Abstract: A method of enabling variable latency data transfers in an electronic device, such as an FPGA with an embedded processor, is described. According to one aspect of the invention, a method comprises steps of providing an address for a data transfer between a memory controller and a peripheral device; coupling an address valid signal to the peripheral device; transferring the data between the memory controller and the peripheral device; and receiving a data transfer complete signal at the memory controller. According to another aspect of the invention, an integrated circuit enabling a variable latency data transfer is described. The integrated circuit comprises peripheral device; a memory controller coupled to the peripheral device; an address valid signal coupled from the memory controller to the peripheral device; and a transfer complete signal coupled from the peripheral device to the memory controller.

Abstract: Interconnecting logic provides connectivity of an embedded fixed logic circuit, or circuits, with programmable logic fabric of a programmable gate array such that the fixed logic circuit functions as an extension of the programmable logic fabric. The interconnecting logic includes interconnecting tiles and may further include interfacing logic. The interconnecting tiles provide selective connectivity between inputs and/or outputs of the fixed logic circuit and interconnect of the programmable logic fabric. The interfacing logic, when included, provides logic circuitry that conditions data transfers between the fixed logic circuit and the programmable logic fabric. In one operation, the programmable logic fabric is configured prior to the startup/boot sequence of the fixed logic circuit. In another operation, the fixed logic circuit is started up and is employed to configure the programmable logic fabric.

Abstract: The various embodiments of the present invention relate to circuit verification. According to one embodiment of the invention, a method of enabling timing verification of a circuit design comprises steps of generating a timing model of a processor core for a static timing analysis tool; coupling timing data related to the processor core to the static timing analysis tool; extracting resistance and capacitance data for interconnect circuits of the circuit design; coupling the resistance and capacitance data for the interconnect circuits to the static timing analysis tool; and verifying the performance of the circuit design using the static timing analysis tool. According to another embodiment of the invention, a system for enabling timing verification of a circuit design is described.

Abstract: Method and apparatus for generating a test program for an integrated circuit having an embedded processor. One embodiment has a system which includes an embedded microprocessor; a plurality of assembly language instructions stored in a memory, where the assembly language instructions substantially exercise a critical path or a path closest to the critical path in the embedded microprocessor; and programmable test circuitry having a programmable clock circuit for providing a multiplied clock signal to the embedded microprocessor in order to execute the assembly language instructions.

Abstract: According to one embodiment of the invention, a method of accessing instruction data from a memory comprises steps of specifying a predetermined address of a memory for storing instruction data; writing instruction data to the predetermined address in the memory; reading the instruction data from the predetermined address after the step of writing instruction data; and determining whether the instruction data is valid. According to another embodiment of the invention, a method describes a method of accessing instruction data from a memory by way of first and second data buses. According to a further embodiment, instruction data read back from the memory is multiplexed to a memory controller. A circuit for accessing instruction data written to a memory is also described.

Abstract: A method of verifying a circuit implementing a data transfer protocol is disclosed. According to one embodiment of the invention, the method comprises steps of providing a block under test that implements a variable latency data transfer protocol; coupling a verification circuit to the block under test; enabling variable latency data transfers to the block under test; and verifying that the block under test is implementing the variable latency data transfer protocol. The method could be implemented to verify the operation of a memory controller of an FPGA, for example. According to another embodiment, a method enabling a multi-stage verification is disclosed. Finally, specific implementations of a verification circuit coupled to an on-chip memory controller of an FPGA are disclosed.

Abstract: Method and apparatus for generating a test program for an integrated circuit having an embedded processor. One embodiment has a system which includes an embedded microprocessor; a plurality of assembly language instructions stored in a memory, where the assembly language instructions substantially exercise a critical path or a path closest to the critical path in the embedded microprocessor; and programmable test circuitry having a programmable clock circuit for providing a multiplied clock signal to the embedded microprocessor in order to execute the assembly language instructions.

Abstract: A method of verifying a circuit implementing a data transfer protocol is disclosed. According to one embodiment of the invention, the method comprises steps of providing a block under test that implements a variable latency data transfer protocol; coupling a verification circuit to the block under test; enabling variable latency data transfers to the block under test; and verifying that the block under test is implementing the variable latency data transfer protocol. The method could be implemented to verify the operation of a memory controller of an FPGA, for example. According to another embodiment, a method enabling a multi-stage verification is disclosed. Finally, specific implementations of a verification circuit coupled to an on-chip memory controller of an FPGA are disclosed.

Abstract: Generation of consistent connection data for a first circuit embedded in a second circuit. In one approach, a master file is established with design data that includes for each pin in the embedded circuit, a hardware description language (HDL) pin name from an HDL description of the embedded circuit, a schematic pin name of the second circuit to which a corresponding pin in the embedded circuit is to connect, a signal direction associated with the pin, and a name of a clock to trigger a signal on the pin. A plurality of design views are generated from the master file. Each design view has a unique format relative to the other design views and includes for each pin in the embedded circuit design, at least the HDL pin name, the associated schematic pin name, and a signal direction associated with the pin.

Abstract: A bus arbiter controls the bus frequency in a system that includes a plurality of bus masters and a plurality of slaves. The bus frequency is determined according to the internal frequency of the devices that are part of the transaction. Additionally, the bus frequency is set according to the length of the bus between the devices that are a part of the transaction and, correspondingly, the expected amount of impedance there between. As a part of the present invention, a master seeking bus resources to initiate a transaction generates a bus request and a destination address to the bus arbiter so that it may determine a corresponding bus frequency in advance. Thereafter, the bus arbiter sets the bus frequency to a value that corresponds to the transaction that is about to take place thereon. Next, the bus arbiter issues a grant signal to enable the master to use the bus. Each slave device for a transaction then generates or receives sample cycle signals indicating when a signal should be read on the bus.

Abstract: During a reset condition or prior to system initialization of an FPGA-based system (100), a FPGA (102) can be pre-configured by loading a value from a memory cell (108) into at least one flip-flop (312) of the FPGA, which represents a configuration register for an FPGA memory controller (106). The FPGA memory controller can be configured using the value loaded in the flip-flop. The value loaded into the flip-flop from the memory cell can be a default value previously stored in the memory cell.

Abstract: Interconnecting logic provides connectivity of an embedded fixed logic circuit, or circuits, with programmable logic fabric of a programmable gate array such that the fixed logic circuit functions as an extension of the programmable logic fabric. The interconnecting logic includes interconnecting tiles and may further include interfacing logic. The interconnecting tiles provide selective connectivity between inputs and/or outputs of the fixed logic circuit and the interconnects of the programmable logic fabric. The interfacing logic, when included, provides logic circuitry that conditions data transfers between the fixed logic circuit and the programmable logic fabric.

Abstract: A data processing system having a user configurable memory controller, one or more local block RAMs, one or more global block RAMs and a processor core can be configured in a single field programmable gate array (FPGA). The address depth of the global block RAMs and the number of wait states can be selected by a user, and they can be set either prior to configuration of the FPGA or programmed using instructions of the processor core. The number of wait states of the local block RAM is also user selectable. An algorithm that can optimize the address depth and the number of wait states to achieve a performance level is also disclosed. The present invention can be applied to designs having separate instruction and data sides.

Abstract: A data processing system having a user configurable memory controller, one or more block RAMS, and a processor core can be configured in a single field programmable gate array (FPGA). The address depth of the block RAMs and the number of wait states can be selected by a user, and they can be set either prior to configuration of the FPGA or programmed using instructions of the processor core. An algorithm that can optimize the address depth and the number of wait states to achieve a performance level is also disclosed. The present invention can be applied to designs having separate instruction and data sides.

Abstract: A method is provided for scan testing that eliminates the need for balancing internal scan clock delays. According to the method of the invention, multiple scan clocks are provided, each being provided to a different set of flip-flops. The skew between the active edges of the scan clocks is deliberately increased to the point where each set of flip-flops has plenty of time to settle before the next set of flip-flops receives a clock pulse. Because scan testing is typically performed at clock speeds of only about 1 Megahertz, there is time for each of the scan clocks to pulse separately from all the others, without increasing the test time. The increased delay between scan clock pulses eliminates the need for balancing internal delays on the scan clock paths, thereby greatly reducing the number of placement and routing iterations required to achieve a functional design.