameterization may be used to generate point-to-point connections in a flexible manner. For example, a point-to-point connection between the source module and the sink module that includes one or more named wires specified by bundle type may be automatically generated based on using the bundle type as a type parameterization input. For example, these system and methods may be used to rapidly connect a custom processor design, including one or more IP cores, to a standard input/output shell for a SoC design to facilitate rapid silicon testing of the custom processor design.

Abstract: Systems and methods are disclosed for generation and testing of integrated circuit designs with point-to-point connections between modules. These may allow for the rapid design and testing (e.g. silicon testing) of processors and SoCs. For example, type parameterization may be used to generate point-to-point connections in a flexible manner. For example, a point-to-point connection between the source module and the sink module that includes one or more named wires specified by bundle type may be automatically generated based on using the bundle type as a type parameterization input. For example, these system and methods may be used to rapidly connect a custom processor design, including one or more IP cores, to a standard input/output shell for a SoC design to facilitate rapid silicon testing of the custom processor design.

Abstract: A method and system for a countermeasure to power analysis attacks, where an impedance element is coupled to a power source providing power to a cryptographic module causing a measurable power supply noise, a timing sequence is generated, and the impedance element is decoupled from the power source based on the timing sequence to cause the measurable power supply noise to vary according to the timing sequence.

Abstract: A method and system for a countermeasure to power analysis attacks, where an impedance element is coupled to a power source providing power to a cryptographic module causing a measurable power supply noise, a timing sequence is generated, and the impedance element is decoupled from the power source based on the timing sequence to cause the measurable power supply noise to vary according to the timing sequence.

Abstract: The invention relates to methods and devices for measuring pulsus paradoxus. The methods herein employ a combination of one or more forms of waveform analysis for the purpose of measuring pulsus paradoxus and diagnosing respiratory distress. The methods also combine measurements of pulsus paradoxus and physician assessments to diagnose respiratory distress. The methods also combine measurements of pulsus paradoxus and percentage oxygenated hemoglobin to diagnose respiratory distress. The devices of this invention employ pulse oximeters, arterial tonometers, finometers, or processors for the purpose of implementing the methods of the invention.