Abstract: The apparatus for a test and measurement instrument consists of multiple integrated circuits with each integrated circuit being connected to its own memory controller. At least one of the integrated circuits is a specialized integrated circuit, which may be a graphics processing unit, a digital signal processor, or a field-programmable gate array. Each memory controller is connected to its own memory. The integrated circuits are connected in a circular arrangement by multiple high-speed interconnects. A bridge is connected to at least the first and last integrated circuits. A system bus connects the bridge to an acquisition module. The acquisition module has a signal bus interface with the system bus being connected to the acquisition module and having its own acquisition hardware. The acquisition hardware is a direct memory access machine that can transfer data to any portion of the memory. There is a signal source connected to the signal bus interface.

Abstract: Apparatuses for a test and measurement instrument provide an instrument capable of handling acquisition, transfer, analysis, and display of large quantities of waveform data and complex waveforms. The apparatus for a test and measurement instrument consists of multiple processors with each processor being connected to its own memory controller. Each memory controller is connected to its own memory. The processors are connected in a circular arrangement by multiple high-speed interconnects. A bridge is connected to at least the first and last processors. A system bus connects the bridge to an acquisition module. The acquisition module has a signal bus interface with the system bus being connected to the acquisition module and having its own acquisition hardware. The acquisition hardware is a direct memory access machine that can transfer data to any portion of the memory. There is a signal source connected to the signal bus interface.

Abstract: Apparatuses for a test and measurement instrument provide an instrument capable of handling acquisition, transfer, analysis, and display of large quantities of waveform data and complex waveforms. The apparatus for a test and measurement instrument consists of multiple processors with each processor being connected to its own memory controller. Each memory controller is connected to its own memory. The processors are connected in a circular arrangement by multiple high-speed interconnects. There are multiple bridges with each processor being connected to its own bridge. There are multiple system buses with each bridge been connected to its own system bus. A housing encloses the processors, memory controllers, high-speed interconnects, and bridges.

Abstract: Apparatuses for a test and measurement instrument provide an instrument capable of handling acquisition, transfer, analysis, and display of large quantities of waveform data and complex waveforms. The apparatus for a test and measurement instrument consists of multiple processors with each processor being connected to its own memory controller. Each memory controller is connected to its own memory. The processors are connected in a circular arrangement by multiple high-speed interconnects. A bridge is connected to at least the first and last processors. A system bus connects the bridge to an acquisition module. The acquisition module has a signal bus interface with the system bus being connected to the acquisition module and having its own acquisition hardware. The acquisition hardware is a direct memory access machine that can transfer data to any portion of the memory. There is a signal source connected to the signal bus interface.

Abstract: Apparatuses for a test and measurement instrument provide a scalable test and measurement instrument capable of handling the acquisition, transfer, analysis, and display of large quantities of waveform data as well as complex waveforms. The apparatus for a test and measurement instrument consists of multiple processors with memory connected to the processors. There are multiple bridges with each processor being connected to its own bridge. There are multiple system buses with each bridge been connected to its own system bus. There are multiple acquisition modules having signal bus interfaces with each system bus being connected to its own acquisition module and having its own acquisition hardware. Each piece of acquisition hardware is a direct memory access machine that can transfer data to any portion of the memory. There are multiple signal sources with each signal source being connected to its own signal bus interface.

Abstract: The apparatus for a test and measurement instrument consists of multiple integrated circuits with each integrated circuit being connected to its own memory controller. At least one of the integrated circuits is a specialized integrated circuit, which may be a graphics processing unit, a digital signal processor, or a field-programmable gate array. Each memory controller is connected to its own memory. The integrated circuits are connected in a circular arrangement by multiple high-speed interconnects. A bridge is connected to at least the first and last integrated circuits. A system bus connects the bridge to an acquisition module. The acquisition module has a signal bus interface with the system bus being connected to the acquisition module and having its own acquisition hardware. The acquisition hardware is a direct memory access machine that can transfer data to any portion of the memory. There is a signal source connected to the signal bus interface.

Abstract: Apparatuses for a test and measurement instrument provide an instrument capable of handling acquisition, transfer, analysis, and display of large quantities of waveform data and complex waveforms. The apparatus includes multiple processors with each processor being connected to its own memory controller, wherein each memory controller is connected to its own memory. Each processor is connected to its own respective bridge, and each respective bridge is connected to its own respective system bus. Each respective system bus is connected to its own respective acquisition module having its own acquisition hardware. Each piece of acquisition hardware is a direct memory access machine that can transfer data to any portion of the memory. Each of multiple signal sources is connected to its own signal bus interface.

Abstract: Apparatuses for a test and measurement instrument provide an instrument capable of handling acquisition, transfer, analysis, and display of large quantities of waveform data and complex waveforms. The apparatus for a test and measurement instrument consists of multiple processors with each processor being connected to its own memory controller. Each memory controller is connected to its own memory. The processors are connected in a circular arrangement by multiple high-speed interconnects. There are multiple bridges with each processor being connected to its own bridge. There are multiple system buses with each bridge been connected to its own system bus. A housing encloses the processors, memory controllers, high-speed interconnects, and bridges.

Abstract: The method for a test and measurement instrument includes the steps of: providing a test and measurement instrument; attaching a Device Under Test (DUT) to a signal source to be measured with at least one channel of the signal source in electronic communication with at least one of the acquisition modules; collecting data from the DUT; storing the collected data from the DUT in the acquisition module(s); dividing the collected data from the DUT into a plurality of pieces; assigning the plurality of pieces to the plurality of system buses; transferring the plurality of pieces to the memory connected to the processors by moving the plurality of pieces in parallel over their assigned system buses; processing the plurality of pieces with the plurality of processors; and displaying the results obtained by processing the priority of pieces with the plurality of processors.