Abstract: An optical phase grating produces an interference pattern rich in intensity and spatial-frequency information from the external scene. The grating includes an odd number of repeated sets of adjacent horizontal portions, separated by steps, that fill an area that radiates outward from a central region. At a given distance from the central region and within the area of the phase grating, each of the first horizontal portions is of a first width that differs from a second width of the adjacent second horizontal portions. The interference patterns produced by the grating can be processed to extract images and other information of interest about an imaged scene.

Abstract: Described are imaging systems that employ diffractive structures as focusing optics optimized to detect visual edges (e.g., slits or bars). The diffractive structures produce edge responses that are relatively insensitive to wavelength, and can thus be used to precisely measure edge position for panchromatic sources over a wide angle of view. Simple image processing can improve measurement precision. Field-angle measurements can be made without the aid of lenses, or the concomitant cost, bulk, and complexity.

Abstract: An optical phase grating produces an interference pattern rich in intensity and spatial-frequency information from the external scene. The grating includes an odd number of repeated sets of adjacent horizontal portions, separated by steps, that fill an area that radiates outward from a central region. At a given distance from the central region and within the area of the phase grating, each of the first horizontal portions is of a first width that differs from a second width of the adjacent second horizontal portions. The interference patterns produced by the grating can be processed to extract images and other information of interest about an imaged scene.

Abstract: Described are imaging systems that employ diffractive structures as focusing optics optimized to detect visual edges (e.g., slits or bars). The diffractive structures produce edge responses that are relatively insensitive to wavelength, and can thus be used to precisely measure edge position for panchromatic sources over a wide angle of view. Simple image processing can improve measurement precision. Field-angle measurements can be made without the aid of lenses, or the concomitant cost, bulk, and complexity.