Patents by Inventor Mei You

Mei You has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240379420
    Abstract: Embodiments herein provide for oxygen based treatment of low-k dielectric layers deposited using a flowable chemical vapor deposition (FCVD) process. Oxygen based treatment of the FCVD deposited low-k dielectric layers desirably increases the Ebd to capacitance and reliability of the devices while removing voids.
    Type: Application
    Filed: July 23, 2024
    Publication date: November 14, 2024
    Inventors: Shi YOU, He REN, Naomi YOSHIDA, Nikolaos BEKIARIS, Mehul NAIK, Martin Jay SEAMONS, Jingmei LIANG, Mei-Yee SHEK
  • Publication number: 20240300950
    Abstract: Described herein is N-[4-[4-(4-morpholinyl)-7H-pyrrolo[2,3-d]pyrimidin-6-yl]phenyl]-4-[[3(R)-[(1-oxo-2-propen-1-yl)amino]-1-piperidinyl]methyl]-2-pyridinecarboxamide (Compound A) (Formula I), including crystalline forms, solvates, and pharmaceutically acceptable salts thereof. Also disclosed are pharmaceutical compositions or pharmaceutical formulations that include the compound, as well as methods of using the compound, alone or in combination with other therapeutic agents, for the treatment of autoimmune diseases or conditions, heteroimmune diseases or conditions, cancer, including lymphoma, diabetes, and inflammatory diseases or conditions.
    Type: Application
    Filed: January 30, 2024
    Publication date: September 12, 2024
    Inventors: Satish Goud Puppali, James T. Palmer, Thorsten A. Kirschberg, Angelina Sau Man Wong, Heow Meng Tan, Jay Li, Ming Lin, Ming Gao, Junlu Ding, Shuang Li, Yuyao GU, Hongyan He, Bo Zheng, Yanjing Zhou, Mei You, Yihong Qiu
  • Patent number: 12046508
    Abstract: Embodiments herein provide for oxygen based treatment of low-k dielectric layers deposited using a flowable chemical vapor deposition (FCVD) process. Oxygen based treatment of the FCVD deposited low-k dielectric layers desirably increases the Ebd to capacitance and reliability of the devices while removing voids.
    Type: Grant
    Filed: February 10, 2023
    Date of Patent: July 23, 2024
    Assignee: APPLIED MATERIALS, INC.
    Inventors: Shi You, He Ren, Naomi Yoshida, Nikolaos Bekiaris, Mehul Naik, Martin Jay Seamons, Jingmei Liang, Mei-Yee Shek