Abstract: A method for controlling a production process for components, wherein the components or a production device used for producing the components have or has features which are metrologically detectable. The method comprising specifying a test plan for detecting primary feature(s) and secondary feature(s) by tests, wherein the primary feature(s) is/are measured at a first test frequency and the secondary feature(s) is/are measured at a second test frequency, wherein at least one stability criterion is defined for the primary feature(s); producing the components and carrying out the test plan for producing test results in parallel, wherein solely the primary feature(s) is/are tested at the first test frequency; evaluating the determined test results; and, if at least one test result for the primary feature(s) violates the stability criterion, continuing the carrying out of the test plan, wherein at least a secondary feature is tested.