Abstract: Systems and methods are provided for three-dimensional scanning and measurement by a device having a processor. The processor is configured to receive images of an object from at least two angles; preprocess the images using morphological refinement; create a source point cloud based on the images; remove outliers from the source point cloud; globally register the source point cloud to generate a transformed source point cloud; compare the transformed source point cloud with a target point cloud to generate a stitched point cloud that thereby creates a stitched 3D model; measure the resulting stitched 3D model; and provide the resulting stitched 3D model for comparison to a digitized item to assess sizing of the 3D model to the item.

Abstract: Systems and methods are provided for three-dimensional scanning and measurement by a device having a processor. The processor is configured to receive images of an object from at least two angles; preprocess the images using morphological refinement; create a source point cloud based on the images; remove outliers from the source point cloud; globally register the source point cloud to generate a transformed source point cloud; compare the transformed source point cloud with a target point cloud to generate a stitched point cloud that thereby creates a stitched 3D model; measure the resulting stitched 3D model; and provide the resulting stitched 3D model for comparison to a digitized item to assess sizing of the 3D model to the item.

Abstract: Systems and methods are provided for three-dimensional scanning and measurement by a device having a processor. The processor is configured to receive images of an object from at least. two angles; preprocess the images using morphological refinement; create a source point cloud based on the images; remove outliers from the source point cloud; globally register the source point cloud to generate a transformed source point cloud; compare the transformed source point cloud with a target point cloud to generate a stitched point cloud that thereby creates a stitched 3D model; measure the resulting stitched 3D model; and provide the resulting stitched 3D model for comparison to a digitized item to assess sizing of the 3D model to the item.

Abstract: Systems and methods are provided for three-dimensional scanning and measurement by a device having a processor. The processor is configured to receive images of an object from at least .two angles; preprocess the images using morphological refinement; create a source point cloud based on the images; remove outliers from the source point cloud; globally register the source point cloud to generate a transformed source point cloud; compare the transformed source point cloud with a target point cloud to generate a stitched point cloud that thereby creates a stitched 3D model; measure the resulting stitched 3D model; and provide the resulting stitched 3D model for comparison to a digitized item to assess sizing of the 3D model to the item.

Abstract: Systems and methods are provided for three-dimensional scanning and measurement by a device having a processor. The processor is configured to receive images of an object from at least two angles; preprocess the images using morphological refinement; create a source point cloud based on the images; remove outliers from the source point cloud; globally register the source point cloud to generate a transformed source point cloud; compare the transformed source point cloud with a target point cloud to generate a stitched point cloud that thereby creates a stitched 3D model; measure the resulting stitched 3D model; and provide the resulting stitched 3D model for comparison to a digitized item to assess sizing of the 3D model to the item.

Abstract: Systems and methods are provided for three-dimensional scanning and measurement by a device having a processor. The processor is configured to receive images of an object from at least .two angles; preprocess the images using morphological refinement; create a source point cloud based on the images; remove outliers from the source point cloud; globally register the source point cloud to generate a transformed source point cloud; compare the transformed source point cloud with a target point cloud to generate a stitched point cloud that thereby creates a stitched 3D model; measure the resulting stitched 3D model; and provide the resulting stitched 3D model for comparison to a digitized item to assess sizing of the 3D model to the item.

Abstract: Systems and methods are provided for three-dimensional scanning and measurement by a device having a processor. The processor is configured to receive images of an object from at least two angles; preprocess the images using morphological refinement; create a source point cloud based on the images; remove outliers from the source point cloud; globally register the source point cloud to generate a transformed source point cloud; compare the transformed source point cloud with a target point cloud to generate a stitched point cloud that thereby creates a stitched 3D model; measure the resulting stitched 3D model; and provide the resulting stitched 3D model for comparison to a digitized item to assess sizing of the 3D model to the item.

Abstract: Systems and methods are provided for three-dimensional scanning and measurement by a device having a processor. The processor is configured to receive images of an object from at least two angles; preprocess the images using morphological refinement; create a source point cloud based on the images; remove outliers from the source point cloud; globally register the source point cloud to generate a transformed source point cloud; compare the transformed source point cloud with a target point cloud to generate a stitched point cloud that thereby creates a stitched 3D model; measure the resulting stitched 3D model; and provide the resulting stitched 3D model for comparison to a digitized item to assess sizing of the 3D model to the item.