Patents by Inventor Meijuan ZHANG

Meijuan ZHANG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12347085
    Abstract: Provided is a method and device for detecting defect, a computer readable storage medium and an electronic device, the method including: acquiring (S310) a detection task, and acquiring various types of images corresponding to the detection task; acquiring (S320) defect detection models trained by a same initial model corresponding to the types of the images respectively; and obtaining (S330) defect detection results by performing defect detection on respective type of images using the defect detection model corresponding to the type of the images.
    Type: Grant
    Filed: May 21, 2021
    Date of Patent: July 1, 2025
    Assignees: BEIJING ZHONGXIANGYING TECHNOLOGY CO., LTD., BOE TECHNOLOGY GROUP CO., LTD.
    Inventors: Yaoping Wang, Meijuan Zhang, Wangqiang He, Dong Chai, Hong Wang
  • Publication number: 20240349423
    Abstract: The present disclosure relates to the technical field of metal foils. Disclosed is a metal foil, including a conductive layer and a bearing layer, the conductive layer and the bearing layer being stacked. The conductive layer is configured to manufacture a conductive line. When a circuit board is manufactured using the metal foil, the bearing layer is separated from the conductive layer by a first etching solution, and a roughness Rz of a surface, close to the conductive layer, of the bearing layer is less than or equal to 2 microns. When the circuit board is manufactured using the metal foil, a surface of the conductive line is substantially flush with a surface of a substrate after the bearing layer is removed, and the surface roughness of the conductive line is low, so that the product requirement for high dimensional accuracy may be satisfied. Meanwhile, embodiments of the present disclosure further correspondingly provide a circuit board and a method for manufacturing the circuit board.
    Type: Application
    Filed: May 30, 2022
    Publication date: October 17, 2024
    Inventors: Meijuan Zhang, Yuhua Zhu
  • Patent number: 12106465
    Abstract: An image marking method, apparatus and system, which relates to the technical field of image processing. The present disclosure includes, when the working mode of the first client is a first mode, receiving a first marking task assigned by a second client, on the condition that the image marking approach is the first marking approach, according to a neural network model, determining a first marking result corresponding to the first original image; on the condition that the image marking approach is the second marking approach, according to an unsupervised algorithm model, determining a second marking result corresponding to the first original image; on the condition that the image marking approach is the third marking approach, receiving a third marking result inputted by a user into the first original image; and sending a target marking result to the second client.
    Type: Grant
    Filed: March 26, 2021
    Date of Patent: October 1, 2024
    Assignee: BOE Technology Group Co., Ltd.
    Inventors: Yaoping Wang, Meijuan Zhang, Yongzhang Liu, Zhaoyue Li, Dong Chai, Hong Wang
  • Publication number: 20240304034
    Abstract: A method and a device for processing product manufacturing messages, and an electronic device are disclosed. The method for processing product manufacturing messages includes: monitoring a plurality of product manufacturing messages; establishing a product defect analysis task queue based on the plurality of product manufacturing messages; distributing product defect analysis tasks to product manufacturing assisting devices based on the product defect analysis task queue, wherein the product defect analysis tasks include a task of identifying product defect content based on a defect identification model; wherein the product defect content includes any one or more of: product defect type, product defect location, and product defect size.
    Type: Application
    Filed: May 16, 2024
    Publication date: September 12, 2024
    Applicant: BOE TECHNOLOGY GROUP CO., LTD.
    Inventors: Meijuan ZHANG, Yaoping WANG, Zhaoyue LI, Yuanyuan LU, Dong CHAI, Hong WANG
  • Publication number: 20240244755
    Abstract: The disclosure discloses a metal foil, a metal foil with a carrier, a copper-clad laminate and a Printed Circuit Board. Herein, a plurality of protrusions are distributed on one face of the metal foil, and the protrusions have the follow microscopic morphology: the lower half part of the protrusion connected with the one face of the metal foil is provided with a limiting part, and the diameter of a circumscribed circle of the cross section of the limiting part is smaller than the skin depth of the metal foil; and the surface area of the part of the protrusion above the limiting part is larger than the surface area of other parts of the protrusion.
    Type: Application
    Filed: May 30, 2022
    Publication date: July 18, 2024
    Inventors: Qiang GAO, Yuhua ZHU, Meijuan ZHANG, Ke ZHANG, Weiping JIANG, Kaihui ZHU, Zhi SU
  • Patent number: 12020516
    Abstract: A method and a device for processing product manufacturing messages, and an electronic device are disclosed. The method for processing product manufacturing messages includes: monitoring a plurality of product manufacturing messages; establishing a product defect analysis task queue based on the plurality of product manufacturing messages; distributing product defect analysis tasks to product manufacturing assisting devices based on the product defect analysis task queue, wherein the product defect analysis tasks include a task of identifying product defect content based on a defect identification model; wherein the product defect content includes any one or more of: product defect type, product defect location, and product defect size.
    Type: Grant
    Filed: December 20, 2019
    Date of Patent: June 25, 2024
    Assignee: BOE TECHNOLOGY GROUP CO., LTD.
    Inventors: Meijuan Zhang, Yaoping Wang, Zhaoyue Li, Yuanyuan Lu, Dong Chai, Hong Wang
  • Publication number: 20240202893
    Abstract: Provided is a method and device for detecting defect, a computer readable storage medium and an electronic device, the method including: acquiring (S310) a detection task, and acquiring various types of images corresponding to the detection task; acquiring (S320) defect detection models trained by a same initial model corresponding to the types of the images respectively; and obtaining (S330) defect detection results by performing defect detection on respective type of images using the defect detection model corresponding to the type of the images.
    Type: Application
    Filed: May 21, 2021
    Publication date: June 20, 2024
    Applicants: Beijing Zhongxiangying Technology Co., Ltd., BOE Technology Group Co., Ltd.
    Inventors: Yaoping WANG, Meijuan ZHANG, Wangqiang HE, Dong CHAI, Hong WANG
  • Patent number: 11982999
    Abstract: The present disclosure relates to a task processing method and device based on defect detection, a computer readable storage medium, and a task processing apparatus. The method includes receiving a detection task; determining a task type of the detection task; storing the detection task in a task queue if the task type is a target task type; and executing the detection task in a preset order and generating a feedback signal when a processor is idle. The detection task of the target task type includes an inference task and a training task. Executing the training task includes modifying configuration information according to a preset rule based on product information in the detection task; acquiring training data and an initial model according to the product information; and using the training data to train the initial model according to the configuration information to obtain a target model and store it in memory.
    Type: Grant
    Filed: October 30, 2020
    Date of Patent: May 14, 2024
    Assignees: Beijing Zhongxiangying Technology Co., Ltd., BOE TECHNOLOGY GROUP CO., LTD.
    Inventors: Meijuan Zhang, Yaoping Wang, Zhaoyue Li, Yuanyuan Lu, Wangqiang He, Dong Chai, Hong Wang
  • Patent number: 11880968
    Abstract: A distributed computing system for product defect analysis is disclosed. The distributed computing system for product defect analysis includes a computing cluster for processing product manufacturing messages, a computing cluster for identifying product defect, a product image database, and a client device.
    Type: Grant
    Filed: December 20, 2019
    Date of Patent: January 23, 2024
    Assignee: BOE TECHNOLOGY GROUP CO., LTD.
    Inventors: Zhaoyue Li, Dong Chai, Yaoping Wang, Meijuan Zhang, Hong Wang
  • Publication number: 20230206420
    Abstract: A method and device for detecting a defect and method for training a model are provided. The method for detecting the defect includes: acquiring a sample data set and identifying feature information of the sample data set; acquiring an initial model; configuring a training parameter based on the feature information; obtaining a target model by training, according to the training parameter, the initial model with the sample data set; and obtaining defect information of a product by inputting real data of the product into the target model. The training parameter includes at least one of a learning rate descent strategy, a total number of training rounds and a test strategy, the learning rate descent strategy includes a number of learning rate descents and a round number when a learning rate descends, and the test strategy includes a number of tests and a round number when testing.
    Type: Application
    Filed: January 28, 2021
    Publication date: June 29, 2023
    Inventors: Yaoping WANG, Sr., Zhaoyue LI, Haodong YANG, Meijuan ZHANG, Dong CHAI, Hong WANG
  • Publication number: 20230153974
    Abstract: A distributed computing system for product defect analysis is disclosed. The distributed computing system for product defect analysis includes a computing cluster for processing product manufacturing messages, a computing cluster for identifying product defect, a product image database, and a client device.
    Type: Application
    Filed: December 20, 2019
    Publication date: May 18, 2023
    Inventors: Zhaoyue LI, Dong CHAI, Yaoping WANG, Meijuan ZHANG, Hong WANG
  • Publication number: 20230142383
    Abstract: A method and a device for processing product manufacturing messages, and an electronic device are disclosed. The method for processing product manufacturing messages includes: monitoring a plurality of product manufacturing messages; establishing a product defect analysis task queue based on the plurality of product manufacturing messages; distributing product defect analysis tasks to product manufacturing assisting devices based on the product defect analysis task queue, wherein the product defect analysis tasks include a task of identifying product defect content based on a defect identification model; wherein the product defect content includes any one or more of: product defect type, product defect location, and product defect size.
    Type: Application
    Filed: December 20, 2019
    Publication date: May 11, 2023
    Inventors: Meijuan ZHANG, Yaoping WANG, Zhaoyue LI, Yuanyuan LU, Dong CHAI, Hong WANG
  • Publication number: 20230048386
    Abstract: The present disclosure provides a method and device for detecting an image category. The method includes: acquiring a sample data set including a plurality of sample images labeled with a category, the sample data set including a training data set and a verification data set; training a deep learning model using the training data set to obtain, according to different numbers of training rounds, at least two trained models; testing the at least two trained models using the verification data set to generate a verification test result; generating, based on the verification test result, a verification test index; determining, according to the verification test index, a target model from the at least two trained models; and predict a to-be-tested image of the target object using the target model to obtain the category of the to-be-tested image.
    Type: Application
    Filed: November 1, 2022
    Publication date: February 16, 2023
    Inventors: Yaoping WANG, Zhaoyue LI, Haodong YANG, Meijuan ZHANG, Dong CHAI, Hong WANG
  • Publication number: 20230030296
    Abstract: The present disclosure relates to a task processing method and device based on defect detection, a computer readable storage medium, and a task processing apparatus . The method includes receiving a detection task; determining a task type of the detection task; storing the detection task in a task queue if the task type is a target task type; and executing the detection task in a preset order and generating a feedback signal when a processor is idle. The detection task of the target task type includes an inference task and a training task. Executing the training task includes modifying configuration information according to a preset rule based on product information in the detection task; acquiring training data and an initial model according to the product information; and using the training data to train the initial model according to the configuration information to obtain a target model and store it in memory.
    Type: Application
    Filed: October 30, 2020
    Publication date: February 2, 2023
    Inventors: Meijuan ZHANG, Yaoping WANG, Zhaoyue LI, Yuanyuan LU, Wangqiang HE, Dong CHAI, Hong WANG
  • Publication number: 20220411492
    Abstract: Provided are an anti-CLDN18.2 antibody or an antigen-binding fragment thereof, a derivative comprising said antibody or antigen-binding fragment thereof, a pharmaceutical composition, and related use of said antibody or antigen-binding fragment thereof for treating, diagnosing and detecting cancers.
    Type: Application
    Filed: May 15, 2020
    Publication date: December 29, 2022
    Applicant: QILU PHARMACEUTICAL CO., LTD.
    Inventors: Yingying YANG, Gao LI, Yaning WANG, Zhenming AN, Shuyong ZHAO, Yuxue LIU, Shicong LIU, Meijuan ZHANG, Jinjin JIANG
  • Publication number: 20220414859
    Abstract: An image marking method, apparatus and system, which relates to the technical field of image processing. The present disclosure includes, when the working mode of the first client is a first mode, receiving a first marking task assigned by a second client, on the condition that the image marking approach is the first marking approach, according to a neural network model, determining a first marking result corresponding to the first original image; on the condition that the image marking approach is the second marking approach, according to an unsupervised algorithm model, determining a second marking result corresponding to the first original image; on the condition that the image marking approach is the third marking approach, receiving a third marking result inputted by a user into the first original image; and sending a target marking result to the second client.
    Type: Application
    Filed: March 26, 2021
    Publication date: December 29, 2022
    Applicant: BOE TECHNOLOGY GROUP CO., LTD.
    Inventors: Yaoping Wang, Meijuan Zhang, Yongzhang Liu, Zhaoyue Li, Dong Chai, Hong Wang