Abstract: First and second sensing circuits are coupled to first and second data lines, respectively, and sense levels of current leakage or a memory cell state on the first and second data lines. First and second keeper circuits are coupled to the first and second data lines, respectively, and drive the first and second data lines by a voltage supply through biased transistors. First and second leakage latches are coupled to receive and latch state of signals output from the first and second sensing circuits, respectively. A control circuit is coupled to the first leakage latch, second leakage latch, and outputs of the first and second sensing circuits. The control circuit is configured to select either the signal output from the first sensing circuit or the signal output from the second sensing circuit in response to states of the first and second leakage latches.

Abstract: Interconnecting logic provides connectivity of an embedded fixed logic circuit, or circuits, with programmable logic fabric of a programmable gate array such that the fixed logic circuit functions as an extension of the programmable logic fabric. The interconnecting logic includes interconnecting tiles and may further include interfacing logic. The interconnecting tiles provide selective connectivity between inputs and/or outputs of the fixed logic circuit and interconnect of the programmable logic fabric. The interfacing logic, when included, provides logic circuitry that conditions data transfers between the fixed logic circuit and the programmable logic fabric. In one operation, the programmable logic fabric is configured prior to the startup/boot sequence of the fixed logic circuit. In another operation, the fixed logic circuit is started up and is employed to configure the programmable logic fabric.

Abstract: A method and system for converting an architecture-specific design of a first type into an architecture-specific design of a second type such that race conditions and other anomalies are detected in the second type. By identifying routing delays in a first architecture and what those same routing delays would be in a second architecture, the method and system verify that a design has been properly converted. The method and system are applicable to the conversion of programmable interconnect logic devices to mask programmable logic devices. For example, a method for verifying timing for a design implemented in a new device when the design is to be moved from an old device. The method is particularly useful for verifying timing in a mask programmable device (HardWire) when the design is being converted from a field programmable device (FPGA).

Abstract: A method and system for converting an architecture-specific design of a first type into an architecture-specific design of a second type such that race conditions and other anomalies are detected in the second type. By identifying routing delays in a first architecture and what those same routing delays would be in a second architecture, the method and system verify that a design has been properly converted. The method and system are applicable to the conversion of programmable interconnect logic devices to mask programmable logic devices. For example, a method for verifying timing for a design implemented in a new device when the design is to be moved from an old device. The method is particularly useful for verifying timing in a mask programmable device (HardWire) when the design is being converted from a field programmable device (FPGA).