Abstract: A diagnostic system for a DC-DC voltage converter having a high voltage switch, a low voltage switch, and a DC-DC voltage converter control circuit is provided. The system includes first and second tri-state buffer ICs and a microcontroller. The first tri-state buffer IC receives a first shutdown indicator voltage from the DC-DC voltage converter control circuit indicating that a first plurality of FET switches in a high side FET IC and a second plurality of FET switches in a low side FET IC have been transitioned to an open operational state. The first tri-state buffer IC outputs a second shutdown indicator voltage to the microcontroller that indicates that the first and second plurality of FET switches have been transitioned to the open operational state.

Abstract: A diagnostic system for a DC-DC voltage converter is provided. A first temperature sensor generates a first temperature signal associated with a buck mode integrated circuit. A first analog multiplexer outputs the first temperature signal to a first analog-to-digital converter which generates a first temperature value. A second temperature sensor generates a second temperature signal associated with a boost mode integrated circuit. A second analog multiplexer outputs the second temperature signal to a second analog-to-digital converter which generates a second temperature value. A microcontroller generates control signals to command first and second bi-directional switches in the DC-DC voltage converter to each transition to an open operational state if the first temperature value is greater than a first threshold temperature value.

Abstract: A diagnostic system for a DC-DC voltage converter is provided. The DC-DC voltage converter has a high voltage bi-directional MOSFET switch. The high voltage bi-directional MOSFET switch has a first node and a second node. The microcontroller samples a first voltage at the first node at a first sampling rate utilizing a first common channel in a first bank of channels to obtain a first predetermined number of voltage samples. The microcontroller determines a first number of voltage samples in the first predetermined number of voltage samples in which the first voltage is less than a first threshold voltage. The microcontroller sets a first voltage diagnostic flag equal to a first fault value if the first number of voltage samples is greater than a first threshold number of voltage samples indicating a voltage out of range low fault condition for the analog-to-digital converter.

Abstract: A power supply system having a detection system for determining an unbalanced current condition and an over-current condition in a DC-DC voltage converter is provided. The detection system has a detection circuit that outputs a first diagnostic voltage indicating an unbalanced current condition between first and second switching banks in the DC-DC voltage converter based on a first voltage and an average voltage, or an over-current condition in the first switching bank based on the first voltage. The detection circuit outputs a second diagnostic voltage indicating the unbalanced current condition between the first and second switching banks in the DC-DC voltage converter based on a second voltage and the average voltage, or an over-current condition in the second switching bank based on the second voltage.

Abstract: A control system for controlling a DC-DC voltage converter circuit is provided. An output voltage controller outputs a DC-DC voltage converter control voltage to an input control terminal to increase a switching duty cycle within the DC-DC voltage converter circuit when the low voltage is less than an output reference voltage. An input voltage controller reduces the DC-DC voltage converter control voltage at the input control terminal of the DC-DC voltage converter circuit when a high voltage is less than an input reference voltage to reduce the switching duty cycle within the DC-DC voltage converter circuit.

Abstract: A diagnostic system for a DC-DC voltage converter having a low voltage bi-directional MOSFET switch is provided. The low voltage bi-directional MOSFET switch has first and second nodes. The microcontroller samples a first voltage at the first node at a first sampling rate utilizing a first common channel in a first bank of channels to obtain a first predetermined number of voltage samples. The microcontroller determines a first number of voltage samples in the first predetermined number of voltage samples in which the first voltage is less than a first threshold voltage. The microcontroller sets a first voltage diagnostic flag equal to a first fault value if the first number of voltage samples is greater than a first threshold number of voltage samples indicating a voltage out of range low fault condition for the analog-to-digital converter.

Abstract: A control system for controlling a DC-DC voltage converter circuit is provided. An output voltage controller outputs a DC-DC voltage converter control voltage to an input control terminal to increase a switching duty cycle within the DC-DC voltage converter circuit when the low voltage is less than an output reference voltage. An input voltage controller reduces the DC-DC voltage converter control voltage at the input control terminal of the DC-DC voltage converter circuit when a high voltage is less than an input reference voltage to reduce the switching duty cycle within the DC-DC voltage converter circuit.

Abstract: A power supply system having a detection system for determining an unbalanced current condition and an over-current condition in a DC-DC voltage converter is provided. The detection system has a detection circuit that outputs a first diagnostic voltage indicating an unbalanced current condition between first and second switching banks in the DC-DC voltage converter based on a first voltage and an average voltage, or an over-current condition in the first switching bank based on the first voltage. The detection circuit outputs a second diagnostic voltage indicating the unbalanced current condition between the first and second switching banks in the DC-DC voltage converter based on a second voltage and the average voltage, or an over-current condition in the second switching bank based on the second voltage.

Abstract: A diagnostic system for a DC-DC voltage converter having a high voltage switch, a low voltage switch, and a DC-DC voltage converter control circuit is provided. The system includes first and second tri-state buffer ICs and a microcontroller. The first tri-state buffer IC receives a first shutdown indicator voltage from the DC-DC voltage converter control circuit indicating that a first plurality of FET switches in a high side FET IC and a second plurality of FET switches in a low side FET IC have been transitioned to an open operational state. The first tri-state buffer IC outputs a second shutdown indicator voltage to the microcontroller that indicates that the first and second plurality of FET switches have been transitioned to the open operational state.

Abstract: A diagnostic system for a DC-DC voltage converter is provided. The diagnostic system includes a first temperature sensor generating a first output voltage indicating a temperature level of a high voltage bi-directional MOSFET switch. The diagnostic system includes a microcontroller that samples the first output voltage at a first sampling rate utilizing a first channel in a first bank of channels to obtain a first predetermined number of voltage samples. The microcontroller determines a first number of voltage samples in the first predetermined number of voltage samples in which the first output voltage is greater than a first threshold voltage. The microcontroller sets a first temperature diagnostic flag equal to a first fault value if the first number of voltage samples is greater than a first threshold number of voltage samples indicating the high voltage bi-directional MOSFET switch has an over-temperature condition.

Abstract: A diagnostic system for a DC-DC voltage converter is provided. A first temperature sensor generates a first temperature signal associated with a buck mode integrated circuit. A first analog multiplexer outputs the first temperature signal to a first analog-to-digital converter which generates a first temperature value. A second temperature sensor generates a second temperature signal associated with a boost mode integrated circuit. A second analog multiplexer outputs the second temperature signal to a second analog-to-digital converter which generates a second temperature value. A microcontroller generates control signals to command first and second bi-directional switches in the DC-DC voltage converter to each transition to an open operational state if the first temperature value is greater than a first threshold temperature value.

Abstract: A diagnostic system for a DC-DC voltage converter is provided. The DC-DC voltage converter has a high voltage bi-directional MOSFET switch. The high voltage bi-directional MOSFET switch has a first node and a second node. The microcontroller samples a first voltage at the first node at a first sampling rate utilizing a first common channel in a first bank of channels to obtain a first predetermined number of voltage samples. The microcontroller determines a first number of voltage samples in the first predetermined number of voltage samples in which the first voltage is less than a first threshold voltage. The microcontroller sets a first voltage diagnostic flag equal to a first fault value if the first number of voltage samples is greater than a first threshold number of voltage samples indicating a voltage out of range low fault condition for the analog-to-digital converter.

Abstract: A diagnostic system for a DC-DC voltage converter is provided. The diagnostic system includes a first temperature sensor generating a first output voltage indicating a temperature level of a high voltage bi-directional MOSFET switch. The diagnostic system includes a microcontroller that samples the first output voltage at a first sampling rate utilizing a first channel in a first bank of channels to obtain a first predetermined number of voltage samples. The microcontroller determines a first number of voltage samples in the first predetermined number of voltage samples in which the first output voltage is greater than a first threshold voltage. The microcontroller sets a first temperature diagnostic flag equal to a first fault value if the first number of voltage samples is greater than a first threshold number of voltage samples indicating the high voltage bi-directional MOSFET switch has an over-temperature condition.

Abstract: A diagnostic system for a DC-DC voltage converter having a low voltage bi-directional MOSFET switch is provided. The low voltage bi-directional MOSFET switch has first and second nodes. The microcontroller samples a first voltage at the first node at a first sampling rate utilizing a first common channel in a first bank of channels to obtain a first predetermined number of voltage samples. The microcontroller determines a first number of voltage samples in the first predetermined number of voltage samples in which the first voltage is less than a first threshold voltage. The microcontroller sets a first voltage diagnostic flag equal to a first fault value if the first number of voltage samples is greater than a first threshold number of voltage samples indicating a voltage out of range low fault condition for the analog-to-digital converter.

Abstract: A diagnostic system for a power supply having first and second output terminals that output first and second reference voltages, respectively, is provided. The diagnostic system includes a microcontroller having an analog-to-digital converter with first and second banks of channels. The microcontroller samples the first reference voltage at a first sampling rate utilizing a first common channel in the first bank of channels to obtain a first predetermined number of voltage samples. The microcontroller determines a first number of voltage samples in the first predetermined number of voltage samples in which the first reference voltage was outside of a predetermined voltage range. The microcontroller sets a first power supply diagnostic flag equal to a first fault value if the first number of voltage samples is greater than a first threshold number of voltage samples.