Patents by Inventor Meir Ben-Levi

Meir Ben-Levi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for height triangulation measurement
    Patent number: 8363229
    Abstract: A method for height triangulation measurement particularly for measuring the height of an object on a surface, the method includes: a) illuminating said object from a known angle with a narrow strip of light, having a large numerical aperture along said light strip and a small numerical aperture perpendicular to said light strip; b) imaging said object from a known angle having a large numerical aperture along said light strip and a small numerical aperture perpendicular to said light strip, having an image of said object illuminated by said light strip; and c) calculating the height of said object from the location of said light strip on said image.
    Type: Grant
    Filed: May 1, 2005
    Date of Patent: January 29, 2013
    Assignee: Camtek Ltd.
    Inventor: Meir Ben-Levi
  • System and method for probe mark analysis
    Patent number: 8319978
    Abstract: A method for analyzing probe mark, the method includes: scanning the probe mark by multiple spots; evaluating a probe mark characteristic in response to detection signals generated by multiple sensors of the chromatic confocal system that is characterized by a sub-micron axial resolution.
    Type: Grant
    Filed: July 10, 2007
    Date of Patent: November 27, 2012
    Assignee: Camtek Ltd.
    Inventors: Meir Ben-Levi, Ilana Grimberg
  • System and Method for Height Triangulation Measurement
    Publication number: 20100220340
    Abstract: A method for height triangulation measurement particularly for measuring the height of an object on a surface, the method includes: a) illuminating said object from a known angle with a narrow strip of light, having a large numerical aperture along said light strip and a small numerical aperture perpendicular to said light strip; b) imaging said object from a known angle having a large numerical aperture along said light strip and a small numerical aperture perpendicular to said light strip, having an image of said object illuminated by said light strip; and c) calculating the height of said object from the location of said light strip on said image.
    Type: Application
    Filed: May 1, 2005
    Publication date: September 2, 2010
    Inventor: Meir Ben-Levi
  • System and Method for Probe Mark Analysis
    Publication number: 20100171962
    Abstract: A method for analyzing probe mark, the method includes: scanning the probe mark by multiple spots; evaluating a probe mark characteristic in response to detection signals generated by multiple sensors of the chromatic confocal system that is characterized by a sub-micron axial resolution.
    Type: Application
    Filed: July 10, 2007
    Publication date: July 8, 2010
    Inventors: Meir Ben-Levi, Ilana Grimberg